Thursday 28.5.2026
CEITEC Nano Research Infrastructure http://nano.ceitec.cz/
0:00 1:00 2:00 3:00 4:00 5:00 6:00 7:00 8:00 9:00 10:00 11:00 12:00 13:00 14:00 15:00 16:00 17:00 18:00 19:00 20:00 21:00 22:00 23:00
KRATOS-XPS
ML3-BABY
MIRA-STAN
SUSS-WETBENCH
VERSALAB
TITAN
VERIOS
PARYLENE-SCS
MIRA-EBL
RIE-FLUORINE
WITEC-RAMAN
RIGAKU9
CHEMLAB-B1.14
R4…
CRYOGENIC
RAITH
BET-ANAMET
UHV-XPS
EVAPORATOR
UHV-LEEM
AMBER
FUMEHOOD…
LYRA
UHV-DEPOSITION
LITESCOPE-MIRA…
SEE-SYSTEM
DIENER
LVEM
WOOLLAM-VIS
RIGAKU3
NANOSAM
MAGNETRON
VNA-MPI
DWL
JASCO
BET-DEGASSER
SUSS-MA8
UHV-PREPARATION
FTIR-CHEMLAB
ZWICK
CHEMLAB-B1.18
SHAKER-B1.18
SIMS
3D-PRUSA-BLACK
LaserMIRA
STEMI
NANOCALC
SUMMIT
ICON-SPM
PARYLENE-DIENER
SNOM-NANONICS
3D-PRUSA-ORANGE
RSA
nano-CT
nanoCT
TEM-SW
RIE-CHLORINE
SUSS-RCD8
ACCURION_RSE
RTP
Q-LAB
SPINCOATER…
SAW-ACCUTOM
MIRKA
PECVD
MINIFLEX
Test Ondra 3
SW-BEAMER
CITOVAC
UHV…
ULTRAFAST-LASER
ULTRASONIC…
US-CUTTER
JAZ3-CHANNEL
VACUUM_OVEN-C1…
FTIR
VACUUM-OVEN-B1…
UHV-CLUSTER
VACUUM-OVEN-B1…
VUVAS
VISCOMETER
L450
WIRE-BONDER
XEF2
microCT
ZETASIZER
UHV…
UHV-SPM
SW-LAB
TEST-RFID2
SW-TRACER
LEICA-TXP
TENUPOL
FISCHIONE-160
ULTRACENTRIFUGE
Test O2
TEST2
Test školení
TGA96
UHV-PLD
THEORY-SUPPORT
Heliscan
TGA-DISCOVERY
UHV-MBE1
UHV-MBE2
UHV-FTIR
UHV-LEIS
UHV-MBE
3D-PRUSA-BLUE
NanoOne250
ZEISS-NANO
FLOWBOX
SW-CT
DRIE
DHR
DIMPLING…
DRYING-OVEN-B1…
SPONGEBOB
LECTROPOL
ELECTROWORKSHOP
HELIOS
TIC3X
4-POINT
FTIRMAG
FUMEHOOD…
FUMEHOOD-HF
FUMEHOOD…
FUMEHOOD…
FUMEHOOD…
FUMEHOOD…
CRYOMILL
CPD
FUMEHOOD…
DISCO-DICING…
MPS150
GLOVEBOX…
ALD-BENEQ
APCVD-Diffusion
ARES
APCVD
NANOWIZARD
ALD-FIJI
BAMBULAB
MINIEVAP
BRILLOUIN
TORNADO-M4
MECHANICAL…
CEITEC-NANO
TUBE-FURNACE
CLR-ISO8-Lab…
LEICACOAT-STAN
SW-COMSOL
LEXT
FUMEHOOD…
CLARUS-680
NMR
DEKTAK
LITESCOPE-LYRA
LPCVD-polySi
LPCVD-SiN
LAKESHORE
PROTOMAT
KERR-MICROSCOPE
HENRY-MAGNET
WOOLLAM-RC2
LABOTOM5
LIBS-Discovery
WOOLLAM-MIR
3D-PRUSA-XL
DSC-DISCOVERY
MONOWAVE
CITOPRESS
NANOSCAN
NIKON-NANO
NIRQUEST512
LIBS-LabSys1
LIBS-FireFly
Micromex
CHEMLAB-B1.16
micro-CT-L240
micro-CT-m300
DAWN-HELEOS
TEGRAMIN
PECVD-NANOFAB
LEICACOAT-NANO
FRASCAN
NANOINDENTER
IS-NOVOCONTROL
LAURELL-NANO
ZEISS-STAN
SCIA
FISCHIONE-TEM…
KAUFMAN
IR-RAMAN
K70
KEITHLEY-4200
R2-PECVD
LASER-DICER
UV-LASER
Janůšová, Martina
Remešová, Michaela
Sobola, Dinara
Janů, Lucie
Bahadur, Fateh
Supalová, Linda
Jakešová, Marie
Petrosyan, Derenik
Kramář, Jan
Pavliňák, David
Kalleshappa, Bindu
Supalová, Linda
Jakešová, Marie
Supalová, Linda
Tichý, Martin
Daradkeh, Samer
Duchoň, Jan
S Michalička, Jan
U Kicmerova, Dina
Saadati, Arezoo
Tvrdoňová, Anna
Jakešová, Marie
Kovařík, Martin
Supalová, Linda
Supalová, Linda
Jakešová, Marie
Valero Soriano, Astolfo Enrique
Iakoubovskii, Konstantin
Caha, Ondřej
Malecot, Axel Fabien Benoit
Ullattil, Sanjay Gopal
Janůšová, Martina
Pribytova, Ekaterina
Lišková, Zuzana
Tkachenko, Serhii
Molnár, Tomáš
T Prášek, Jan
Endstrasser, Zdeněk
S Iakoubovskii, Konstantin
Jewula, Pawel
Kramář, Jan
Endstrasser, Zdeněk
Kramář, Jan
Valiyev, Rasul
Jakešová, Marie
T Kolíbalová, Eva
Duchaň, Marek
Novotná, Lenka
Bábor, Petr
Prášek, Jan
Pribytova, Ekaterina
Fecko, Peter
Ullattil, Sanjay Gopal
Tkachenko, Serhii
Tvrdoňová, Anna
Endstrasser, Zdeněk
Valadi Palliyalil, Anjali
T Lepcio, Petr
Tkachenko, Serhii

Upcoming trainings

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Term Name Description Max. attendees
28.5. 09:00 - 11:00 LVEM_basic (2/2) Hands-on session Attendees: Anjali Valadi Palliyalil, Debika Devi Thongam 1
28.5. 09:30 - 12:00 Zwick - Oven Training is focused on measuring mechanical properties at elevated temperatures using the oven. Attendees: Hongbo Fu 2
28.5. 12:00 - 14:00 LVEM_basic (2/2) Hands-on session 1
28.5. 13:30 - 26.5. 16:30 Evaporator EN Standard training in English Attendees: Derenik Petrosyan, Šimon Krútek, Helena Šimůnková 3
29.5. 08:30 - 11:30 LYRA basic training for MIRA experienced and returning users The training focused on the SEM part of the LYRA system. We will meet in the coffee room next to the user office in the C building. Attendees: Rostislav Řepa 4
29.5. 10:00 - 13:00 DLS-ZetaSizer Part 1+2 This training will provide hands-on practice with basic methods for measuring particle size and zeta potential using the ZetaSizer. The session will cover: -An overview of DLS principles, including light scattering and Brownian motion. -Step-by-step guidance on preparing samples for size and zeta potential measurements. -The use of different measurement cells (e.g., disposable and reusable cuvettes) and their applications for specific types of samples. Practical demonstration of data acquisition, optimization of measurement parameters, and analysis using the Malvern software interface. By the end of the training, participants will gain both theoretical insights and practical expertise in using the Malvern device for comprehensive particle characterization. Attendees: Ying Hu 3
29.5. 12:00 - 14:30 LYRA advanced training (FIB, GIS) for returning users Only for returning users! The training focused on FIB and GIS. We will meet in the LYRA lab. Attendees: Rostislav Řepa 4
2.6. 10:00 - 11:30 BET training: Degassing (1/2) Degassing of the sample (1/2) Attendees: Anjali Valadi Palliyalil, Lucie Žaloudková, Iosif Tantis 4
2.6. 11:30 - 15:00 BET training: measurement (2/2) Standard measurement Attendees: Anjali Valadi Palliyalil, Lucie Žaloudková, Iosif Tantis 4
3.6. 09:30 - 12:30 FTIR-CHEMLAB Meeting point in Chemlab. Attendees: Ying Hu, Iosif Tantis, Carolina Sanna, Debika Devi Thongam 3
4.6. 09:00 - 13:00 KRATOS-XPS Basic training (session 1/2) - max 2 attendees. In case of interest for the training (when it is full) write to josef.polcak@ceitec.vutbr.cz. Attendees: Šimon Formánek, Iosif Tantis 2
8.6. 09:00 - 17:30 Amber Practice Attendees: Rostislav Řepa, Jakub Šťastný 2
9.6. 09:00 - 13:00 Verios_basic (1/2) Verios_basic (1/2): training for new users, demonstration part. Meeting point: entrance to StAn CLR labs (bldg. A, 1st floor). Bring your cleanroom stationery set if you have one. Register one slot for the Verios_basic (2/2) hands-on session to complete the training curriculum. Attendees: Nikol Kaděrová 3
11.6. 09:00 - 10:30 Verios_basic (2/2) Verios_basic (2/2): hands-on session. Bring your real sample(s) with you. Attendees: Nikol Kaděrová 1
11.6. 10:30 - 12:00 Verios_basic (2/2) Verios_basic (2/2): hands-on session. Bring your real sample(s) with you. 1
11.6. 12:30 - 14:00 Verios_basic (2/2) Verios_basic (2/2): hands-on session. Bring your real sample(s) with you. 1
15.6. 09:00 - 13:00 DHR Basic rheology training. Meeting point at the rheometer. Attendees: Amirmohsen Fanisaberi, Carolina Sanna 2