Tuesday 27.1.2026
CEITEC Nano Research Infrastructure http://nano.ceitec.cz/
0:00 1:00 2:00 3:00 4:00 5:00 6:00 7:00 8:00 9:00 10:00 11:00 12:00 13:00 14:00 15:00 16:00 17:00 18:00 19:00 20:00 21:00 22:00 23:00
MIRA-STAN
VERIOS
KRATOS-XPS
ICON-SPM
TITAN
RIGAKU3
WITEC-RAMAN
LYRA
RIE-FLUORINE
UHV-PREPARATION
CRYOGENIC
SUSS-RCD8
EVAPORATOR
UHV-DEPOSITION
UHV-LEEM
HELIOS
SAW-ACCUTOM
LASER-DICER
WOOLLAM-VIS
AMBER
DWL
UHV-SPM
MAGNETRON
NANOSAM
WIRE-BONDER
RIGAKU9
TORNADO-M4
ML3-BABY
TUBE-FURNACE
ZETASIZER
ALD-BENEQ
LaserMIRA
SEE-SYSTEM
SUMMIT
RSA
ZEISS-NANO
SIMS
SHAKER…
PARYLENE-SCS
SNOM-NANONICS
NANOCALC
MIRA-EBL
ULTRACENTRIFUGE
MINIFLEX
nano-CT
STEMI
SPINCOATER…
Q-LAB
PECVD
RTP
TEM-SW
ACCURION_RSE
PARYLENE-DIENER
nanoCT
DIENER
3D-PRUSA-ORANGE
RIE-CHLORINE
3D-PRUSA-BLACK
3D-PRUSA-BLUE
MIRKA
MPS150
Test Ondra 3
BET-ANAMET
FTIR-CHEMLAB
UHV…
UHV…
ULTRAFAST-LASER
US-CUTTER
JASCO
JAZ3-CHANNEL
VACUUM_OVEN-C1…
FTIR
UHV-PLD
CITOVAC
VACUUM_OVEN-B1…
VUVAS
VISCOMETER
L450
XEF2
microCT
ZWICK
UHV-CLUSTER
UHV-XPS
SW-BEAMER
Test školení
SW-LAB
SW-TRACER
LEICA-TXP
TENUPOL
FISCHIONE-160
Test O2
TEST2
TEST-RFID2
UHV-MBE
TGA96
THEORY-SUPPORT
Heliscan
TGA-DISCOVERY
UHV-MBE2
UHV-MBE1
UHV-FTIR
UHV-LEIS
NMR
DSC-DISCOVERY
NIRQUEST512
FLOWBOX
DHR
DIMPLING…
DRYING_OVEN-B1…
RAITH
SPONGEBOB
LECTROPOL
ELECTROWORKSHOP
R4…
4-POINT
SW-CT
FTIRMAG
FUMEHOOD…
FUMEHOOD-HF
FUMEHOOD…
FUMEHOOD…
FUME_HOOD-B1.14
FUME_HOOD-B1.18
CLARUS-680
DRIE
CRYOMILL
micro-CT-L240
VACUUM_OVEN…
APCVD-Diffusion
ARES
APCVD
NANOWIZARD
ALD-FIJI
DISCO-DICING…
BAMBULAB
BET-DEGASSER
BRILLOUIN
VERSALAB
MECHANICAL…
CEITEC-NANO
CLR-ISO8-Lab…
LEICACOAT-STAN
SW-COMSOL
LEXT
MINIEVAP
CPD
TIC3X
Micromex
micro-CT-m300
NIKON-NANO
KERR-MICROSCOPE
LITESCOPE-LYRA
LITESCOPE-MIRA…
SUSS-WETBENCH
LPCVD-polySi
LPCVD-SiN
LAKESHORE
PROTOMAT
LVEM
HENRY-MAGNET
LIBS-Discovery
WOOLLAM-RC2
SUSS-MA8
DEKTAK
LABOTOM5
WOOLLAM-MIR
GLOVEBOX…
MONOWAVE
CITOPRESS
NANOSCAN
LIBS-LabSys1
LIBS-FireFly
DAWN-HELEOS
CHEMLAB-B1.16
GLOVEBOX…
TEGRAMIN
VNA-MPI
PECVD-NANOFAB
LEICACOAT-NANO
FRASCAN
NANOINDENTER
CHEMLAB-B1.14
CHEMLAB-B1.18
LAURELL-NANO
IS_NOVOCONTROL
ZEISS-STAN
SCIA
FISCHIONE-TEM…
KAUFMAN
IR-RAMAN
K70
KEITHLEY-4200
R2-PECVD
UV-LASER
Šárfy, Pavlína
Říhová, Martina
Říhová, Martina
T Man, Ondřej
Pathak, Saurabh
Kostka, Marek
Bednaříková, Vendula
Daradkeh, Samer
Souawda, Nada
B Kalousková, Petra
Bakhshikhah, Mahan
Bakhshikhah, Mahan
T Michalička, Jan
B Michalička, Jan
Pišťák, Jan
Tkachenko, Serhii
paiva de araujo, Estacio
Bakhshikhah, Mahan
Eliáš, Marek
Bajo, Viktor
Kunc, Jan
Soldán, Marek
Neradilek, David
Koller, Philipp
S Prášek, Jan
Soldán, Marek
Soldán, Marek
Očkovič, Adam
T Holas, Jiří
Koller, Philipp
Dubroka, Adam
T Iakoubovskii, Konstantin
B Fecko, Peter
Soldán, Marek
S Prášek, Jan
Danchuk, Viktor
Kunc, Jan
Caha, Ondřej
T Spotz, Zdeněk
Koller, Philipp
Havelka, Tomáš
T Lepcio, Petr
T Eliáš, Marek

Upcoming trainings

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Term Name Description Max. attendees
26.1. 09:00 - 13:00 KRATOS-XPS Basic training (session 1/2) - max 2 attendees. In case of interest for the training (when it is full) write to josef.polcak@ceitec.vutbr.cz. Attendees: Lucie Žaloudková, Areej Fatima 2
26.1. 09:00 - 13:00 RAITH training basic 1/3 RAITH basic training. Introduction to the RAITH150 Two system and the Electron Optics software. Operation of ZEISS SEM and basic functions. Attendees: Kryštof Jasenský, Elisa Cuccu 2
27.1. 09:30 - 12:00 ALD-Beneq-training Attendees: Sayed Hossein Mirdamadi Khouzani, Thanh Lam BUI, Eduard Jelínek, Kryštof Matějka, Jan Kunc 3
27.1. 09:30 - 11:30 DLS-ZetaSizer Part 1 This training will provide hands-on practice with basic methods for measuring particle size using the DLS technique. The session will cover: -An overview of DLS principles, including light scattering and Brownian motion. -Step-by-step guidance on preparing samples for size and zeta potential measurements. -The use of different measurement cells (e.g., disposable and reusable cuvettes) and their applications for specific types of samples. Practical demonstration of data acquisition, optimization of measurement parameters, and analysis using the Malvern software interface. By the end of the training, participants will gain both theoretical insights and practical expertise in using the Malvern device for comprehensive particle characterization. Attendees: Ammar AL Soud, Zuzana Košelová 2
27.1. 10:00 - 13:00 Tornado-M4 A 1.16 3
27.1. 10:00 - 11:15 Saw Accutom Meeting point: in front of the lab A1.04 Attendees: Tereza Havlíková 4
29.1. 10:00 - 11:30 Zeiss StAn microscope Meeting point: in front of the room A1.04 Attendees: Lenka Novotná 1
4.2. 13:00 - 15:00 Laser Dicer training 2
5.2. 09:30 - 13:30 MIRA-STAN 2/2 Meeting point at the microscope. This is a two-step training, register for part 1 in our booking system. More information about the training is available on our <a href=”https://cfmoodle.ceitec.vutbr.cz/course/view.php?id=76”>Moodle</a>. Attendees: Grigory Mathew, Karan Singh Surana, Nicolò Rossetti 3
19.2. 09:30 - 12:00 ICON-SPM basic training 3