Tuesday 31.3.2026
CEITEC Nano Research Infrastructure http://nano.ceitec.cz/
0:00 1:00 2:00 3:00 4:00 5:00 6:00 7:00 8:00 9:00 10:00 11:00 12:00 13:00 14:00 15:00 16:00 17:00 18:00 19:00 20:00 21:00 22:00 23:00
RIE-FLUORINE
SUSS-WETBENCH
WITEC-RAMAN
VERIOS
RIGAKU3
MIRA-STAN
CRYOGENIC
FUMEHOOD…
VERSALAB
ML3-BABY
DRIE
ICON-SPM
TITAN
LYRA
CHEMLAB-B1.18
KRATOS-XPS
UHV-XPS
LVEM
KERR-MICROSCOPE
UHV-LEEM
AMBER
CLARUS-680
UHV-DEPOSITION
LAKESHORE
IS_NOVOCONTROL
TGA-DISCOVERY
UHV-SPM
TEGRAMIN
R2-PECVD
NANOCALC
LEICACOAT-NANO
SCIA
LASER-DICER
HELIOS
MAGNETRON
BRILLOUIN
LEICACOAT-STAN
EVAPORATOR
PARYLENE-DIENER
UHV-PREPARATION
RAITH
ALD-BENEQ
MIRA-EBL
WOOLLAM-MIR
DSC-DISCOVERY
DIENER
RIGAKU9
NANOSCAN
TUBE-FURNACE
STEMI
SUSS-RCD8
SW-TRACER
BET-ANAMET
SW-BEAMER
ACCURION_RSE
Q-LAB
RTP
SUMMIT
RIE-CHLORINE
SHAKER-B1.18
MINIFLEX
SIMS
LaserMIRA
nanoCT
nano-CT
RSA
SEE-SYSTEM
SNOM-NANONICS
PARYLENE-SCS
SW-LAB
3D-PRUSA-XL
LEICA-TXP
VACUUM_OVEN-B1…
DWL
JASCO
JAZ3-CHANNEL
VACUUM_OVEN-C1…
FTIR-CHEMLAB
FTIR
CITOVAC
VACUUM_OVEN-B1…
ULTRASONIC…
VUVAS
VISCOMETER
L450
WIRE-BONDER
XEF2
microCT
ZWICK
ZETASIZER
US-CUTTER
ULTRAFAST-LASER
TENUPOL
THEORY-SUPPORT
FISCHIONE-160
Test Ondra 3
Test O2
TEST2
Test školení
TEST-RFID2
SAW-ACCUTOM
TGA96
Heliscan
UHV…
UHV-MBE2
UHV-MBE1
UHV-FTIR
UHV-LEIS
UHV-MBE
UHV-PLD
UHV-CLUSTER
UHV…
SPINCOATER…
MONOWAVE
MIRKA
4-POINT
DIMPLING…
DRYING_OVEN-B1…
SPONGEBOB
LECTROPOL
ELECTROWORKSHOP
R4…
FLOWBOX
FTIRMAG
SW-CT
FUMEHOOD…
FUMEHOOD-HF
FUMEHOOD…
FUMEHOOD…
FUMEHOOD…
FUMEHOOD…
Micromex
DHR
CRYOMILL
micro-CT-m300
BAMBULAB
GLOVEBOX…
APCVD-Diffusion
ARES
APCVD
NANOWIZARD
ALD-FIJI
DISCO-DICING…
BET-DEGASSER
TIC3X
TORNADO-M4
MECHANICAL…
CEITEC-NANO
CLR-ISO8-Lab…
SW-COMSOL
LEXT
MINIEVAP
CPD
micro-CT-L240
DAWN-HELEOS
PECVD
NIKON-NANO
WOOLLAM-RC2
SUSS-MA8
DEKTAK
LABOTOM5
MPS150
CITOPRESS
NANOSAM
NIRQUEST512
PROTOMAT
WOOLLAM-VIS
NMR
ZEISS-NANO
ULTRACENTRIFUGE
3D-PRUSA-BLUE
3D-PRUSA-BLACK
3D-PRUSA-ORANGE
TEM-SW
HENRY-MAGNET
LPCVD-SiN
VNA-MPI
KAUFMAN
PECVD-NANOFAB
FRASCAN
NANOINDENTER
CHEMLAB-B1.14
CHEMLAB-B1.16
ZEISS-STAN
FISCHIONE-TEM…
IR-RAMAN
LPCVD-polySi
K70
KEITHLEY-4200
LAURELL-NANO
LIBS-FireFly
LIBS-Discovery
LIBS-LabSys1
LITESCOPE-LYRA
LITESCOPE-MIRA…
UV-LASER
Bajwa, Laiba Asad
Koňařík, Lukáš
Lukiienko, Iryna
Petrosyan, Derenik
Supalová, Linda
Kratochvílová, Ivana
Jelínek, Eduard
Jasenský, Kryštof
Citterberg, Daniel
Kratochvílová, Ivana
Jelínek, Eduard
Valero Soriano, Astolfo Enrique
Janoušek, Tomáš
Havelka, Tomáš
Pavliňák, David
Nandi, Sunny
Pišťák, Jan
Pathak, Saurabh
Koňařík, Lukáš
Nandi, Sunny
Thelappurath, Aiswarya Vijayakumar
Sobola, Dinara
Lukiienko, Iryna
Lukiienko, Iryna
Lukiienko, Iryna
Danchuk, Viktor
Lukiienko, Iryna
Jewula, Pawel
Jewula, Pawel
Arregi Uribeetxebarria, Jon Ander
Lukiienko, Iryna
Jelínek, Eduard
Kratochvílová, Ivana
Jelínek, Eduard
Kratochvílová, Ivana
Bokaei Khelejan, Hatef
paiva de araujo, Estacio
Michalička, Jan
Michalička, Jan
Šamořil, Tomáš
Jelínek, Eduard
Jewula, Pawel
Jewula, Pawel
T Polčák, Josef
Pavliňák, David
Molnár, Tomáš
S Kolíbalová, Eva
Arregi Uribeetxebarria, Jon Ander
Endstrasser, Zdeněk
Kolíbalová, Eva
Sanna, Michela
Endstrasser, Zdeněk
Holcman, Vladimír
Sobola, Dinara
Sevriugina, Veronika
Soldán, Marek
Havlíková, Tereza
Bolouki, Nima
Jelínek, Eduard
Yuan, Yunhuan
Štálnik, Jozef
Citterberg, Daniel
Kicmerova, Dina
Lukiienko, Iryna
Krčma, Jakub
Gejdoš, Pavel
U Prášek, Jan
Bajwa, Laiba Asad
Endstrasser, Zdeněk
Lišková, Zuzana
Štálnik, Jozef
Štálnik, Jozef
Franta, Daniel
Sevriugina, Veronika
Kovařík, Martin
Arregi Uribeetxebarria, Jon Ander
Kovařík, Martin
Dvořák, Petr

Upcoming trainings

Show more

Term Name Description Max. attendees
31.3. 09:00 - 13:00 KRATOS-XPS Basic training (session 1/2) - max 2 attendees. In case of interest for the training (when it is full) write to josef.polcak@ceitec.vutbr.cz. Attendees: Ondrej Kubinec, Sujan Maity 2
1.4. 09:00 - 11:00 SEE SYSTEM training WCA + SFE measurement training Attendees: Rasul Valiyev 1
1.4. 09:30 - 12:00 Tornado-M4 in front of entrance to STAN Attendees: Radek Slavíček 4
2.4. 13:00 - 14:30 JASCO training Description of holders and software, basic measurement Attendees: Areej Fatima 3
6.4. 09:30 - 6.2. 13:00 MIRA-STAN 2/2 Meeting point at the microscope. This is a two-step training, register for part 1 in our booking system. More information about the training is available on our <a href=”https://cfmoodle.ceitec.vutbr.cz/course/view.php?id=76”>Moodle</a>. Attendees: Carolina Oliver Urrutia, Ondrej Kubinec 2
7.4. 09:30 - 12:00 ALD-Beneq- training Attendees: Šimon Formánek 3
7.4. 10:00 - 13:00 CRYOGENIC VSM CRUOGENIC VSM training Attendees: Sujan Maity 2
7.4. 14:00 - 15:00 DIENER- training Attendees: Jozef Štálnik 3
9.4. 09:00 - 12:00 Verios/Helios_EDS Practical demonstration of EDS analytical system at Verios and Helios. Attendees: Tomáš Janoušek 3
16.4. 09:30 - 11:30 MIRA-STAN - EDS detector Only for users with an active MIRA-STAN certificate. Meeting point at the microscope. Attendees: Carolina Oliver Urrutia, Aida Fazlič, Ondrej Kubinec 4
17.4. 13:30 - 16:00 EBSD Verios/Helios (2/2) EBSD Verios/Helios (2/2): practical demonstration @ Helios Attendees: Adam Očkovič 5
6.5. 09:30 - 16:30 MIRA-STAN 1/2 Meeting point at the microscope. This is a two-step training, register for part 2 in our booking system. Obligatory prerequisites must be completed 2 days before the training. More information about the training is available on our <a href=”https://cfmoodle.ceitec.vutbr.cz/course/view.php?id=76”>Moodle</a>. 4