Wednesday 21.1.2026
CEITEC Nano Research Infrastructure http://nano.ceitec.cz/
0:00 1:00 2:00 3:00 4:00 5:00 6:00 7:00 8:00 9:00 10:00 11:00 12:00 13:00 14:00 15:00 16:00 17:00 18:00 19:00 20:00 21:00 22:00 23:00
SUSS-WETBENCH
RIE-FLUORINE
HELIOS
MIRA-STAN
RAITH
LEICACOAT-STAN
EVAPORATOR
LYRA
ML3-BABY
DSC-DISCOVERY
GLOVEBOX…
SEE-SYSTEM
UHV-PREPARATION
VERIOS
DEKTAK
VERSALAB
UHV-LEEM
SUSS-MA8
FUMEHOOD…
ZEISS-STAN
KEITHLEY-4200
CRYOGENIC
KRATOS-XPS
BET-ANAMET
WITEC-RAMAN
LASER-DICER
LVEM
RIGAKU3
LIBS-FireFly
LITESCOPE-LYRA
UHV-DEPOSITION
MAGNETRON
KERR-MICROSCOPE
NANOINDENTER
micro-CT-L240
micro-CT-m300
AMBER
LAURELL-NANO
DAWN-HELEOS
CHEMLAB-B1.18
TEGRAMIN
R2-PECVD
TITAN
CHEMLAB-B1.14
SUSS-RCD8
UHV-LEIS
3D-PRUSA-BLUE
ZETASIZER
RIGAKU9
BET-DEGASSER
BRILLOUIN
L450
MECHANICAL…
TUBE-FURNACE
TEM-SW
VACUUM_OVEN-B1…
MIRA-EBL
FTIR-CHEMLAB
UHV-SPM
SNOM-NANONICS
UHV-CLUSTER
DWL
PARYLENE-SCS
NANOSCAN
WOOLLAM-VIS
ICON-SPM
ELECTROWORKSHOP
NANOSAM
SW-BEAMER
LaserMIRA
DIENER
RIE-CHLORINE
MINIFLEX
nanoCT
SW-LAB
SIMS
STEMI
SHAKER-B1.18
NANOCALC
nano-CT
SUMMIT
RSA
3D-PRUSA-XL
SW-TRACER
CITOVAC
ULTRASONIC…
US-CUTTER
JASCO
JAZ3-CHANNEL
VACUUM_OVEN-C1…
FTIR
VACUUM_OVEN-B1…
UHV…
VUVAS
VISCOMETER
WIRE-BONDER
XEF2
microCT
ZWICK
ULTRAFAST-LASER
UHV…
LEICA-TXP
TEST-RFID2
TENUPOL
FISCHIONE-160
Test Ondra 3
Test O2
TEST2
Test školení
TGA96
UHV-PLD
Heliscan
TGA-DISCOVERY
UHV-MBE2
UHV-MBE1
UHV-FTIR
UHV-MBE
UHV-XPS
THEORY-SUPPORT
MONOWAVE
ACCURION_RSE
FLOWBOX
DHR
DIMPLING…
DRYING_OVEN-B1…
SPONGEBOB
LECTROPOL
R4…
4-POINT
SW-CT
FTIRMAG
FUMEHOOD…
FUMEHOOD-HF
FUMEHOOD…
FUMEHOOD…
FUMEHOOD…
FUMEHOOD…
DRIE
CRYOMILL
Micromex
DISCO-DICING…
ALD-BENEQ
APCVD-Diffusion
ARES
APCVD
NANOWIZARD
ALD-FIJI
BAMBULAB
TIC3X
TORNADO-M4
CEITEC-NANO
CLR-ISO8-Lab…
SW-COMSOL
LEXT
MINIEVAP
CPD
CLARUS-680
VNA-MPI
RTP
ULTRACENTRIFUGE
MPS150
CITOPRESS
NIKON-NANO
NIRQUEST512
NMR
ZEISS-NANO
3D-PRUSA-BLACK
LABOTOM5
3D-PRUSA-ORANGE
PARYLENE-DIENER
PECVD
MIRKA
SAW-ACCUTOM
SPINCOATER…
Q-LAB
WOOLLAM-MIR
WOOLLAM-RC2
PECVD-NANOFAB
IR-RAMAN
LEICACOAT-NANO
FRASCAN
CHEMLAB-B1.16
IS_NOVOCONTROL
SCIA
FISCHIONE-TEM…
KAUFMAN
K70
HENRY-MAGNET
LIBS-Discovery
LIBS-LabSys1
LITESCOPE-MIRA…
LPCVD-polySi
LPCVD-SiN
LAKESHORE
PROTOMAT
UV-LASER
Jakešová, Marie
Tvrdoňová, Anna
Krajíčková, Kateřina
Citterberg, Daniel
Citterberg, Daniel
Krčma, Jakub
Švarc, Vojtěch
Otýpka, Martin
Jasenský, Kryštof
Piastek, Jakub
Jasenský, Kryštof
Jakešová, Marie
Tvrdoňová, Anna
Krajíčková, Kateřina
Pistis, Martino
Švarc, Vojtěch
Huang, Yong
Vařeka, Karel
Staňo, Michal
Pavliňák, David
Havlíková, Tereza
Valášek, Daniel
Lišková, Zuzana
Červinka, Ondřej
Delforge, Cyril
T Holas, Jiří
Pavliňák, David
Sobola, Dinara
Bajo, Viktor
Citterberg, Daniel
Matějka, Kryštof
Očkovič, Adam
Paredes Sánchez, Claudia
Šamořil, Tomáš
Krajíčková, Kateřina
Citterberg, Daniel
Piastek, Jakub
Fu, Hongbo
Fu, Hongbo
Fu, Hongbo
U Tmejová, Kateřina
U Tmejová, Kateřina
Tmejová, Kateřina
Souawda, Nada
Sobola, Dinara
Soldán, Marek
Molnár, Tomáš
T Kicmerova, Dina
Nghiem, Xuan Duc
Citterberg, Daniel
Tvrdoňová, Anna
Daradkeh, Samer
Lukiienko, Iryna
Soldán, Marek
Molnár, Tomáš
Jakešová, Marie
Tvrdoňová, Anna
Jewula, Pawel
Jewula, Pawel
Skálová, Zdenka
Skálová, Zdenka
Patil, Virendra
Patil, Virendra
Neradilek, David
Lukiienko, Iryna
Polčák, Josef
Daradkeh, Samer
Pavliňák, David
Lee, Hyesung
B Spotz, Zdeněk
Vymazal, Jan
Danchuk, Viktor
T Potoček, Michal
Gaizura, Filip
Cao, Hoang-Anh
Šťastný, Přemysl
Drobil, Tomáš
Klok, Pavel
Soldán, Marek
Arregi Uribeetxebarria, Jon Ander
Otýpka, Martin
B Gablech, Evelína
Holeňa, Vít
Petřík, Michal
Iakoubovskii, Konstantin
Jakešová, Marie
Kotouček, Jan
U Tmejová, Kateřina
Paredes Sánchez, Claudia
Janů, Lucie
T Michalička, Jan
U Tmejová, Kateřina
T Hrdý, Radim
Vaníčková, Elena
Kolář, Richard
Poláková, Veronika
Caha, Ondřej
Lee, Hyesung
Delforge, Cyril
Slovák, Vojtěch
Varga, Dominik
Havelka, Tomáš
Kolíbalová, Eva
U Tmejová, Kateřina
Weisz, Hugo
Mathew, Grigory
Soldán, Marek
Klok, Pavel
S Danchuk, Viktor
B Fecko, Peter
Fecko, Peter
B Staňo, Michal
Dubroka, Adam
B Gablech, Evelína
Kumar, Sanjay
Danchuk, Viktor

Upcoming trainings

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Term Name Description Max. attendees
27.3. 09:30 - 16:30 MIRA-STAN 1/2 Meeting point at the microscope. This is a two-step training, register for part 2 in our booking system. Obligatory prerequisites must be completed 2 days before the training. More information about the training is available on our <a href=”https://cfmoodle.ceitec.vutbr.cz/course/view.php?id=76”>Moodle</a>. Attendees: Carolina Oliver Urrutia, Ondrej Kubinec 4
27.3. 10:00 - 12:00 Witec-Raman in front of user office Attendees: Helena Šimůnková 4
31.3. 09:00 - 13:00 KRATOS-XPS Basic training (session 1/2) - max 2 attendees. In case of interest for the training (when it is full) write to josef.polcak@ceitec.vutbr.cz. Attendees: Sujan Maity 2
1.4. 09:00 - 11:00 SEE SYSTEM training WCA + SFE measurement training Attendees: Rasul Valiyev 1
1.4. 09:30 - 12:00 Tornado-M4 in front of entrance to STAN Attendees: Radek Slavíček 4
1.4. 10:00 - 11:30 JASCO training Description of holders and software, basic measurement Attendees: Areej Fatima 3
9.4. 09:00 - 12:00 Verios/Helios_EDS Practical demonstration of EDS analytical system at Verios and Helios. Attendees: Tomáš Janoušek 3
16.4. 09:30 - 11:30 MIRA-STAN - EDS detector Only for users with an active MIRA-STAN certificate. Meeting point at the microscope. Attendees: Aida Fazlič 4