Tuesday 20.1.2026
CEITEC Nano Research Infrastructure http://nano.ceitec.cz/
0:00 1:00 2:00 3:00 4:00 5:00 6:00 7:00 8:00 9:00 10:00 11:00 12:00 13:00 14:00 15:00 16:00 17:00 18:00 19:00 20:00 21:00 22:00 23:00
RIE-FLUORINE
SUSS-WETBENCH
FUMEHOOD…
RAITH
WITEC-RAMAN
LEICACOAT-STAN
MECHANICAL…
NMR
RIGAKU3
VERIOS
ICON-SPM
UHV-LEEM
DRYING_OVEN-B1…
HELIOS
LYRA
MIRA-STAN
ML3-BABY
CRYOGENIC
L450
EVAPORATOR
SEE-SYSTEM
MIRA-EBL
DIENER
KRATOS-XPS
BAMBULAB
CHEMLAB-B1.14
KEITHLEY-4200
TITAN
LIBS-FireFly
AMBER
LITESCOPE-LYRA
UHV-DEPOSITION
LITESCOPE-MIRA…
R2-PECVD
DEKTAK
BET-ANAMET
WOOLLAM-VIS
SAW-ACCUTOM
PECVD
SNOM-NANONICS
PARYLENE-SCS
SIMS
ULTRACENTRIFUGE
NANOSAM
STEMI
NANOSCAN
CITOPRESS
DSC-DISCOVERY
TEGRAMIN
SUSS-MA8
WOOLLAM-RC2
MAGNETRON
VNA-MPI
NANOINDENTER
DAWN-HELEOS
UHV-PREPARATION
GLOVEBOX…
ALD-BENEQ
RIGAKU9
BET-DEGASSER
BRILLOUIN
LEXT
VERSALAB
FTIR
FTIR-CHEMLAB
DRIE
VACUUM_OVEN-C1…
micro-CT-m300
ELECTROWORKSHOP
DWL
UHV-SPM
micro-CT-L240
UHV-MBE
VACUUM_OVEN-B1…
VACUUM_OVEN-B1…
UHV-PLD
SUMMIT
LaserMIRA
VUVAS
VISCOMETER
WIRE-BONDER
UHV-XPS
UHV-FTIR
XEF2
CITOVAC
microCT
ZWICK
ZETASIZER
RSA
UHV-LEIS
nano-CT
nanoCT
MINIFLEX
RIE-CHLORINE
SHAKER-B1.18
Test školení
TEST2
TENUPOL
UHV-CLUSTER
UHV…
Test O2
Test Ondra 3
UHV…
TEST-RFID2
FISCHIONE-160
ULTRAFAST-LASER
ULTRASONIC…
US-CUTTER
LEICA-TXP
UHV-MBE1
SW-TRACER
TGA96
SW-LAB
SW-BEAMER
THEORY-SUPPORT
JASCO
JAZ3-CHANNEL
Heliscan
TGA-DISCOVERY
UHV-MBE2
NANOCALC
3D-PRUSA-XL
MONOWAVE
SUSS-RCD8
FUMEHOOD-HF
LECTROPOL
R4…
FLOWBOX
4-POINT
FTIRMAG
FUMEHOOD…
FUMEHOOD…
DIMPLING…
FUMEHOOD…
FUMEHOOD…
FUMEHOOD…
CLARUS-680
Micromex
PECVD-NANOFAB
SPONGEBOB
DHR
FRASCAN
TORNADO-M4
APCVD-Diffusion
ARES
APCVD
NANOWIZARD
ALD-FIJI
DISCO-DICING…
CEITEC-NANO
SW-CT
TUBE-FURNACE
CLR-ISO8-Lab…
SW-COMSOL
MINIEVAP
CPD
TIC3X
CRYOMILL
LEICACOAT-NANO
CHEMLAB-B1.16
ACCURION_RSE
3D-PRUSA-BLACK
WOOLLAM-MIR
MPS150
NIKON-NANO
NIRQUEST512
ZEISS-NANO
3D-PRUSA-BLUE
3D-PRUSA-ORANGE
HENRY-MAGNET
PARYLENE-DIENER
TEM-SW
MIRKA
SPINCOATER…
Q-LAB
RTP
LABOTOM5
KERR-MICROSCOPE
CHEMLAB-B1.18
K70
IS_NOVOCONTROL
ZEISS-STAN
SCIA
FISCHIONE-TEM…
KAUFMAN
IR-RAMAN
LASER-DICER
LVEM
LAURELL-NANO
LIBS-Discovery
LIBS-LabSys1
LPCVD-polySi
LPCVD-SiN
LAKESHORE
PROTOMAT
UV-LASER
Jakešová, Marie
Koňařík, Lukáš
Štálnik, Jozef
Pistis, Martino
Pistis, Martino
Bajo, Viktor
Jakešová, Marie
Povey, Rhys Geoffrey
Martyniuk, Oleh
Krčma, Jakub
Foltýn, Michael
U Jewula, Pawel
Jewula, Pawel
Jewula, Pawel
B Lišková, Zuzana
Delforge, Cyril
Delforge, Cyril
S Lišková, Zuzana
Toman, Gabriel
B Spotz, Zdeněk
B Spotz, Zdeněk
Lesovský, Tadeáš
Havlíková, Tereza
T Holas, Jiří
Surana, Karan Singh
Varga, Dominik
Varga, Dominik
Varga, Dominik
U Jewula, Pawel
Jewula, Pawel
U Jewula, Pawel
Rotter, Marek
Bednaříková, Vendula
Tkachenko, Serhii
T Kicmerova, Dina
Burda, Daniel
Jadhao, Pranjali
Kovařík, Martin
Klíma, Jan
Soldán, Marek
Molnár, Tomáš
Foltýn, Michael
Jewula, Pawel
Bahadur, Fateh
Huang, Yong
Šamořil, Tomáš
Bensalem, Mohamed
Ulč, Filip
Rotter, Marek
Povey, Rhys Geoffrey
Martyniuk, Oleh
Neradilek, David
Lukiienko, Iryna
Slovák, Vojtěch
Petřík, Michal
Jasenský, Kryštof
Bokaei Khelejan, Hatef
Souawda, Nada
Bolouki, Nima
T Švarc, Vojtěch
Bajo, Viktor
Bokaei Khelejan, Hatef
Povey, Rhys Geoffrey
T Polčák, Josef
Kelarová, Štěpánka
Kolář, Richard
Kolář, Richard
Foltýn, Michael
Patil, Virendra
Michalička, Jan
Kratochvilová, Lucie
Iakoubovskii, Konstantin
Klok, Pavel
Soldán, Marek
Ulč, Filip
Janů, Lucie
Jakešová, Marie
Pavliňák, David
Dubroka, Adam
Valášek, Daniel
Pistis, Martino
Klok, Pavel
Jakešová, Marie
Vařeka, Karel
Foltýn, Michael
Danchuk, Viktor
Šárfy, Pavlína
B Staňo, Michal
Valášek, Daniel
Fu, Hongbo
Valášek, Daniel
Jakešová, Marie
Franta, Daniel
Povey, Rhys Geoffrey
Pribytova, Ekaterina
Buršíková, Vilma
Kotouček, Jan
Soldán, Marek
U Tmejová, Kateřina
Eliáš, Marek
Caha, Ondřej
Pavliňák, David
Delforge, Cyril
Iakoubovskii, Konstantin
Daradkeh, Samer
Bolouki, Nima
Procházková, Anna
Pistis, Martino
Neradilek, David
Jelínek, Adam
Kumar, Sanjay
B Fecko, Peter
Soldán, Marek
Petřík, Michal

Upcoming trainings

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Term Name Description Max. attendees
27.3. 09:30 - 16:30 MIRA-STAN 1/2 Meeting point at the microscope. This is a two-step training, register for part 2 in our booking system. Obligatory prerequisites must be completed 2 days before the training. More information about the training is available on our <a href=”https://cfmoodle.ceitec.vutbr.cz/course/view.php?id=76”>Moodle</a>. Attendees: Carolina Oliver Urrutia, Ondrej Kubinec 4
27.3. 10:00 - 12:00 Witec-Raman in front of user office Attendees: Helena Šimůnková 4
31.3. 09:00 - 13:00 KRATOS-XPS Basic training (session 1/2) - max 2 attendees. In case of interest for the training (when it is full) write to josef.polcak@ceitec.vutbr.cz. Attendees: Sujan Maity 2
1.4. 09:00 - 11:00 SEE SYSTEM training WCA + SFE measurement training Attendees: Rasul Valiyev 1
1.4. 09:30 - 12:00 Tornado-M4 in front of entrance to STAN Attendees: Radek Slavíček 4
9.4. 09:00 - 12:00 Verios/Helios_EDS Practical demonstration of EDS analytical system at Verios and Helios. Attendees: Tomáš Janoušek 3
16.4. 09:30 - 11:30 MIRA-STAN - EDS detector Only for users with an active MIRA-STAN certificate. Meeting point at the microscope. Attendees: Aida Fazlič 4