Tuesday 27.1.2026
CEITEC Nano Research Infrastructure http://nano.ceitec.cz/
0:00 1:00 2:00 3:00 4:00 5:00 6:00 7:00 8:00 9:00 10:00 11:00 12:00 13:00 14:00 15:00 16:00 17:00 18:00 19:00 20:00 21:00 22:00 23:00
Soldán, Marek
Koller, Philipp
Bakhshikhah, Mahan
Prášek, Jan
Michalička, Jan
Eliáš, Marek
Říhová, Martina
Kunc, Jan
Spotz, Zdeněk
Caha, Ondřej
Danchuk, Viktor
Fecko, Peter
Iakoubovskii,…
Dubroka, Adam
Havelka, Tomáš
Holas, Jiří
Očkovič, Adam
Šárfy, Pavlína
Bajo, Viktor
Neradilek, David
paiva de araujo,…
Tkachenko, Serhii
Pišťák, Jan
Kalousková, Petra
Souawda, Nada
Daradkeh, Samer
Bednaříková, Vendula
Kostka, Marek
Pathak, Saurabh
Man, Ondřej
Lepcio, Petr
UHV-PREPARATION
UHV-DEPOSITION
UHV-LEEM
UHV-SPM
SUSS-RCD8
LASER-DICER
ML3-BABY
ICON-SPM
ICON-SPM
WITEC-RAMAN
S EVAPORATOR
S MAGNETRON
T TITAN
B TITAN
LYRA
T ALD-BENEQ
MIRA-STAN
MIRA-STAN
RIE-FLUORINE
WIRE-BONDER
T TORNADO-M4
RIGAKU9
NANOSAM
B DWL
T AMBER
WOOLLAM-VIS
TUBE-FURNACE
T SAW-ACCUTOM
HELIOS
MIRA-STAN
LYRA
CRYOGENIC
WITEC-RAMAN
RIGAKU3
RIGAKU3
B ICON-SPM
KRATOS-XPS
KRATOS-XPS
KRATOS-XPS
VERIOS
VERIOS
T VERIOS
T ZETASIZER

Upcoming trainings

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Term Name Description Max. attendees
26.1. 09:00 - 13:00 KRATOS-XPS Basic training (session 1/2) - max 2 attendees. In case of interest for the training (when it is full) write to josef.polcak@ceitec.vutbr.cz. Attendees: Lucie Žaloudková, Areej Fatima 2
26.1. 09:00 - 13:00 RAITH training basic 1/3 RAITH basic training. Introduction to the RAITH150 Two system and the Electron Optics software. Operation of ZEISS SEM and basic functions. Attendees: Kryštof Jasenský, Elisa Cuccu 2
27.1. 09:30 - 12:00 ALD-Beneq-training Attendees: Sayed Hossein Mirdamadi Khouzani, Thanh Lam BUI, Eduard Jelínek, Kryštof Matějka, Jan Kunc 3
27.1. 09:30 - 11:30 DLS-ZetaSizer Part 1 This training will provide hands-on practice with basic methods for measuring particle size using the DLS technique. The session will cover: -An overview of DLS principles, including light scattering and Brownian motion. -Step-by-step guidance on preparing samples for size and zeta potential measurements. -The use of different measurement cells (e.g., disposable and reusable cuvettes) and their applications for specific types of samples. Practical demonstration of data acquisition, optimization of measurement parameters, and analysis using the Malvern software interface. By the end of the training, participants will gain both theoretical insights and practical expertise in using the Malvern device for comprehensive particle characterization. Attendees: Ammar AL Soud, Zuzana Košelová 2
27.1. 10:00 - 13:00 Tornado-M4 A 1.16 3
27.1. 10:00 - 11:15 Saw Accutom Meeting point: in front of the lab A1.04 Attendees: Tereza Havlíková 4
29.1. 10:00 - 11:30 Zeiss StAn microscope Meeting point: in front of the room A1.04 Attendees: Lenka Novotná 1
4.2. 13:00 - 15:00 Laser Dicer training 2
5.2. 09:30 - 13:30 MIRA-STAN 2/2 Meeting point at the microscope. This is a two-step training, register for part 1 in our booking system. More information about the training is available on our <a href=”https://cfmoodle.ceitec.vutbr.cz/course/view.php?id=76”>Moodle</a>. Attendees: Grigory Mathew, Karan Singh Surana, Nicolò Rossetti 3
19.2. 09:30 - 12:00 ICON-SPM basic training 3