| 9.3. 09:00 - 16:00 |
GC-MS CLARUS-680 Training
|
GC-MS CLARUS-680 Training from Perkin Elmer
Attendees:
Michela
Sanna,
Kateřina
Tmejová
|
2
|
| 9.3. 09:00 - 14:00 |
RAITH training 3/3
|
Hands-on session
Attendees:
Elisa
Cuccu
|
1
|
| 10.3. 08:30 - 17:30 |
Amber
|
Meeting point at the microscope.
Attendees:
Eduard
Jelínek
|
4
|
| 10.3. 10:30 - 12:00 |
RIE-training
|
Attendees:
Elisa
Cuccu
|
3
|
| 11.3. 09:00 - 10:30 |
JASCO training
|
Description of holders and software, basic measurement
Attendees:
Daina Dayana
Arenas Buelvas,
Karan Singh
Surana,
Pedro Henrique
de Oliveira Santiago
|
3
|
| 12.3. 10:00 - 10:30 |
Electroworkshop - basics
|
Basic & safety training for entering the electroworkshop. It is a prerequisite for all subsequent trainings (3d printers, soldering, laser) for instruments located in the electroworkshop.
Attendees:
Konstantin
Iakoubovskii
|
3
|
| 13.3. 09:30 - 12:00 |
ICON-SPM basic training
|
Attendees:
Martina
Janůšová,
Ondrej
Kubinec,
Tomáš
Janoušek
|
3
|
| 17.3. 09:00 - 17:00 |
Helios_basic (1/2)
|
Helios_basic (1/2): training for new users, demonstration part. Meeting point: entrance to StAn CLR labs (bldg. A, 1st floor). Bring your cleanroom stationery set if you have one. Register one slot (only) for the Helios_basic (2/2) hands-on session to complete the training curriculum.
Attendees:
Jiří
Spousta,
Jan
Pišťák,
Mohamed
Bensalem
|
3
|
| 18.3. 09:00 - 12:00 |
Verios/Helios_EDS
|
Practical demonstration of EDS analytical system at Verios and Helios.
Attendees:
Karan Singh
Surana,
Saurabh
Pathak
|
3
|
| 19.3. 09:00 - 16:00 |
Helios_basic (2/2)
|
Helios_basic (2/2): Hands-on session for attendees of Helios_basic (1/2).
Attendees:
Mohamed
Bensalem
|
1
|
| 20.3. 13:30 - 15:30 |
FTIR-CHEMLAB
|
Meeting point in Chemlab.
Attendees:
Saurabh
Pathak
|
2
|
| 23.3. 10:30 - 11:15 |
Nanofab interview - Meeting room C2.11 or C2.07
|
This interview is mandatory for enrollment to the Safety excursion - Nanofabrication lab.
ID schůzky: 341 031 483 654
Přístupový kód: hz6gW67Y
Attendees:
Šimon
Formánek
|
5
|
| 24.3. 09:00 - 13:00 |
Verios_basic (1/2)
|
Verios_basic (1/2): training for new users, demonstration part. Meeting point: entrance to StAn CLR labs (bldg. A, 1st floor). Bring your cleanroom stationery set if you have one. Register one slot for the Verios_basic (2/2) hands-on session to complete the training curriculum.
Attendees:
Jan
Klíma,
Radim
Slovák,
Tomáš
Janoušek
|
3
|
| 24.3. 12:15 - 12:50 |
Safety excursion Chem lab
|
The Moodle course, Advanced Chemical Laboratory is MANDATORY for the Safety Excursion. https://cfmoodle.ceitec.vutbr.cz/course/index.php?categoryid=48. It must be finished 2 work days before the excursion.
Attendees:
Šimon
Formánek
|
5
|
| 24.3. 13:00 - 13:50 |
Safety excursion - Nanofabrication lab
|
Please enroll in this training only in parallel with the "Nanofab interview."
Do not enroll in training ahead of time, but when you are sure you will be using nanofabrication techniques. It is possible to pass this training anytime during your access additionally (it takes place at least once a month).
Attendees:
Šimon
Formánek
|
5
|
| 24.3. 13:55 - 14:20 |
Safety excursion - Nanocharacterization lab
|
|
10
|
| 24.3. 14:25 - 14:55 |
Safety excursion - StAn lab
|
Attendees:
Šimon
Formánek
|
10
|
| 25.3. 09:00 - 10:30 |
Verios_basic (2/2)
|
Verios_basic (2/2): hands-on session. Bring your real sample(s) with you.
Attendees:
Tomáš
Janoušek
|
1
|
| 25.3. 10:30 - 12:00 |
Verios_basic (2/2)
|
Verios_basic (2/2): hands-on session. Bring your real sample(s) with you.
|
1
|
| 25.3. 12:30 - 14:00 |
Verios_basic (2/2)
|
Verios_basic (2/2): hands-on session. Bring your real sample(s) with you.
|
1
|
| 27.3. 09:30 - 16:30 |
MIRA-STAN 1/2
|
Meeting point at the microscope. This is a two-step training, register for part 2 in our booking system. Obligatory prerequisites must be completed 2 days before the training. More information about the training is available on our <a href=”https://cfmoodle.ceitec.vutbr.cz/course/view.php?id=76”>Moodle</a>.
Attendees:
Carolina
Oliver Urrutia,
Ondrej
Kubinec
|
4
|
KRATOS-XPS
WOOLLAM-VIS
SEE-SYSTEM