Thursday 22.1.2026
CEITEC Nano Research Infrastructure http://nano.ceitec.cz/
0:00 1:00 2:00 3:00 4:00 5:00 6:00 7:00 8:00 9:00 10:00 11:00 12:00 13:00 14:00 15:00 16:00 17:00 18:00 19:00 20:00 21:00 22:00 23:00
DEKTAK
VERIOS
RIE-FLUORINE
EVAPORATOR
FUMEHOOD…
VERSALAB
KRATOS-XPS
WOOLLAM-RC2
RAITH
3D-PRUSA-BLUE
RIGAKU3
ML3-BABY
TITAN
UHV-PREPARATION
HELIOS
LYRA
UHV-LEEM
micro-CT-L240
MIRA-EBL
WITEC-RAMAN
TUBE-FURNACE
BET-ANAMET
LVEM
KEITHLEY-4200
SUSS-MA8
LITESCOPE-MIRA…
MPS150
LITESCOPE-LYRA
LIBS-Discovery
LIBS-FireFly
CRYOGENIC
LASER-DICER
micro-CT-m300
AMBER
DAWN-HELEOS
TEGRAMIN
ZEISS-STAN
DSC-DISCOVERY
UHV-DEPOSITION
MIRA-STAN
NANOCALC
FUMEHOOD…
CHEMLAB-B1.14
NANOSCAN
SUSS-WETBENCH
UHV-PLD
SNOM-NANONICS
DIENER
ALD-BENEQ
RIE-CHLORINE
RIGAKU9
ALD-FIJI
BET-DEGASSER
BRILLOUIN
L450
PECVD
TEM-SW
LEICACOAT-STAN
UHV-SPM
LEXT
SW-CT
UHV-CLUSTER
VACUUM_OVEN-C1…
ICON-SPM
DWL
SPONGEBOB
ULTRAFAST-LASER
WOOLLAM-VIS
MINIFLEX
SUMMIT
SW-LAB
SW-TRACER
SEE-SYSTEM
SW-BEAMER
SIMS
SHAKER-B1.18
nanoCT
STEMI
PARYLENE-SCS
nano-CT
RSA
LaserMIRA
3D-PRUSA-XL
LEICA-TXP
VACUUM_OVEN-B1…
US-CUTTER
JASCO
JAZ3-CHANNEL
FTIR-CHEMLAB
FTIR
CITOVAC
VACUUM_OVEN-B1…
UHV…
VUVAS
VISCOMETER
WIRE-BONDER
XEF2
microCT
ZWICK
ZETASIZER
ULTRASONIC…
UHV…
TENUPOL
TGA96
FISCHIONE-160
Test Ondra 3
Test O2
TEST2
Test školení
TEST-RFID2
THEORY-SUPPORT
UHV-XPS
Heliscan
TGA-DISCOVERY
UHV-MBE2
UHV-MBE1
UHV-FTIR
UHV-LEIS
UHV-MBE
SUSS-RCD8
MONOWAVE
ACCURION_RSE
FTIRMAG
DRYING_OVEN-B1…
LECTROPOL
ELECTROWORKSHOP
R4…
FLOWBOX
4-POINT
FUMEHOOD…
DHR
FUMEHOOD-HF
FUMEHOOD…
FUMEHOOD…
FUMEHOOD…
CLARUS-680
Micromex
VNA-MPI
DIMPLING…
DRIE
LEICACOAT-NANO
BAMBULAB
GLOVEBOX…
APCVD-Diffusion
ARES
APCVD
NANOWIZARD
DISCO-DICING…
TORNADO-M4
CRYOMILL
MECHANICAL…
CEITEC-NANO
CLR-ISO8-Lab…
SW-COMSOL
MINIEVAP
CPD
TIC3X
PECVD-NANOFAB
FRASCAN
RTP
ZEISS-NANO
WOOLLAM-MIR
CITOPRESS
NANOSAM
NIKON-NANO
NIRQUEST512
NMR
ULTRACENTRIFUGE
MAGNETRON
3D-PRUSA-BLACK
3D-PRUSA-ORANGE
PARYLENE-DIENER
MIRKA
SAW-ACCUTOM
SPINCOATER…
Q-LAB
LABOTOM5
HENRY-MAGNET
NANOINDENTER
IR-RAMAN
CHEMLAB-B1.16
CHEMLAB-B1.18
IS_NOVOCONTROL
SCIA
FISCHIONE-TEM…
KAUFMAN
K70
KERR-MICROSCOPE
R2-PECVD
LAURELL-NANO
LIBS-LabSys1
LPCVD-polySi
LPCVD-SiN
LAKESHORE
PROTOMAT
UV-LASER
Citterberg, Daniel
Pistis, Martino
Citterberg, Daniel
Švarc, Vojtěch
Idesová, Beáta
T Kicmerova, Dina
Surana, Karan Singh
Saldan, Ivan
Koňařík, Lukáš
Citterberg, Daniel
Švarc, Vojtěch
Kratochvílová, Ivana
Lukiienko, Iryna
Piastek, Jakub
Bokaei Khelejan, Hatef
Otýpka, Martin
Jewula, Pawel
U Jewula, Pawel
Jewula, Pawel
Jyoti, Jyoti
Lukiienko, Iryna
S Holobrádek, Jakub
Daradkeh, Samer
Polášková, Kateřina
Souawda, Nada
Juríček, Andrej
Slovák, Radim
T Franta, Daniel
Krčma, Jakub
Červinka, Ondřej
Delforge, Cyril
Kolář, Richard
Kolář, Richard
Arenas Buelvas, Daina Dayana
Roupcová, Pavla
Koller, Philipp
Otýpka, Martin
Michalička, Jan
T Michalička, Jan
Soldán, Marek
Molnár, Tomáš
Očkovič, Adam
Bahadur, Fateh
Šamořil, Tomáš
Šamořil, Tomáš
Soldán, Marek
Molnár, Tomáš
Petřík, Michal
Holeňa, Vít
Bajo, Viktor
Jasenský, Kryštof
Havelka, Tomáš
Havelka, Tomáš
Havelka, Tomáš
Mirdamadi Khouzani, Sayed Hossein
Lee, Hyesung
Lee, Hyesung
U Kolíbalová, Eva
B Kolíbalová, Eva
Hrdý, Radim
Patil, Virendra
Švarc, Vojtěch
Dao, Radek
Hrdý, Radim
Klok, Pavel
S Buday, Jakub
Vozár, Tomáš
Lukiienko, Iryna
Polčák, Josef
Slovák, Vojtěch
U Iakoubovskii, Konstantin
Kotouček, Jan
Paredes Sánchez, Claudia
Mařáková, Lucie
Fu, Hongbo
Soldán, Marek
Dao, Radek
Švarc, Vojtěch
Tvrdoňová, Anna
U Jewula, Pawel
B Staňo, Michal
Švarc, Vojtěch
U Danchuk, Viktor
Klok, Pavel
Bokaei Khelejan, Hatef
Červinka, Ondřej
Delforge, Cyril
Caha, Ondřej
Juríček, Andrej
Lee, Hyesung
Delforge, Cyril
Slovák, Vojtěch
Šik, Ondřej
Horák, Michal
U Holas, Jiří
Soldán, Marek
Mukherjee, Aniket
Kareš, Martin
S Danchuk, Viktor
Lukiienko, Iryna
U Gablech, Evelína
B Fecko, Peter
Tvrdoňová, Anna
Jasenský, Kryštof
Dubroka, Adam

Upcoming trainings

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Term Name Description Max. attendees
27.3. 09:30 - 16:30 MIRA-STAN 1/2 Meeting point at the microscope. This is a two-step training, register for part 2 in our booking system. Obligatory prerequisites must be completed 2 days before the training. More information about the training is available on our <a href=”https://cfmoodle.ceitec.vutbr.cz/course/view.php?id=76”>Moodle</a>. Attendees: Carolina Oliver Urrutia, Ondrej Kubinec 4
27.3. 10:00 - 12:00 Witec-Raman in front of user office Attendees: Helena Šimůnková 4
31.3. 09:00 - 13:00 KRATOS-XPS Basic training (session 1/2) - max 2 attendees. In case of interest for the training (when it is full) write to josef.polcak@ceitec.vutbr.cz. Attendees: Sujan Maity 2
1.4. 09:00 - 11:00 SEE SYSTEM training WCA + SFE measurement training Attendees: Rasul Valiyev 1
1.4. 09:30 - 12:00 Tornado-M4 in front of entrance to STAN Attendees: Radek Slavíček 4
1.4. 10:00 - 11:30 JASCO training Description of holders and software, basic measurement Attendees: Areej Fatima 3
9.4. 09:00 - 12:00 Verios/Helios_EDS Practical demonstration of EDS analytical system at Verios and Helios. Attendees: Tomáš Janoušek 3
16.4. 09:30 - 11:30 MIRA-STAN - EDS detector Only for users with an active MIRA-STAN certificate. Meeting point at the microscope. Attendees: Aida Fazlič 4