Wednesday 28.1.2026
CEITEC Nano Research Infrastructure http://nano.ceitec.cz/
0:00 1:00 2:00 3:00 4:00 5:00 6:00 7:00 8:00 9:00 10:00 11:00 12:00 13:00 14:00 15:00 16:00 17:00 18:00 19:00 20:00 21:00 22:00 23:00
LYRA
KRATOS-XPS
CRYOGENIC
WITEC-RAMAN
MIRA-STAN
UHV-LEEM
ICON-SPM
LEICACOAT-STAN
EVAPORATOR
RIGAKU3
MAGNETRON
HELIOS
VERIOS
UHV-PREPARATION
TITAN
RIGAKU9
UHV-DEPOSITION
LASER-DICER
WOOLLAM-VIS
DWL
nano-CT
RSA
MPS150
MIRA-EBL
SNOM-NANONICS
SIMS
SEE-SYSTEM
LaserMIRA
SUMMIT
SHAKER…
NANOCALC
STEMI
BET-ANAMET
PARYLENE-SCS
DIENER
nanoCT
PECVD
NMR
ZEISS-NANO
ULTRACENTRIFUGE
3D-PRUSA-BLUE
3D-PRUSA-BLACK
3D-PRUSA-ORANGE
PARYLENE-DIENER
TEM-SW
MIRKA
MINIFLEX
SAW-ACCUTOM
SPINCOATER…
Q-LAB
RTP
ACCURION_RSE
SUSS-RCD8
RIE-FLUORINE
RIE-CHLORINE
SW-BEAMER
AMBER
SW-LAB
CITOVAC
UHV…
ULTRAFAST-LASER
US-CUTTER
JASCO
JAZ3-CHANNEL
VACUUM_OVEN-C1…
FTIR-CHEMLAB
FTIR
VACUUM_OVEN-B1…
UHV-CLUSTER
VUVAS
VISCOMETER
L450
WIRE-BONDER
XEF2
microCT
ZWICK
ZETASIZER
UHV…
UHV-SPM
SW-TRACER
TEST-RFID2
LEICA-TXP
TENUPOL
FISCHIONE-160
NIKON-NANO
Test Ondra 3
Test O2
TEST2
Test školení
TGA96
UHV-PLD
THEORY-SUPPORT
Heliscan
TGA-DISCOVERY
UHV-MBE2
UHV-MBE1
UHV-FTIR
UHV-LEIS
UHV-MBE
UHV-XPS
NIRQUEST512
DSC-DISCOVERY
NANOSAM
ELECTROWORKSHOP
SW-CT
DRIE
DHR
DIMPLING…
DRYING_OVEN-B1…
RAITH
SPONGEBOB
LECTROPOL
R4…
VERSALAB
FLOWBOX
4-POINT
FTIRMAG
FUMEHOOD…
FUMEHOOD-HF
FUMEHOOD…
FUMEHOOD…
FUME_HOOD-B1.14
FUME_HOOD-B1.18
CRYOMILL
TIC3X
Micromex
BET-DEGASSER
ALD-BENEQ
APCVD-Diffusion
ARES
APCVD
NANOWIZARD
ALD-FIJI
DISCO-DICING…
BAMBULAB
VACUUM_OVEN…
CPD
BRILLOUIN
TORNADO-M4
MECHANICAL…
CEITEC-NANO
TUBE-FURNACE
CLR-ISO8-Lab…
SW-COMSOL
LEXT
MINIEVAP
CLARUS-680
micro-CT-L240
NANOSCAN
KERR-MICROSCOPE
LITESCOPE-LYRA
LITESCOPE-MIRA…
SUSS-WETBENCH
LPCVD-polySi
LPCVD-SiN
LAKESHORE
PROTOMAT
LVEM
HENRY-MAGNET
LIBS-Discovery
WOOLLAM-RC2
SUSS-MA8
DEKTAK
LABOTOM5
WOOLLAM-MIR
ML3-BABY
GLOVEBOX…
MONOWAVE
CITOPRESS
LIBS-LabSys1
LIBS-FireFly
micro-CT-m300
CHEMLAB-B1.16
DAWN-HELEOS
GLOVEBOX…
TEGRAMIN
VNA-MPI
PECVD-NANOFAB
LEICACOAT-NANO
FRASCAN
NANOINDENTER
CHEMLAB-B1.14
CHEMLAB-B1.18
LAURELL-NANO
IS_NOVOCONTROL
ZEISS-STAN
SCIA
FISCHIONE-TEM…
KAUFMAN
IR-RAMAN
K70
KEITHLEY-4200
R2-PECVD
UV-LASER
Paredes Sánchez, Claudia
Matějka, Kryštof
Weisz, Hugo
Polčák, Josef
David, Jiří
Souawda, Nada
Neradilek, David
U Danchuk, Viktor
paiva de araujo, Estacio
Raad, Ryan
Ščasnovič, Erik
Rotter, Marek
Endstrasser, Zdeněk
Mirdamadi Khouzani, Sayed Hossein
Paredes Sánchez, Claudia
S Prášek, Jan
Spotz, Zdeněk
S Prášek, Jan
Tran, Quynh Nhu Thi
Pathak, Saurabh
Endstrasser, Zdeněk
T Michalička, Jan
Caha, Ondřej
Endstrasser, Zdeněk
T Potoček, Michal
Dubroka, Adam
B Fecko, Peter

Upcoming trainings

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Term Name Description Max. attendees
26.1. 09:00 - 13:00 KRATOS-XPS Basic training (session 1/2) - max 2 attendees. In case of interest for the training (when it is full) write to josef.polcak@ceitec.vutbr.cz. Attendees: Lucie Žaloudková, Areej Fatima 2
26.1. 09:00 - 13:00 RAITH training basic 1/3 RAITH basic training. Introduction to the RAITH150 Two system and the Electron Optics software. Operation of ZEISS SEM and basic functions. Attendees: Kryštof Jasenský, Elisa Cuccu 2
27.1. 09:30 - 12:00 ALD-Beneq-training Attendees: Sayed Hossein Mirdamadi Khouzani, Thanh Lam BUI, Eduard Jelínek, Kryštof Matějka, Jan Kunc 3
27.1. 09:30 - 11:30 DLS-ZetaSizer Part 1 This training will provide hands-on practice with basic methods for measuring particle size using the DLS technique. The session will cover: -An overview of DLS principles, including light scattering and Brownian motion. -Step-by-step guidance on preparing samples for size and zeta potential measurements. -The use of different measurement cells (e.g., disposable and reusable cuvettes) and their applications for specific types of samples. Practical demonstration of data acquisition, optimization of measurement parameters, and analysis using the Malvern software interface. By the end of the training, participants will gain both theoretical insights and practical expertise in using the Malvern device for comprehensive particle characterization. Attendees: Ammar AL Soud, Zuzana Košelová 2
27.1. 10:00 - 13:00 Tornado-M4 A 1.16 3
27.1. 10:00 - 11:15 Saw Accutom Meeting point: in front of the lab A1.04 Attendees: Tereza Havlíková 4
29.1. 10:00 - 11:30 Zeiss StAn microscope Meeting point: in front of the room A1.04 Attendees: Lenka Novotná 1
4.2. 13:00 - 15:00 Laser Dicer training 2
5.2. 09:30 - 13:30 MIRA-STAN 2/2 Meeting point at the microscope. This is a two-step training, register for part 1 in our booking system. More information about the training is available on our <a href=”https://cfmoodle.ceitec.vutbr.cz/course/view.php?id=76”>Moodle</a>. Attendees: Grigory Mathew, Karan Singh Surana, Nicolò Rossetti 3
19.2. 09:30 - 12:00 ICON-SPM basic training 3