Monday 26.1.2026
CEITEC Nano Research Infrastructure http://nano.ceitec.cz/
0:00 1:00 2:00 3:00 4:00 5:00 6:00 7:00 8:00 9:00 10:00 11:00 12:00 13:00 14:00 15:00 16:00 17:00 18:00 19:00 20:00 21:00 22:00 23:00
UHV-SPM
VERIOS
KRATOS-XPS
WITEC-RAMAN
SUSS-WETBENCH
LYRA
MIRA-EBL
ICON-SPM
TUBE-FURNACE
UHV-PREPARATION
UHV-LEEM
NANOSAM
ALD-FIJI
UHV-DEPOSITION
HELIOS
UHV-FTIR
LVEM
UHV-MBE
RIE-FLUORINE
EVAPORATOR
UHV-XPS
MIRA-STAN
RAITH
CRYOGENIC
LITESCOPE-LYRA
UHV…
UHV-PLD
UHV…
ML3-BABY
WOOLLAM-VIS
RIGAKU9
NANOSCAN
TITAN
SNOM-NANONICS
VERSALAB
LASER-DICER
TEGRAMIN
RIGAKU3
DWL
MAGNETRON
LITESCOPE-MIRA…
PARYLENE-SCS
SEE-SYSTEM
LaserMIRA
RSA
nano-CT
SUMMIT
SIMS
MPS150
nanoCT
MINIFLEX
RIE-CHLORINE
DIENER
SUSS-RCD8
ACCURION_RSE
RTP
Q-LAB
SPINCOATER…
SAW-ACCUTOM
MIRKA
PECVD
TEM-SW
PARYLENE-DIENER
3D-PRUSA-ORANGE
SHAKER…
AMBER
NANOCALC
CITOVAC
ULTRAFAST-LASER
US-CUTTER
JASCO
JAZ3-CHANNEL
VACUUM_OVEN-C1…
FTIR-CHEMLAB
FTIR
VACUUM_OVEN-B1…
UHV-LEIS
VUVAS
VISCOMETER
L450
WIRE-BONDER
XEF2
microCT
ZWICK
ZETASIZER
UHV-CLUSTER
UHV-MBE1
STEMI
3D-PRUSA-BLUE
BET-ANAMET
SW-BEAMER
SW-LAB
SW-TRACER
LEICA-TXP
TENUPOL
FISCHIONE-160
Test Ondra 3
UHV-MBE2
Test O2
TEST2
Test školení
TEST-RFID2
TGA96
THEORY-SUPPORT
Heliscan
TGA-DISCOVERY
3D-PRUSA-BLACK
DSC-DISCOVERY
ULTRACENTRIFUGE
R4…
DRIE
DHR
DIMPLING…
DRYING_OVEN-B1…
SPONGEBOB
LECTROPOL
ELECTROWORKSHOP
FLOWBOX
CRYOMILL
4-POINT
FTIRMAG
FUMEHOOD…
FUMEHOOD-HF
FUMEHOOD…
FUMEHOOD…
FUME_HOOD-B1.14
FUME_HOOD-B1.18
SW-CT
TIC3X
Micromex
VACUUM_OVEN…
ALD-BENEQ
APCVD-Diffusion
ARES
APCVD
NANOWIZARD
DISCO-DICING…
BAMBULAB
BET-DEGASSER
BRILLOUIN
CPD
TORNADO-M4
MECHANICAL…
CEITEC-NANO
CLR-ISO8-Lab…
LEICACOAT-STAN
SW-COMSOL
LEXT
MINIEVAP
CLARUS-680
micro-CT-L240
ZEISS-NANO
SUSS-MA8
LIBS-LabSys1
LPCVD-polySi
LPCVD-SiN
LAKESHORE
PROTOMAT
KERR-MICROSCOPE
HENRY-MAGNET
WOOLLAM-RC2
DEKTAK
LIBS-FireFly
LABOTOM5
WOOLLAM-MIR
GLOVEBOX…
MONOWAVE
CITOPRESS
NIKON-NANO
NIRQUEST512
NMR
LIBS-Discovery
LAURELL-NANO
micro-CT-m300
CHEMLAB-B1.16
DAWN-HELEOS
GLOVEBOX…
VNA-MPI
PECVD-NANOFAB
LEICACOAT-NANO
FRASCAN
NANOINDENTER
CHEMLAB-B1.14
CHEMLAB-B1.18
R2-PECVD
IS_NOVOCONTROL
ZEISS-STAN
SCIA
FISCHIONE-TEM…
KAUFMAN
IR-RAMAN
K70
KEITHLEY-4200
UV-LASER
Soldán, Marek
Soldán, Marek
U Danchuk, Viktor
U Kicmerova, Dina
Prajzler, Vladimír
Jadhao, Pranjali
T Polčák, Josef
Shaikh, Dr. Navaj
Daradkeh, Samer
paiva de araujo, Estacio
Supalová, Linda
Weisz, Hugo
Kunc, Jan
Rovenská, Katarína
Šamořil, Tomáš
Očkovič, Adam
Kunc, Jan
Štálnik, Jozef
Novotný, Filip
Fallahpour, Mojdeh
Havelka, Tomáš
Mirdamadi Khouzani, Sayed Hossein
Soldán, Marek
U Danchuk, Viktor
Soldán, Marek
U Danchuk, Viktor
U Danchuk, Viktor
Danchuk, Viktor
Juríček, Andrej
Otýpka, Martin
Soldán, Marek
U Danchuk, Viktor
Tran, Quynh Nhu Thi
U Danchuk, Viktor
U Kolíbalová, Eva
U Danchuk, Viktor
Citterberg, Daniel
S Prášek, Jan
U Danchuk, Viktor
Ulč, Filip
T Lišková, Zuzana
Daradkeh, Samer
Klok, Pavel
U Danchuk, Viktor
U Danchuk, Viktor
U Danchuk, Viktor
Koller, Philipp
Dubroka, Adam
Caha, Ondřej
B Staňo, Michal
B Michalička, Jan
Klok, Pavel
Daradkeh, Samer
Rovenská, Katarína
Paredes Sánchez, Claudia
Shaikh, Dr. Navaj
B Fecko, Peter
S Prášek, Jan
Ulč, Filip

Upcoming trainings

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Term Name Description Max. attendees
26.1. 09:00 - 13:00 KRATOS-XPS Basic training (session 1/2) - max 2 attendees. In case of interest for the training (when it is full) write to josef.polcak@ceitec.vutbr.cz. Attendees: Lucie Žaloudková, Areej Fatima 2
26.1. 09:00 - 13:00 RAITH training basic 1/3 RAITH basic training. Introduction to the RAITH150 Two system and the Electron Optics software. Operation of ZEISS SEM and basic functions. Attendees: Kryštof Jasenský, Elisa Cuccu 2
27.1. 09:30 - 12:00 ALD-Beneq-training Attendees: Sayed Hossein Mirdamadi Khouzani, Thanh Lam BUI, Eduard Jelínek, Kryštof Matějka, Jan Kunc 3
27.1. 09:30 - 11:30 DLS-ZetaSizer Part 1 This training will provide hands-on practice with basic methods for measuring particle size using the DLS technique. The session will cover: -An overview of DLS principles, including light scattering and Brownian motion. -Step-by-step guidance on preparing samples for size and zeta potential measurements. -The use of different measurement cells (e.g., disposable and reusable cuvettes) and their applications for specific types of samples. Practical demonstration of data acquisition, optimization of measurement parameters, and analysis using the Malvern software interface. By the end of the training, participants will gain both theoretical insights and practical expertise in using the Malvern device for comprehensive particle characterization. Attendees: Ammar AL Soud, Zuzana Košelová 2
27.1. 10:00 - 13:00 Tornado-M4 A 1.16 3
27.1. 10:00 - 11:15 Saw Accutom Meeting point: in front of the lab A1.04 Attendees: Tereza Havlíková 4
29.1. 10:00 - 11:30 Zeiss StAn microscope Meeting point: in front of the room A1.04 Attendees: Lenka Novotná 1
4.2. 13:00 - 15:00 Laser Dicer training 2
5.2. 09:30 - 13:30 MIRA-STAN 2/2 Meeting point at the microscope. This is a two-step training, register for part 1 in our booking system. More information about the training is available on our <a href=”https://cfmoodle.ceitec.vutbr.cz/course/view.php?id=76”>Moodle</a>. Attendees: Grigory Mathew, Karan Singh Surana, Nicolò Rossetti 3
19.2. 09:30 - 12:00 ICON-SPM basic training 3