Thursday 2.7.2026
CEITEC Nano Research Infrastructure http://nano.ceitec.cz/
0:00 1:00 2:00 3:00 4:00 5:00 6:00 7:00 8:00 9:00 10:00 11:00 12:00 13:00 14:00 15:00 16:00 17:00 18:00 19:00 20:00 21:00 22:00 23:00
ML3-BABY
SUSS-WETBENCH
KRATOS-XPS
WITEC-RAMAN
MIRA-STAN
FTIR-CHEMLAB
EVAPORATOR
TITAN
BET-ANAMET
VACUUM-OVEN-B1…
RAITH
RIE-FLUORINE
MIRA-EBL
RIGAKU3
FUMEHOOD…
FUMEHOOD…
AMBER
UHV-DEPOSITION
FUMEHOOD…
FUMEHOOD-HF
CLARUS-680
TEGRAMIN
VNA-MPI
CHEMLAB-B1.14
SUSS-RCD8
SCIA
KEITHLEY-4200
DIENER
LAURELL-NANO
LYRA
LITESCOPE-MIRA…
NMR
LAKESHORE
CRYOGENIC
SIMS
PARYLENE-SCS
WOOLLAM-VIS
WOOLLAM-RC2
UHV-LEEM
PECVD
HELIOS
UHV-PREPARATION
MPS150
GLOVEBOX…
RIGAKU9
ALD-FIJI
BET-DEGASSER
LEICACOAT-STAN
UHV-XPS
DWL
FTIR
R4…
UHV…
nano-CT
VUVAS
LaserMIRA
SEE-SYSTEM
VISCOMETER
L450
UHV-SPM
WIRE-BONDER
ICON-SPM
SNOM-NANONICS
UHV-PLD
XEF2
RSA
MINIFLEX
nanoCT
SUMMIT
RIE-CHLORINE
microCT
ZWICK
ZETASIZER
ACCURION_RSE
RTP
Q-LAB
UHV-LEIS
UHV-MBE
SPINCOATER…
SAW-ACCUTOM
MIRKA
VACUUM-OVEN-B1…
SHAKER-B1.18
UHV-MBE1
UHV…
UHV-MBE2
TGA-DISCOVERY
Heliscan
THEORY-SUPPORT
TEM-SW
ULTRAFAST-LASER
ULTRASONIC…
TEST-RFID4
TEST-RFID2
Test školení
TEST2
US-CUTTER
Test O2
Test Ondra 3
CITOVAC
JASCO
FISCHIONE-160
TENUPOL
JAZ3-CHANNEL
LEICA-TXP
SW-TRACER
SW-LAB
SW-BEAMER
VACUUM_OVEN-C1…
UHV-FTIR
STEMI
UHV-CLUSTER
NANOCALC
TGA96
NANO-ONE-2PP
PARYLENE-DIENER
FLOWBOX
DRIE
DHR
DIMPLING…
DRYING-OVEN-B1…
SPONGEBOB
LECTROPOL
ELECTROWORKSHOP
4-POINT
CRYOMILL
FTIRMAG
FUMEHOOD…
FUMEHOOD…
FUMEHOOD…
FUMEHOOD…
FUMEHOOD…
Micromex
micro-CT-L240
SW-CT
VERSALAB
DAWN-HELEOS
BRILLOUIN
ALD-BENEQ
APCVD-Diffusion
ARES
MAGNETRON-AJA
APCVD
NANOWIZARD
DISCO-DICING…
BAMBULAB
TORNADO-M4
TIC3X
MECHANICAL…
CEITEC-NANO
TUBE-FURNACE
CLR-ISO8-Lab…
SW-COMSOL
LEXT
MINIEVAP
CPD
micro-CT-m300
VERIOS
3D-PRUSA-ORANGE
MONOWAVE
HENRY-MAGNET
MAGNETRON
SUSS-MA8
DEKTAK
LABOTOM5
WOOLLAM-MIR
3D-PRUSA-XL
DSC-DISCOVERY
CITOPRESS
LVEM
NANOSCAN
NANOSAM
NIKON-NANO
NIRQUEST512
ZEISS-NANO
ULTRACENTRIFUGE
3D-PRUSA-BLUE
3D-PRUSA-BLACK
KERR-MICROSCOPE
PROTOMAT
PECVD-NANOFAB
KAUFMAN
LEICACOAT-NANO
FRASCAN
NANOINDENTER
CHEMLAB-B1.16
CHEMLAB-B1.18
IS-NOVOCONTROL
ZEISS-STAN
FISCHIONE-TEM…
IR-RAMAN
LPCVD-SiN
K70
R2-PECVD
LASER-DICER
LIBS-FireFly
LIBS-Discovery
LIBS-LabSys1
LITESCOPE-LYRA
LPCVD-polySi
UV-LASER
Supalová, Linda
Supalová, Linda
Bajwa, Laiba Asad
Povey, Rhys Geoffrey
Povey, Rhys Geoffrey
Supalová, Linda
Bajwa, Laiba Asad
Povey, Rhys Geoffrey
Kunc, Jan
Jasenský, Kryštof
T Polčák, Josef
Valadi Palliyalil, Anjali
Polčák, Josef
Janů, Lucie
Mařák, Vojtěch
Supalová, Linda
Bakhshikhah, Mahan
Surana, Karan Singh
Říhová, Martina
Kramář, Jan
Izsák, Dávid
Kalleshappa, Bindu
Kunc, Jan
Kunc, Jan
T Kolíbalová, Eva
S Michalička, Jan
Tantis, Iosif
AL Soud, Ammar
Bednaříková, Vendula
Hu, Ying
Kunc, Jan
Jasenský, Kryštof
Kunc, Jan
Bajwa, Laiba Asad
Kunc, Jan
Pradhan, Gyandeep
Wirthová, Michaela
Bednaříková, Vendula
Bajwa, Laiba Asad
Bajwa, Laiba Asad
S Iakoubovskii, Konstantin
Endstrasser, Zdeněk
Sysel, Petr
Bajwa, Laiba Asad
B Sanna, Michela
Skálová, Zdenka
Pribytova, Ekaterina
Hu, Ying
Povey, Rhys Geoffrey
Otýpka, Martin
E Citterberg, Daniel
Krútek, Šimon
Bajwa, Laiba Asad
S Šamořil, Tomáš
Kramář, Jan
Sanna, Carolina
Holcman, Vladimír
Pribytova, Ekaterina
Danchuk, Viktor
Bajwa, Laiba Asad
Franta, Daniel
T Franta, Daniel
Endstrasser, Zdeněk
Cuccu, Elisa
Bahadur, Fateh
Endstrasser, Zdeněk
E Citterberg, Daniel
Saldan, Ivan
Varshney, Devanshu
Kunc, Jan
Tantis, Iosif
Říhová, Martina
D'Angelo, Elena
Hrdý, Radim
Nebojsa, Alois
Janů, Lucie

Upcoming trainings

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Term Name Description Max. attendees
2.7. 09:00 - 13:00 KRATOS-XPS Basic training (session 1/2) - max 2 attendees. In case of interest for the training (when it is full) write to josef.polcak@ceitec.vutbr.cz. Attendees: Nikol Kaděrová, Ying Hu, Debika Devi Thongam 2
2.7. 12:00 - 1.7. 14:00 Woollam RC2 The first part of the training Attendees: Elisa Cuccu 1
8.7. 09:00 - 11:30 BET training: Degassing (1/2) Degassing of the sample (1/2) Attendees: Amirmohsen Fanisaberi, Karan Singh Surana, Debika Devi Thongam 3
8.7. 10:00 - 12:00 Witec-Raman meeting in front of user office. Attendees: Navajsharif Shamshuddin Shaikh, Peter Fecko 4
8.7. 11:30 - 15:00 BET training: measurement (2/2) Standard measurement Attendees: Amirmohsen Fanisaberi, Karan Singh Surana, Debika Devi Thongam 2
20.7. 10:30 - 11:15 Nanofab interview - Meeting room C2.11 or C2.07 This interview is mandatory for enrollment to the Safety excursion - Nanofabrication lab. Join: [HERE](https://teams.microsoft.com/meet/35462004903561?p=GpHxeNZeulO7czefLV) Meeting ID: 354 620 049 035 61 Access code: 7AD77PX3 5
21.7. 09:30 - 12:30 FTIR-CHEMLAB Meeting point in Chemlab. Attendees: Petr Sysel, Debika Devi Thongam 3
21.7. 12:15 - 12:50 Safety excursion - Advanced Chemical lab 5
21.7. 13:00 - 13:50 Safety excursion - Nanofabrication lab Please enroll in this training only in parallel with the "Nanofab interview." Do not enroll in training ahead of time, but when you are sure you will be using nanofabrication techniques. It is possible to pass this training anytime during your access additionally (it takes place at least once a month). 5
21.7. 13:55 - 14:20 Safety excursion - Nanocharacterization lab Attendees: Laura Búšová 10
21.7. 14:25 - 14:55 Safety excursion - Structural Analysis 10
22.7. 09:00 - 10:30 JASCO training- CZ Description of holders and software, basic measurement Attendees: Marie Jakešová, Anna Tvrdoňová, Šimon Krútek 3
22.7. 09:30 - 16:30 MIRA-STAN 1/2 Meeting point at the microscope. This is a two-step training, register for part 2 in our booking system. Obligatory prerequisites must be completed 2 days before the training. More information about the training is available on our <a href=”https://cfmoodle.ceitec.vutbr.cz/course/view.php?id=76”>Moodle</a>. Attendees: Sharmistha Dey, Debika Devi Thongam 4
22.7. 10:30 - 12:00 JASCO training - EN Description of holders and software, basic measurement Attendees: Laiba Asad Bajwa, Rosmi Vinson 2
23.7. 09:00 - 13:00 Verios_basic (1/2) Verios_basic (1/2): training for new users, demonstration part. Meeting point: entrance to StAn CLR labs (bldg. A, 1st floor). Bring your cleanroom stationery set if you have one. Register one slot for the Verios_basic (2/2) hands-on session to complete the training curriculum. Attendees: Navajsharif Shamshuddin Shaikh, Ondrej Kubinec, Debika Devi Thongam 3
24.7. 09:00 - 10:30 Verios_basic (2/2) Verios_basic (2/2): hands-on session. Bring your real sample(s) with you. 1
24.7. 10:30 - 12:00 Verios_basic (2/2) Verios_basic (2/2): hands-on session. Bring your real sample(s) with you. Attendees: Debika Devi Thongam 1
24.7. 12:30 - 14:00 Verios_basic (2/2) Verios_basic (2/2): hands-on session. Bring your real sample(s) with you. Attendees: Ondrej Kubinec 1
27.7. 09:30 - 13:30 ZWICK Meeting point is in front of the Advanced Chemical laboratory. Obligatory prerequisites 1. Pass the Chemical laboratory safety excursion in Moodle (https://cfmoodle.ceitec.vutbr.cz/course/view.php?id=173): 2. Answer the ZWICK applicant questionnaire 3. Read the ZWICK rules (mark the activity as complete with ✔️) 4. Bring your own sample Recommended prerequisites 5. Get familiar with the Layout for ZWICK basic training (mark the activity as complete with ✔️) Attendees: Rasul Valiyev 2
29.7. 09:30 - 13:00 MIRA-STAN 2/2 Meeting point at the microscope. This is a two-step training, register for part 1 in our booking system. More information about the training is available on our <a href=”https://cfmoodle.ceitec.vutbr.cz/course/view.php?id=76”>Moodle</a>. Attendees: Debika Devi Thongam 2
4.8. 09:00 - 12:00 Verios/Helios_EDS Practical demonstration of EDS analytical system at Verios and Helios. Attendees: Debika Devi Thongam, Kateřina Polášková 3
18.8. 09:00 - 13:00 Verios_basic (1/2) Verios_basic (1/2): training for new users, demonstration part. Meeting point: entrance to StAn CLR labs (bldg. A, 1st floor). Bring your cleanroom stationery set if you have one. Register one slot for the Verios_basic (2/2) hands-on session to complete the training curriculum. Attendees: Šimon Formánek 3
19.8. 09:00 - 10:30 Verios_basic (2/2) Verios_basic (2/2): hands-on session. Bring your real sample(s) with you. 1
19.8. 10:30 - 12:00 Verios_basic (2/2) Verios_basic (2/2): hands-on session. Bring your real sample(s) with you. 1
19.8. 12:30 - 14:00 Verios_basic (2/2) Verios_basic (2/2): hands-on session. Bring your real sample(s) with you. 1