Monday 20.7.2026
CEITEC Nano Research Infrastructure http://nano.ceitec.cz/
0:00 1:00 2:00 3:00 4:00 5:00 6:00 7:00 8:00 9:00 10:00 11:00 12:00 13:00 14:00 15:00 16:00 17:00 18:00 19:00 20:00 21:00 22:00 23:00
LEICACOAT-STAN
KRATOS-XPS
WITEC-RAMAN
NANOSAM
MIRA-STAN
DRIE
KEITHLEY-4200
R2-PECVD
VNA-MPI
UHV-LEEM
UHV-XPS
UHV-PREPARATION
RIE-FLUORINE
RIE-CHLORINE
BRILLOUIN
CRYOGENIC
HELIOS
LYRA
UHV-MBE
BET-DEGASSER
UHV-FTIR
UHV-DEPOSITION
TGA-DISCOVERY
CLARUS-680
micro-CT-L240
UHV-SPM
LAKESHORE
ZETASIZER
VERIOS
LITESCOPE-MIRA…
PARYLENE-SCS
TITAN
AMBER
MPS150
BET-ANAMET
UHV-PLD
MAGNETRON
WOOLLAM-VIS
WIRE-BONDER
VACUUM-OVEN-B1…
FTIR-CHEMLAB
VACUUM_OVEN-C1…
EVAPORATOR
VERSALAB
RIGAKU3
JASCO
DIENER
ALD-FIJI
UHV…
RAITH
UHV…
nano-CT
MIRKA
SAW-ACCUTOM
MINIFLEX
SHAKER-B1.18
SUMMIT
LaserMIRA
SEE-SYSTEM
SIMS
SPINCOATER…
Q-LAB
RTP
RSA
ICON-SPM
PARYLENE-DIENER
nanoCT
SNOM-NANONICS
MIRA-EBL
ACCURION_RSE
TEM-SW
PECVD
SUSS-RCD8
NANO-ONE-2PP
TEST-RFID4
NANOCALC
CITOVAC
ULTRAFAST-LASER
ULTRASONIC…
US-CUTTER
DWL
JAZ3-CHANNEL
FTIR
VACUUM-OVEN-B1…
UHV-LEIS
VUVAS
VISCOMETER
L450
XEF2
RIGAKU9
microCT
ZWICK
UHV-CLUSTER
UHV-MBE2
STEMI
Test Ondra 3
SW-BEAMER
SW-LAB
SW-TRACER
LEICA-TXP
TENUPOL
FISCHIONE-160
Test O2
UHV-MBE1
TEST2
Test školení
TEST-RFID2
3D-PRUSA-BLACK
TGA96
THEORY-SUPPORT
Heliscan
3D-PRUSA-ORANGE
ML3-BABY
3D-PRUSA-BLUE
FTIRMAG
DIMPLING…
DRYING-OVEN-B1…
SPONGEBOB
LECTROPOL
ELECTROWORKSHOP
R4…
FLOWBOX
4-POINT
FUMEHOOD…
SW-CT
FUMEHOOD-HF
FUMEHOOD…
FUMEHOOD…
FUMEHOOD…
FUMEHOOD…
FUMEHOOD…
FUMEHOOD…
FUMEHOOD…
DHR
CRYOMILL
micro-CT-m300
BAMBULAB
GLOVEBOX…
ALD-BENEQ
APCVD-Diffusion
ARES
MAGNETRON-AJA
APCVD
NANOWIZARD
DISCO-DICING…
TORNADO-M4
TIC3X
MECHANICAL…
CEITEC-NANO
TUBE-FURNACE
CLR-ISO8-Lab…
SW-COMSOL
LEXT
MINIEVAP
CPD
Micromex
DAWN-HELEOS
ULTRACENTRIFUGE
WOOLLAM-MIR
PROTOMAT
LVEM
KERR-MICROSCOPE
HENRY-MAGNET
WOOLLAM-RC2
SUSS-MA8
DEKTAK
LABOTOM5
3D-PRUSA-XL
LPCVD-polySi
DSC-DISCOVERY
MONOWAVE
CITOPRESS
NANOSCAN
NIKON-NANO
NIRQUEST512
NMR
ZEISS-NANO
LPCVD-SiN
SUSS-WETBENCH
TEGRAMIN
ZEISS-STAN
PECVD-NANOFAB
LEICACOAT-NANO
FRASCAN
NANOINDENTER
CHEMLAB-B1.14
CHEMLAB-B1.16
CHEMLAB-B1.18
IS-NOVOCONTROL
SCIA
LITESCOPE-LYRA
FISCHIONE-TEM…
KAUFMAN
IR-RAMAN
K70
LASER-DICER
LAURELL-NANO
LIBS-FireFly
LIBS-Discovery
LIBS-LabSys1
UV-LASER
Havlíková, Tereza
Pišťák, Jan
Fu, Hongbo
Remešová, Michaela
Havlíková, Tereza
Polčák, Josef
Pavliňák, David
AL Soud, Ammar
Fatima, Areej
Kalleshappa, Bindu
U Spotz, Zdeněk
Havelka, Tomáš
Kepič, Peter
U Danchuk, Viktor
S Danchuk, Viktor
S Danchuk, Viktor
Jelínek, Eduard
Fu, Hongbo
Havlíková, Tereza
B Fecko, Peter
Fecko, Peter
Fecko, Peter
Citterberg, Daniel
Patil, Virendra
Bolouki, Nima
Bolouki, Nima
Klíma, Jan
Klíma, Jan
U Danchuk, Viktor
Molnár, Tomáš
U Danchuk, Viktor
Molnár, Tomáš
U Danchuk, Viktor
Molnár, Tomáš
Citterberg, Daniel
Supalová, Linda
Fecko, Peter
B Fecko, Peter
Krčma, Jakub
Klíma, Jan
Kolíbalová, Eva
S Šamořil, Tomáš
U Danchuk, Viktor
Valadi Palliyalil, Anjali
U Danchuk, Viktor
U Danchuk, Viktor
AL Soud, Ammar
U Sanna, Michela
Kolář, David
U Danchuk, Viktor
Holcman, Vladimír
Kotouček, Jan
Pišťák, Jan
Jelínek, Eduard
Krútek, Šimon
U Michalička, Jan
Kratochvílová, Ivana
Citterberg, Daniel
Fanisaberi, Amirmohsen
U Danchuk, Viktor
U Prášek, Jan
Franta, Daniel
Otýpka, Martin
Bednaříková, Vendula
Lee, Hyesung
Klimek, Jan
Pribytova, Ekaterina
Klimek, Jan
Gejdoš, Pavel
AL Soud, Ammar
Krútek, Šimon
Song, Yanzhen
U Danchuk, Viktor
T Lišková, Zuzana
U Danchuk, Viktor

Upcoming trainings

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Term Name Description Max. attendees
20.7. 09:00 - 13:00 RAITH training basic 1/3 RAITH basic training. Introduction to the RAITH150 Two system and the Electron Optics software. Operation of ZEISS SEM and basic functions. Attendees: DAVIDE MURTAS 1
20.7. 09:00 - 13:00 KRATOS-XPS Basic training (session 1/2) - max 2 attendees. In case of interest for the training (when it is full) write to josef.polcak@ceitec.vutbr.cz. Attendees: Debika Devi Thongam 2
20.7. 10:30 - 11:15 Nanofab interview - Meeting room C2.11 or C2.07 This interview is mandatory for enrollment to the Safety excursion - Nanofabrication lab. Join: [HERE](https://teams.microsoft.com/meet/35462004903561?p=GpHxeNZeulO7czefLV) Meeting ID: 354 620 049 035 61 Access code: 7AD77PX3 Attendees: Nikol Kaděrová, Redzic Milica, Cimolato Andrea, Le Thien 5
21.7. 09:30 - 12:30 FTIR-CHEMLAB Meeting point in Chemlab. Attendees: Petr Sysel, Debika Devi Thongam 3
21.7. 10:00 - 12:00 Tornado-M4 in front of entrance to STAN Attendees: Ammar AL Soud 3
21.7. 10:00 - 11:30 Leicacoat-Nano training Attendees: Hongbo Fu, Rosmi Vinson 4
21.7. 12:15 - 12:50 Safety excursion - Advanced Chemical lab Attendees: Laiba Asad Bajwa, Jana Burdíková 5
21.7. 13:00 - 13:50 Safety excursion - Nanofabrication lab Please enroll in this training only in parallel with the "Nanofab interview." Do not enroll in training ahead of time, but when you are sure you will be using nanofabrication techniques. It is possible to pass this training anytime during your access additionally (it takes place at least once a month). Attendees: Nikol Kaděrová, Redzic Milica, Cimolato Andrea, Le Thien, Karel Ĺ kubnĂ­k 5
21.7. 13:55 - 14:20 Safety excursion - Nanocharacterization lab Attendees: Vladislav Dvořák, Muhammad SAHIL, Redzic Milica, Cimolato Andrea, Le Thien, Jana Burdíková, Laura Búšová, Michal Slovák 10
21.7. 14:25 - 14:55 Safety excursion - Structural Analysis Attendees: Nima Bolouki, Muhammad SAHIL 10
22.7. 09:00 - 10:30 JASCO training- CZ Description of holders and software, basic measurement Attendees: Marie Jakešová, Anna Tvrdoňová, Šimon Krútek 3
22.7. 09:30 - 16:30 MIRA-STAN 1/2 Meeting point at the microscope. This is a two-step training, register for part 2 in our booking system. Obligatory prerequisites must be completed 2 days before the training. More information about the training is available on our <a href=”https://cfmoodle.ceitec.vutbr.cz/course/view.php?id=76”>Moodle</a>. Attendees: Iosif Tantis, Debika Devi Thongam 4
22.7. 10:30 - 12:00 JASCO training - EN Description of holders and software, basic measurement Attendees: Laiba Asad Bajwa, Rosmi Vinson 2
23.7. 09:00 - 13:00 Verios_basic (1/2) Verios_basic (1/2): training for new users, demonstration part. Meeting point: entrance to StAn CLR labs (bldg. A, 1st floor). Bring your cleanroom stationery set if you have one. Register one slot for the Verios_basic (2/2) hands-on session to complete the training curriculum. Attendees: Navajsharif Shamshuddin Shaikh, Ondrej Kubinec, Debika Devi Thongam 3
24.7. 09:00 - 10:30 Verios_basic (2/2) Verios_basic (2/2): hands-on session. Bring your real sample(s) with you. 1
24.7. 10:30 - 12:00 Verios_basic (2/2) Verios_basic (2/2): hands-on session. Bring your real sample(s) with you. Attendees: Debika Devi Thongam 1
24.7. 12:30 - 14:00 Verios_basic (2/2) Verios_basic (2/2): hands-on session. Bring your real sample(s) with you. Attendees: Ondrej Kubinec 1
27.7. 09:30 - 13:30 ZWICK Meeting point is in front of the Advanced Chemical laboratory. Obligatory prerequisites 1. Pass the Chemical laboratory safety excursion in Moodle (https://cfmoodle.ceitec.vutbr.cz/course/view.php?id=173): 2. Answer the ZWICK applicant questionnaire 3. Read the ZWICK rules (mark the activity as complete with ✔️) 4. Bring your own sample Recommended prerequisites 5. Get familiar with the Layout for ZWICK basic training (mark the activity as complete with ✔️) Attendees: Rasul Valiyev 2
29.7. 09:30 - 13:00 MIRA-STAN 2/2 Meeting point at the microscope. This is a two-step training, register for part 1 in our booking system. More information about the training is available on our <a href=”https://cfmoodle.ceitec.vutbr.cz/course/view.php?id=76”>Moodle</a>. Attendees: Iosif Tantis, Debika Devi Thongam 2
30.7. 09:00 - 13:00 Rigaku 3 - hands on Hands on - Hrdinová - dlouho neměřila Attendees: Sára Hrdinová, Debika Devi Thongam 1
3.8. 09:30 - 11:30 MIRA-STAN - EDS detector Only for users with an active MIRA-STAN certificate. Meeting point at the microscope. Attendees: Mohammad Allaham 4
4.8. 09:00 - 12:00 Verios/Helios_EDS Practical demonstration of EDS analytical system at Verios and Helios. Attendees: Sunny Nandi, Debika Devi Thongam, Kateřina Polášková 3
18.8. 09:00 - 13:00 Verios_basic (1/2) Verios_basic (1/2): training for new users, demonstration part. Meeting point: entrance to StAn CLR labs (bldg. A, 1st floor). Bring your cleanroom stationery set if you have one. Register one slot for the Verios_basic (2/2) hands-on session to complete the training curriculum. Attendees: Nima Bolouki, Šimon Formánek 3
19.8. 09:00 - 10:30 Verios_basic (2/2) Verios_basic (2/2): hands-on session. Bring your real sample(s) with you. Attendees: Šimon Formánek 1
19.8. 10:30 - 12:00 Verios_basic (2/2) Verios_basic (2/2): hands-on session. Bring your real sample(s) with you. Attendees: Nima Bolouki 1
19.8. 12:30 - 14:00 Verios_basic (2/2) Verios_basic (2/2): hands-on session. Bring your real sample(s) with you. 1