Friday 29.5.2026
CEITEC Nano Research Infrastructure http://nano.ceitec.cz/
0:00 1:00 2:00 3:00 4:00 5:00 6:00 7:00 8:00 9:00 10:00 11:00 12:00 13:00 14:00 15:00 16:00 17:00 18:00 19:00 20:00 21:00 22:00 23:00
MIRA-STAN
VERIOS
LEICACOAT-STAN
MPS150
KRATOS-XPS
ELECTROWORKSHOP
EVAPORATOR
TITAN
UHV-XPS
UHV-DEPOSITION
LYRA
HELIOS
FUMEHOOD…
UHV-PREPARATION
VERSALAB
SUSS-WETBENCH
DIENER
MECHANICAL…
WITEC-RAMAN
KERR-MICROSCOPE
CHEMLAB-B1.14
ULTRACENTRIFUGE
NMR
WOOLLAM-VIS
SUSS-RCD8
VNA-MPI
RIE-FLUORINE
MINIFLEX
AMBER
CHEMLAB-B1.18
DEKTAK
LVEM
BET-ANAMET
KEITHLEY-4200
LASER-DICER
MAGNETRON
MIRA-EBL
SEE-SYSTEM
LITESCOPE-MIRA…
UHV-LEEM
SIMS
CRYOGENIC
ML3-BABY
3D-PRUSA-ORANGE
RAITH
VACUUM-OVEN-B1…
FUMEHOOD…
SPONGEBOB
ULTRAFAST-LASER
UHV-SPM
ZETASIZER
RIGAKU9
TORNADO-M4
nano-CT
RSA
VUVAS
UHV-MBE
VACUUM-OVEN-B1…
VISCOMETER
CITOVAC
ICON-SPM
PARYLENE-SCS
FTIR
FTIR-CHEMLAB
SNOM-NANONICS
L450
nanoCT
JAZ3-CHANNEL
RIE-CHLORINE
WIRE-BONDER
XEF2
RIGAKU3
ACCURION_RSE
RTP
Q-LAB
microCT
ZWICK
SPINCOATER…
SAW-ACCUTOM
MIRKA
VACUUM_OVEN-C1…
SHAKER-B1.18
LaserMIRA
Test O2
UHV-FTIR
UHV-PLD
UHV-MBE2
UHV-MBE1
TGA-DISCOVERY
Heliscan
THEORY-SUPPORT
TGA96
TEST-RFID2
PECVD
UHV-CLUSTER
UHV…
TEST2
Test Ondra 3
SUMMIT
UHV…
FISCHIONE-160
TENUPOL
LEICA-TXP
SW-TRACER
SW-LAB
SW-BEAMER
ULTRASONIC…
STEMI
US-CUTTER
NANOCALC
DWL
JASCO
UHV-LEIS
Test školení
NanoOne250
TEM-SW
4-POINT
DRIE
DHR
DIMPLING…
DRYING-OVEN-B1…
LECTROPOL
R4…
FLOWBOX
FTIRMAG
CRYOMILL
FUMEHOOD-HF
FUMEHOOD…
FUMEHOOD…
FUMEHOOD…
FUMEHOOD…
FUMEHOOD…
FUMEHOOD…
CLARUS-680
SW-CT
TIC3X
micro-CT-L240
DISCO-DICING…
GLOVEBOX…
ALD-BENEQ
APCVD-Diffusion
ARES
APCVD
NANOWIZARD
ALD-FIJI
BAMBULAB
CPD
BET-DEGASSER
BRILLOUIN
CEITEC-NANO
TUBE-FURNACE
CLR-ISO8-Lab…
SW-COMSOL
LEXT
MINIEVAP
Micromex
micro-CT-m300
PARYLENE-DIENER
DSC-DISCOVERY
PROTOMAT
HENRY-MAGNET
WOOLLAM-RC2
SUSS-MA8
LABOTOM5
WOOLLAM-MIR
3D-PRUSA-XL
MONOWAVE
LPCVD-SiN
CITOPRESS
NANOSCAN
NANOSAM
NIKON-NANO
NIRQUEST512
ZEISS-NANO
3D-PRUSA-BLUE
3D-PRUSA-BLACK
LAKESHORE
LPCVD-polySi
DAWN-HELEOS
SCIA
TEGRAMIN
PECVD-NANOFAB
LEICACOAT-NANO
FRASCAN
NANOINDENTER
CHEMLAB-B1.16
IS-NOVOCONTROL
ZEISS-STAN
FISCHIONE-TEM…
LITESCOPE-LYRA
KAUFMAN
IR-RAMAN
K70
R2-PECVD
LAURELL-NANO
LIBS-FireFly
LIBS-Discovery
LIBS-LabSys1
UV-LASER
Kramář, Jan
Surana, Karan Singh
Sevriugina, Veronika
Hu, Ying
Fallahpour, Mojdeh
Lukiienko, Iryna
Fanisaberi, Amirmohsen
Tkachenko, Serhii
Fanisaberi, Amirmohsen
Bednaříková, Vendula
Sevriugina, Veronika
paiva de araujo, Estacio
Citterberg, Daniel
paiva de araujo, Estacio
Polčák, Josef
Valadi Palliyalil, Anjali
Daradkeh, Samer
Iakoubovskii, Konstantin
Kumar, Sanjay
Arregi Uribeetxebarria, Jon Ander
Kovařík, Martin
Jasenský, Kryštof
Petrosyan, Derenik
Horák, Michal
S Michalička, Jan
S Michalička, Jan
D'Angelo, Elena
Hrůza, Dominik
D'Angelo, Elena
Hrůza, Dominik
T Šamořil, Tomáš
Kramář, Jan
S Man, Ondřej
Man, Ondřej
Jewula, Pawel
Tmejová, Kateřina
D'Angelo, Elena
Hrůza, Dominik
Daradkeh, Samer
Tichý, Martin
Petrosyan, Derenik
Lišková, Zuzana
paiva de araujo, Estacio
paiva de araujo, Estacio
Varga, Dominik
Varga, Dominik
T Spotz, Zdeněk
Supalová, Linda
Arregi Uribeetxebarria, Jon Ander
U Tmejová, Kateřina
Hu, Ying
Jewula, Pawel
Duchaň, Marek
Petrosyan, Derenik
Pribytova, Ekaterina
Petrosyan, Derenik
Iakoubovskii, Konstantin
Iakoubovskii, Konstantin
Lukiienko, Iryna
Danchuk, Viktor
Říhová, Martina
Tkachenko, Serhii
Citterberg, Daniel
Patil, Virendra
U Prášek, Jan
Liška, Jiří
Valiyev, Rasul
Kramář, Jan
D'Angelo, Elena
Danchuk, Viktor
Pribytova, Ekaterina
Liška, Jiří
Fecko, Peter
Lišková, Zuzana
U Tmejová, Kateřina
Jasenský, Kryštof
Tvrdoňová, Anna
Jasenský, Kryštof
D'Angelo, Elena
T Sanna, Michela
Malecot, Axel Fabien Benoit
T Spotz, Zdeněk

Upcoming trainings

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Term Name Description Max. attendees
29.5. 08:30 - 11:30 LYRA basic training for MIRA experienced and returning users The training focused on the SEM part of the LYRA system. We will meet in the coffee room next to the user office in the C building. Attendees: Rostislav Řepa 4
29.5. 10:00 - 13:00 DLS-ZetaSizer Part 1+2 This training will provide hands-on practice with basic methods for measuring particle size and zeta potential using the ZetaSizer. The session will cover: -An overview of DLS principles, including light scattering and Brownian motion. -Step-by-step guidance on preparing samples for size and zeta potential measurements. -The use of different measurement cells (e.g., disposable and reusable cuvettes) and their applications for specific types of samples. Practical demonstration of data acquisition, optimization of measurement parameters, and analysis using the Malvern software interface. By the end of the training, participants will gain both theoretical insights and practical expertise in using the Malvern device for comprehensive particle characterization. Attendees: Ying Hu 3
29.5. 12:00 - 14:30 LYRA advanced training (FIB, GIS) for returning users Only for returning users! The training focused on FIB and GIS. We will meet in the LYRA lab. Attendees: Rostislav Řepa 4
2.6. 10:00 - 11:30 BET training: Degassing (1/2) Degassing of the sample (1/2) Attendees: Anjali Valadi Palliyalil, Lucie Žaloudková, Iosif Tantis 4
2.6. 11:30 - 15:00 BET training: measurement (2/2) Standard measurement Attendees: Anjali Valadi Palliyalil, Lucie Žaloudková, Iosif Tantis 4
3.6. 09:30 - 12:30 FTIR-CHEMLAB Meeting point in Chemlab. Attendees: Ying Hu, Iosif Tantis, Carolina Sanna, Debika Devi Thongam 3
4.6. 09:00 - 13:00 KRATOS-XPS Basic training (session 1/2) - max 2 attendees. In case of interest for the training (when it is full) write to josef.polcak@ceitec.vutbr.cz. Attendees: Šimon Formánek, Iosif Tantis 2
8.6. 09:00 - 17:30 Amber Practice Attendees: Rostislav Řepa, Jakub Šťastný 2
9.6. 09:00 - 13:00 Verios_basic (1/2) Verios_basic (1/2): training for new users, demonstration part. Meeting point: entrance to StAn CLR labs (bldg. A, 1st floor). Bring your cleanroom stationery set if you have one. Register one slot for the Verios_basic (2/2) hands-on session to complete the training curriculum. Attendees: Nikol Kaděrová 3
11.6. 09:00 - 10:30 Verios_basic (2/2) Verios_basic (2/2): hands-on session. Bring your real sample(s) with you. Attendees: Nikol Kaděrová 1
11.6. 10:30 - 12:00 Verios_basic (2/2) Verios_basic (2/2): hands-on session. Bring your real sample(s) with you. 1
11.6. 12:30 - 14:00 Verios_basic (2/2) Verios_basic (2/2): hands-on session. Bring your real sample(s) with you. 1
15.6. 09:00 - 13:00 DHR Basic rheology training. Meeting point at the rheometer. Attendees: Amirmohsen Fanisaberi, Carolina Sanna 2
22.6. 10:30 - 11:15 Nanofab interview - Meeting room C2.11 or C2.07 This interview is mandatory for enrollment to the Safety excursion - Nanofabrication lab. Join: [HERE](https://teams.microsoft.com/meet/324197360288872?p=8YaxjqMg8zpRrwFFMC ) Meeting ID: 324 197 360 288 872 Access code: hW3qJ6bB 5
23.6. 12:15 - 12:50 Safety excursion - Advanced Chemical lab 5
23.6. 13:00 - 13:50 Safety excursion - Nanofabrication lab Please enroll in this training only in parallel with the "Nanofab interview." Do not enroll in training ahead of time, but when you are sure you will be using nanofabrication techniques. It is possible to pass this training anytime during your access additionally (it takes place at least once a month). 5
23.6. 13:55 - 14:20 Safety excursion - Nanocharacterization lab 10
23.6. 14:25 - 14:55 Safety excursion - Structural Analysis 10