Friday 10.4.2026
CEITEC Nano Research Infrastructure http://nano.ceitec.cz/
0:00 1:00 2:00 3:00 4:00 5:00 6:00 7:00 8:00 9:00 10:00 11:00 12:00 13:00 14:00 15:00 16:00 17:00 18:00 19:00 20:00 21:00 22:00 23:00
SUSS-WETBENCH
WITEC-RAMAN
EVAPORATOR
KRATOS-XPS
MIRA-STAN
LEICACOAT-STAN
AMBER
MIRA-EBL
DIENER
FUMEHOOD…
FUMEHOOD…
LYRA
VERIOS
RIGAKU3
ML3-BABY
LEICACOAT-NANO
UHV-LEEM
FUMEHOOD…
FUMEHOOD-HF
LIBS-FireFly
CHEMLAB-B1.18
HELIOS
FUMEHOOD…
SUSS-MA8
LAKESHORE
WOOLLAM-RC2
MAGNETRON
TGA-DISCOVERY
CRYOGENIC
DAWN-HELEOS
TEGRAMIN
VNA-MPI
KERR-MICROSCOPE
LVEM
UHV-DEPOSITION
MPS150
UHV-XPS
TUBE-FURNACE
ALD-BENEQ
ZWICK
PARYLENE-DIENER
R2-PECVD
WIRE-BONDER
BRILLOUIN
RIE-FLUORINE
ULTRACENTRIFUGE
VACUUM-OVEN-B1…
KEITHLEY-4200
SHAKER-B1.18
FTIR
VACUUM_OVEN-C1…
ICON-SPM
ULTRAFAST-LASER
UHV-PREPARATION
CHEMLAB-B1.14
DSC-DISCOVERY
UHV-SPM
TITAN
STEMI
NANOCALC
BET-ANAMET
3D-PRUSA-XL
SUMMIT
LaserMIRA
SEE-SYSTEM
SIMS
PARYLENE-SCS
SNOM-NANONICS
RSA
nano-CT
nanoCT
MINIFLEX
RIE-CHLORINE
SUSS-RCD8
ACCURION_RSE
SW-BEAMER
THEORY-SUPPORT
SW-LAB
CITOVAC
ULTRASONIC…
US-CUTTER
DWL
JASCO
JAZ3-CHANNEL
FTIR-CHEMLAB
VACUUM-OVEN-B1…
UHV…
VUVAS
VISCOMETER
L450
XEF2
RIGAKU9
microCT
ZETASIZER
UHV…
UHV-CLUSTER
SW-TRACER
TEST-RFID2
LEICA-TXP
TENUPOL
FISCHIONE-160
Test Ondra 3
Test O2
TEST2
Test školení
TGA96
UHV-PLD
Q-LAB
Heliscan
UHV-MBE2
UHV-MBE1
UHV-FTIR
UHV-LEIS
UHV-MBE
RTP
MONOWAVE
SPINCOATER…
LECTROPOL
SW-CT
DRIE
DHR
DIMPLING…
DRYING-OVEN-B1…
RAITH
SPONGEBOB
ELECTROWORKSHOP
VERSALAB
R4…
FLOWBOX
4-POINT
FTIRMAG
FUMEHOOD…
FUMEHOOD…
CLARUS-680
CRYOMILL
TIC3X
micro-CT-L240
BAMBULAB
GLOVEBOX…
APCVD-Diffusion
ARES
APCVD
NANOWIZARD
ALD-FIJI
DISCO-DICING…
BET-DEGASSER
CPD
TORNADO-M4
MECHANICAL…
CEITEC-NANO
CLR-ISO8-Lab…
SW-COMSOL
LEXT
MINIEVAP
Micromex
micro-CT-m300
SAW-ACCUTOM
WOOLLAM-VIS
LABOTOM5
WOOLLAM-MIR
CITOPRESS
NANOSCAN
NANOSAM
NIKON-NANO
NIRQUEST512
NMR
HENRY-MAGNET
ZEISS-NANO
3D-PRUSA-BLUE
3D-PRUSA-BLACK
3D-PRUSA-ORANGE
TEM-SW
PECVD
MIRKA
DEKTAK
PROTOMAT
PECVD-NANOFAB
KAUFMAN
FRASCAN
NANOINDENTER
CHEMLAB-B1.16
IS_NOVOCONTROL
ZEISS-STAN
SCIA
FISCHIONE-TEM…
IR-RAMAN
LPCVD-SiN
K70
LASER-DICER
LAURELL-NANO
LIBS-Discovery
LIBS-LabSys1
LITESCOPE-LYRA
LITESCOPE-MIRA…
LPCVD-polySi
UV-LASER
Tvrdoňová, Anna
Slovák, Radim
Tvrdoňová, Anna
Bajwa, Laiba Asad
Štálnik, Jozef
Havelka, Tomáš
Supalová, Linda
paiva de araujo, Estacio
Janoušek, Tomáš
Tvrdoňová, Anna
Slovák, Radim
Bajwa, Laiba Asad
Polčák, Josef
Jadhao, Pranjali
Pham, Sy Nguyen
Sevriugina, Veronika
Ščasnovič, Erik
Fu, Hongbo
Bednaříková, Vendula
Ščasnovič, Erik
Kratochvílová, Ivana
Staňo, Michal
Slovák, Radim
Štálnik, Jozef
Tvrdoňová, Anna
Kovařík, Martin
Jewula, Pawel
U Jewula, Pawel
Tvrdoňová, Anna
B Zita, Jiří
Staňo, Michal
S Šamořil, Tomáš
Pathak, Saurabh
Jadhao, Pranjali
Pišťák, Jan
Lee, Hyesung
Tvrdoňová, Anna
Tvrdoňová, Anna
Pišťák, Jan
Yuan, Yunhuan
Šebestová, Zuzana
B Zita, Jiří
B Zita, Jiří
Vozár, Tomáš
Polášková, Kateřina
Řepa, Rostislav
B Zita, Jiří
Bajwa, Laiba Asad
Holcman, Vladimír
Eliáš, Marek
Papež, Nikola
Sevriugina, Veronika
Pribytova, Ekaterina
Kotouček, Jan
Skálová, Zdenka
Pribytova, Ekaterina
Arregi Uribeetxebarria, Jon Ander
Kolíbalová, Eva
Šebestová, Zuzana
Citterberg, Daniel
Šebestová, Zuzana
Kovařík, Martin
Štálnik, Jozef
Fanisaberi, Amirmohsen
U Fecko, Peter
Janů, Lucie
Otýpka, Martin
Krčma, Jakub
Štálnik, Jozef
E Tmejová, Kateřina
Fu, Hongbo
Citterberg, Daniel
Polášková, Kateřina
Bolouki, Nima
Zdeg, Ikram
Janoušek, Tomáš
Arregi Uribeetxebarria, Jon Ander
Šebestová, Zuzana
E Tmejová, Kateřina
Sevriugina, Veronika
Šebestová, Zuzana
Ali, Hasan

Upcoming trainings

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Term Name Description Max. attendees
14.4. 09:00 - 11:30 Verios/Helios_EDS Practical demonstration of EDS analytical system at Verios and Helios. Attendees: Tomáš Janoušek 3
14.4. 09:00 - 13:00 KRATOS-XPS Basic training (session 1/2) - max 2 attendees. In case of interest for the training (when it is full) write to josef.polcak@ceitec.vutbr.cz. Attendees: Grigory Mathew, Rasul Valiyev 2
14.4. 10:00 - 13:00 FTIR-CHEMLAB - transmission Transmission training Attendees: Sanjay Kumar, Virendra Patil, Saurabh Pathak 3
14.4. 10:00 - 10.4. 12:00 miniflex Attendees: Konstantin Iakoubovskii 3
16.4. 09:30 - 11:30 MIRA-STAN - EDS detector Only for users with an active MIRA-STAN certificate. Meeting point at the microscope. Attendees: Carolina Oliver Urrutia, Aida Fazlič, Ondrej Kubinec 4
17.4. 13:30 - 16:00 EBSD Verios/Helios (2/2) EBSD Verios/Helios (2/2): practical demonstration @ Helios Attendees: Karel Vařeka, Adam Očkovič, Mohamed Bensalem 5
20.4. 10:30 - 11:15 Nanofab interview - Meeting room C2.11 or C2.07 This interview is mandatory for enrollment to the Safety excursion - Nanofabrication lab. Join: [HERE](https://teams.microsoft.com/meet/31245607839153?p=QX552nhoP9PxXCL4FX) Meeting ID: 312 456 078 391 53 Access code: i5xd7zL3 5
21.4. 09:30 - 12:00 ICON-SPM basic training 3
21.4. 12:15 - 12:50 Safety excursion Chem lab The Moodle course, Advanced Chemical Laboratory is MANDATORY for the Safety Excursion. https://cfmoodle.ceitec.vutbr.cz/course/index.php?categoryid=48. It must be finished 2 work days before the excursion. Attendees: Petr Sysel, Thông Thái Trần, Rosmi Vinson 5
21.4. 13:00 - 13:50 Safety excursion - Nanofabrication lab Please enroll in this training only in parallel with the "Nanofab interview." Do not enroll in training ahead of time, but when you are sure you will be using nanofabrication techniques. It is possible to pass this training anytime during your access additionally (it takes place at least once a month). 5
21.4. 13:55 - 14:20 Safety excursion - Nanocharacterization lab Attendees: Thông Thái Trần, Rosmi Vinson 10
21.4. 14:25 - 14:55 Safety excursion - StAn lab Attendees: Thông Thái Trần, Rosmi Vinson 10
22.4. 09:00 - 13:00 Verios_basic (1/2) Verios_basic (1/2): training for new users, demonstration part. Meeting point: entrance to StAn CLR labs (bldg. A, 1st floor). Bring your cleanroom stationery set if you have one. Register one slot for the Verios_basic (2/2) hands-on session to complete the training curriculum. Attendees: Jozef Štálnik, Sujan Maity 3
23.4. 09:00 - 10:30 Verios_basic (2/2) Verios_basic (2/2): hands-on session. Bring your real sample(s) with you. Attendees: Jozef Štálnik 1
23.4. 10:30 - 12:00 Verios_basic (2/2) Verios_basic (2/2): hands-on session. Bring your real sample(s) with you. 1
23.4. 12:30 - 14:00 Verios_basic (2/2) Verios_basic (2/2): hands-on session. Bring your real sample(s) with you. 1
24.4. 09:00 - 13:00 LVEM_basic (1/2) Attendees: Karan Singh Surana 1
6.5. 09:30 - 16:30 MIRA-STAN 1/2 Meeting point at the microscope. This is a two-step training, register for part 2 in our booking system. Obligatory prerequisites must be completed 2 days before the training. More information about the training is available on our <a href=”https://cfmoodle.ceitec.vutbr.cz/course/view.php?id=76”>Moodle</a>. 4