Tuesday 6.10.2026
CEITEC Nano Research Infrastructure http://nano.ceitec.cz/
0:00 1:00 2:00 3:00 4:00 5:00 6:00 7:00 8:00 9:00 10:00 11:00 12:00 13:00 14:00 15:00 16:00 17:00 18:00 19:00 20:00 21:00 22:00 23:00
MIRA-STAN
KRATOS-XPS
WITEC-RAMAN
VERIOS
MPS150
FTIR
RAITH
CRYOGENIC
VERSALAB
SUSS-WETBENCH
ICON-SPM
NANO-ONE-2PP
MAGNETRON
CHEMLAB-B1.18
LASER-DICER
R2-PECVD
KEITHLEY-4200
WOOLLAM-VIS
TITAN
VNA-MPI
WOOLLAM-RC2
RIE-FLUORINE
SAW-ACCUTOM
SPINCOATER…
RIGAKU3
HELIOS
RIE-CHLORINE
SNOM-NANONICS
LEICA-TXP
AMBER
UHV-DEPOSITION
UHV-LEEM
UHV-SPM
UHV-PREPARATION
VACUUM_OVEN-C1…
ZWICK
FUMEHOOD…
ML3-BABY
DRYING-OVEN-B1…
BRILLOUIN
DHR
ALD-BENEQ
SPONGEBOB
BET-DEGASSER
NANOCALC
STEMI
BET-ANAMET
SW-BEAMER
SW-LAB
SW-TRACER
ELECTROWORKSHOP
TENUPOL
BAMBULAB
Test Ondra 3
Test O2
TEST2
Test školení
TEST-RFID2
TEST-RFID4
FISCHIONE-160
SHAKER-B1.18
THEORY-SUPPORT
nano-CT
CLR-ISO8-Lab…
SUSS-RCD8
DIENER
TUBE-FURNACE
CEITEC-NANO
MINIFLEX
nanoCT
RSA
SUMMIT
MIRA-EBL
MECHANICAL…
ICON-SPM
TORNADO-M4
PARYLENE-SCS
SIMS
SEE-SYSTEM
LaserMIRA
TGA96
UHV-MBE1
Heliscan
VISCOMETER
MAGNETRON-AJA
FTIR-CHEMLAB
ARES
CITOVAC
VACUUM-OVEN-B1…
VACUUM-OVEN-B1…
VUVAS
L450
JASCO
WIRE-BONDER
APCVD-Diffusion
XEF2
RIGAKU9
microCT
GLOVEBOX…
ZETASIZER
JAZ3-CHANNEL
DWL
TGA-DISCOVERY
UHV-XPS
RTP
UHV-MBE2
DISCO-DICING…
UHV-FTIR
ALD-FIJI
UHV-LEIS
UHV-MBE
UHV-PLD
US-CUTTER
NANOWIZARD
UHV-CLUSTER
UHV…
UHV…
APCVD
ULTRAFAST-LASER
ULTRASONIC…
ACCURION_RSE
LEICACOAT-STAN
Q-LAB
PARYLENE-DIENER
PECVD-NANOFAB
LEICACOAT-NANO
FRASCAN
DIMPLING…
NANOINDENTER
CHEMLAB-B1.14
CHEMLAB-B1.16
IS-NOVOCONTROL
DAWN-HELEOS
ZEISS-STAN
SCIA
FISCHIONE-TEM…
KAUFMAN
IR-RAMAN
K70
DRIE
TEGRAMIN
micro-CT-m300
LAURELL-NANO
FUMEHOOD…
FLOWBOX
EVAPORATOR
LYRA
4-POINT
FTIRMAG
FUMEHOOD…
FUMEHOOD-HF
FUMEHOOD…
micro-CT-L240
FUMEHOOD…
FUMEHOOD…
FUMEHOOD…
FUMEHOOD…
LECTROPOL
CLARUS-680
Micromex
SW-CT
LIBS-FireFly
R4…
ZEISS-NANO
CITOPRESS
NANOSCAN
NANOSAM
NIKON-NANO
NIRQUEST512
LEXT
NMR
ULTRACENTRIFUGE
DSC-DISCOVERY
3D-PRUSA-BLUE
3D-PRUSA-BLACK
3D-PRUSA-ORANGE
TEM-SW
PECVD
MIRKA
SW-COMSOL
MONOWAVE
3D-PRUSA-XL
LIBS-Discovery
TIC3X
LIBS-LabSys1
LITESCOPE-LYRA
LITESCOPE-MIRA…
CRYOMILL
LPCVD-polySi
LPCVD-SiN
LAKESHORE
PROTOMAT
WOOLLAM-MIR
LVEM
KERR-MICROSCOPE
HENRY-MAGNET
CPD
MINIEVAP
SUSS-MA8
DEKTAK
LABOTOM5
UV-LASER
Žaloudková, Lucie
Sonigara, Kevalkumar Kishorbhai
Wang, Yue
Polčák, Josef
Fatima, Areej
Ondračka, Pavel
Havelka, Tomáš
Pazourek, Petr
Allaham, Mohammad
T Kicmerova, Dina
Prajzler, Vladimír
Kostka, Marek
paiva de araujo, Estacio
Šimůnková, Helena
S Nebojsa, Alois
T Nebojsa, Alois
Lišková, Zuzana
S Lišková, Zuzana
Pribytova, Ekaterina
Lukiienko, Iryna
T Danchuk, Viktor
Otýpka, Martin
Henzl, Tomáš
Henzl, Tomáš
T Máčala, Jakub
Mukherjee, Aniket
T Sanna, Michela
T Prášek, Jan
Bajwa, Laiba Asad
Kubinec, Ondrej
U Janů, Lucie
Šimůnková, Helena
Dubroka, Adam
S Michalička, Jan
Pribytova, Ekaterina
Franta, Daniel
paiva de araujo, Estacio
Mařák, Vojtěch
Bajwa, Laiba Asad
Wang, Yue
E Kolíbalová, Eva
T Eliáš, Marek
Kepič, Peter
B Man, Ondřej
B Kolíbalová, Eva
Endstrasser, Zdeněk
U Polčák, Josef
D'Angelo, Elena
Endstrasser, Zdeněk
Otýpka, Martin
Fu, Hongbo
Bajwa, Laiba Asad
Henzl, Tomáš
Mukherjee, Aniket
Krčma, Jakub
Chamradová, Ivana
Formánek, Šimon
Krútek, Šimon

Upcoming trainings

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Term Name Description Max. attendees
6.10. 09:00 - 13:00 Verios_basic (1/2) Verios_basic (1/2): training for new users, demonstration part. Meeting point: entrance to StAn CLR labs (bldg. A, 1st floor). Bring your cleanroom stationery set if you have one. Register one slot for the Verios_basic (2/2) hands-on session to complete the training curriculum. Attendees: Jáchym Štindl, Tadeáš Lesovský, Filip Janík 3
6.10. 09:00 - 12:00 FTIR Basic training Attendees: Romana Ščotková 1
6.10. 09:30 - 12:00 ICON-SPM basic training Attendees: Areej Fatima, Štěpánka Kelarová 3
6.10. 09:30 - 12:00 RIE-chlorine-training Attendees: Kryštof Jasenský 3
6.10. 10:00 - 17:00 NANO-ONE-2PP 2/2 Second part of the NANO-ONE-2PP training. Assisted printing with users who had already attended the first part of the training. Meeting point in front of the User Office. Dvorak from 10, Burda from 13. Attendees: Daniel Burda, Vladislav Dvořák 2
6.10. 10:00 - 12:00 VERSALAB VSM VERSALAB VSM training Attendees: Yanzhen Song 2
6.10. 13:15 - 16:15 Magnetron EN Standard training in English Attendees: Laiba Asad Bajwa 1
7.10. 09:00 - 10:30 Verios_basic (2/2) Verios_basic (2/2): hands-on session. Bring your real sample(s) with you. Attendees: Filip Janík 1
7.10. 10:30 - 12:00 Verios_basic (2/2) Verios_basic (2/2): hands-on session. Bring your real sample(s) with you. Attendees: Jáchym Štindl 1
7.10. 12:30 - 14:00 Verios_basic (2/2) Verios_basic (2/2): hands-on session. Bring your real sample(s) with you. Attendees: Tadeáš Lesovský 1
8.10. 09:30 - 12:00 ALD-Beneq-training Attendees: Andrej Juríček, David Neradilek, Peter Kepič 3
9.10. 10:00 - 13:00 DLS-ZetaSizer Part 1 This training will provide hands-on practice with basic methods for measuring particle size and zeta potential using the ZetaSizer. The session will cover: -An overview of DLS principles, including light scattering and Brownian motion. -Step-by-step guidance on preparing samples for size and zeta potential measurements. -The use of different measurement cells (e.g., disposable and reusable cuvettes) and their applications for specific types of samples. Practical demonstration of data acquisition, optimization of measurement parameters, and analysis using the Malvern software interface. By the end of the training, participants will gain both theoretical insights and practical expertise in using the Malvern device for comprehensive particle characterization. Attendees: Carolina Sanna 3
12.10. 09:00 - 12:30 RAITH training basic 1/3 RAITH basic training. Introduction to the RAITH150 Two system and the Electron Optics software. Operation of ZEISS SEM and basic functions. Attendees: Marie Cmíralová 1
13.10. 10:30 - 12:00 RIE-flourine-training 3
15.10. 09:30 - 16:30 MIRA-STAN 1/2 Meeting point at the microscope. This is a two-step training, register for part 2 in our booking system. Obligatory prerequisites must be completed 2 days before the training. More information about the training is available on our <a href=”https://cfmoodle.ceitec.vutbr.cz/course/view.php?id=76”>Moodle</a>. Attendees: Tadeáš Lesovský, Sy Nguyen Pham, Sharmistha Dey 4
16.10. 09:00 - 13:00 KRATOS-XPS Basic training (session 1/2) - max 2 attendees. In case of interest for the training (when it is full) write to josef.polcak@ceitec.vutbr.cz. Attendees: Tadeáš Lesovský 2
19.10. 10:30 - 11:15 Nanofab interview - Meeting room C2.11 or C2.07 This interview is mandatory for enrollment to the Safety excursion - Nanofabrication lab. Join: [HERE](https://teams.microsoft.com/meet/385586219854116?p=ua7bQZ5EfzCA2ueQx6) Meeting ID: 385 586 219 854 116 Access code: zt6FS25C Attendees: David Neradilek 5
20.10. 12:15 - 12:50 Safety excursion - Advanced Chemical lab Attendees: Dominik Hrůza, Tadeáš Lesovský, Romana Ščotková, Miriama Malček Šimunková 5
20.10. 13:00 - 13:50 Safety excursion - Nanofabrication lab Please enroll in this training only in parallel with the "Nanofab interview." Do not enroll in training ahead of time, but when you are sure you will be using nanofabrication techniques. It is possible to pass this training anytime during your access additionally (it takes place at least once a month). Attendees: David Neradilek 5
20.10. 13:55 - 14:20 Safety excursion - Nanocharacterization lab Attendees: Tadeáš Lesovský, Karol Križan, Lukáš Dokulil 10
20.10. 14:25 - 14:55 Safety excursion - Structural Analysis Attendees: Romana Ščotková, Lukáš Dokulil 10