Tuesday 24.3.2026
CEITEC Nano Research Infrastructure http://nano.ceitec.cz/
0:00 1:00 2:00 3:00 4:00 5:00 6:00 7:00 8:00 9:00 10:00 11:00 12:00 13:00 14:00 15:00 16:00 17:00 18:00 19:00 20:00 21:00 22:00 23:00
WITEC-RAMAN
MIRA-STAN
LEICACOAT-STAN
RIGAKU3
KRATOS-XPS
MIRA-EBL
UHV-SPM
UHV-DEPOSITION
EVAPORATOR
ICON-SPM
VERIOS
RIE-FLUORINE
UHV-LEEM
TITAN
UHV-XPS
HELIOS
UHV-PREPARATION
ALD-BENEQ
LEICACOAT-NANO
UHV-PLD
AMBER
PARYLENE-DIENER
CHEMLAB-B1.18
KAUFMAN
R2-PECVD
CRYOGENIC
LVEM
WOOLLAM-RC2
DEKTAK
DIENER
NANOSAM
WOOLLAM-VIS
LITESCOPE-MIRA…
TEGRAMIN
BET-DEGASSER
L450
RAITH
RIGAKU9
VERSALAB
TUBE-FURNACE
VUVAS
nano-CT
VISCOMETER
RSA
VACUUM_OVEN-B1…
SNOM-NANONICS
MINIFLEX
PARYLENE-SCS
SIMS
SEE-SYSTEM
LaserMIRA
SUMMIT
nanoCT
UHV…
RIE-CHLORINE
SPINCOATER…
TEM-SW
PECVD
ZETASIZER
MIRKA
SAW-ACCUTOM
ZWICK
Q-LAB
VACUUM_OVEN-B1…
RTP
ACCURION_RSE
microCT
SUSS-RCD8
XEF2
WIRE-BONDER
SHAKER-B1.18
NANOCALC
CITOVAC
DWL
TGA96
THEORY-SUPPORT
Heliscan
TGA-DISCOVERY
UHV-MBE2
UHV-MBE1
UHV-FTIR
Test školení
US-CUTTER
UHV-LEIS
UHV-MBE
ULTRASONIC…
ULTRAFAST-LASER
UHV…
TEST-RFID2
TEST2
UHV-CLUSTER
FTIR-CHEMLAB
STEMI
FTIR
BET-ANAMET
SW-BEAMER
SW-LAB
SW-TRACER
LEICA-TXP
3D-PRUSA-ORANGE
TENUPOL
FISCHIONE-160
VACUUM_OVEN-C1…
JAZ3-CHANNEL
Test Ondra 3
JASCO
Test O2
3D-PRUSA-XL
MONOWAVE
3D-PRUSA-BLACK
4-POINT
DIMPLING…
DRYING_OVEN-B1…
SPONGEBOB
LECTROPOL
ELECTROWORKSHOP
R4…
FLOWBOX
LYRA
FTIRMAG
DRIE
FUMEHOOD…
FUMEHOOD-HF
FUMEHOOD…
FUMEHOOD…
FUMEHOOD…
FUMEHOOD…
FUMEHOOD…
CLARUS-680
DHR
SW-CT
micro-CT-L240
BRILLOUIN
GLOVEBOX…
APCVD-Diffusion
ARES
APCVD
NANOWIZARD
ALD-FIJI
DISCO-DICING…
BAMBULAB
TORNADO-M4
CRYOMILL
MECHANICAL…
CEITEC-NANO
CLR-ISO8-Lab…
SW-COMSOL
LEXT
MINIEVAP
CPD
TIC3X
Micromex
micro-CT-m300
3D-PRUSA-BLUE
ML3-BABY
LAKESHORE
PROTOMAT
KERR-MICROSCOPE
HENRY-MAGNET
MAGNETRON
SUSS-MA8
LABOTOM5
WOOLLAM-MIR
DSC-DISCOVERY
LPCVD-polySi
MPS150
CITOPRESS
NANOSCAN
NIKON-NANO
NIRQUEST512
NMR
ZEISS-NANO
ULTRACENTRIFUGE
LPCVD-SiN
SUSS-WETBENCH
DAWN-HELEOS
SCIA
VNA-MPI
PECVD-NANOFAB
FRASCAN
NANOINDENTER
CHEMLAB-B1.14
CHEMLAB-B1.16
IS_NOVOCONTROL
ZEISS-STAN
FISCHIONE-TEM…
LITESCOPE-LYRA
IR-RAMAN
K70
KEITHLEY-4200
LASER-DICER
LAURELL-NANO
LIBS-FireFly
LIBS-Discovery
LIBS-LabSys1
UV-LASER
paiva de araujo, Estacio
Supalová, Linda
Vymazal, Jan
Iakoubovskii, Konstantin
Havlíková, Tereza
Vijithra, Vijithra
Kramář, Jan
Holas, Jiří
Havlíková, Tereza
Pišťák, Jan
Thelappurath, Aiswarya Vijayakumar
Valadi Palliyalil, Anjali
de Oliveira Santiago, Pedro Henrique
Fatima, Areej
Fu, Jialin
Beliančínová, Beáta
Štálnik, Jozef
Bajo, Viktor
Liška, Jiří
Hrůza, Dominik
Hrůza, Dominik
Hrůza, Dominik
Hrůza, Dominik
Bokaei Khelejan, Hatef
Bajo, Viktor
Janůšová, Martina
T Gablech, Evelína
T Kicmerova, Dina
Pišťák, Jan
Bajwa, Laiba Asad
Krčma, Jakub
Molnár, Tomáš
Hrůza, Dominik
Michalička, Jan
Tichý, Martin
Hrůza, Dominik
Hrůza, Dominik
Bahadur, Fateh
Man, Ondřej
Molnár, Tomáš
Hrůza, Dominik
T Eliáš, Marek
Eliáš, Marek
B Švarc, Vojtěch
S Danchuk, Viktor
T Iakoubovskii, Konstantin
Bajwa, Laiba Asad
Tvrdoňová, Anna
Holobrádek, Jakub
Bolouki, Nima
Lukiienko, Iryna
S Kolíbalová, Eva
T Franta, Daniel
Holobrádek, Jakub
Bokaei Khelejan, Hatef
Danchuk, Viktor
Franta, Daniel
Kramář, Jan
Skálová, Zdenka
Tmejová, Kateřina
Slovák, Vojtěch
Lišková, Zuzana
Varshney, Devanshu
Arregi Uribeetxebarria, Jon Ander
Kepič, Peter

Upcoming trainings

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Term Name Description Max. attendees
24.3. 09:00 - 17:30 Amber Meeting point at the microscope. Attendees: Adam Očkovič 4
24.3. 09:00 - 13:00 Verios_basic (1/2) Verios_basic (1/2): training for new users, demonstration part. Meeting point: entrance to StAn CLR labs (bldg. A, 1st floor). Bring your cleanroom stationery set if you have one. Register one slot for the Verios_basic (2/2) hands-on session to complete the training curriculum. Attendees: Jan Klíma, Radim Slovák, Hasan Ali, Tomáš Janoušek 3
24.3. 09:30 - 12:00 ALD-Beneq-training Attendees: Jozef Štálnik, Derenik Petrosyan, Heriknaz Asatryan 3
24.3. 12:15 - 12:50 Safety excursion Chem lab The Moodle course, Advanced Chemical Laboratory is MANDATORY for the Safety Excursion. https://cfmoodle.ceitec.vutbr.cz/course/index.php?categoryid=48. It must be finished 2 work days before the excursion. Attendees: Areej Fatima, Šimon Formánek, Rasul Valiyev, David Jonathan Walcher 5
24.3. 13:00 - 13:50 Safety excursion - Nanofabrication lab Please enroll in this training only in parallel with the "Nanofab interview." Do not enroll in training ahead of time, but when you are sure you will be using nanofabrication techniques. It is possible to pass this training anytime during your access additionally (it takes place at least once a month). Attendees: Šimon Formánek, David Jonathan Walcher 5
24.3. 13:55 - 14:20 Safety excursion - Nanocharacterization lab Attendees: Petr Pazourek, Rasul Valiyev, David Jonathan Walcher 10
24.3. 14:25 - 14:55 Safety excursion - StAn lab Attendees: Petr Pazourek, Ondrej Kubinec, Šimon Formánek, David Jonathan Walcher 10
24.3. 15:00 - 17:00 Woollam RC2 Second part of training Attendees: Beáta Kavcová 1
25.3. 09:00 - 10:30 Verios_basic (2/2) Verios_basic (2/2): hands-on session. Bring your real sample(s) with you. Attendees: Tomáš Janoušek 1
25.3. 10:30 - 12:00 Verios_basic (2/2) Verios_basic (2/2): hands-on session. Bring your real sample(s) with you. Attendees: Radim Slovák 1
25.3. 12:30 - 14:00 Verios_basic (2/2) Verios_basic (2/2): hands-on session. Bring your real sample(s) with you. Attendees: Jan Klíma 1
27.3. 09:00 - 13:00 KRATOS-XPS Basic training (session 1/2) - max 2 attendees. In case of interest for the training (when it is full) write to josef.polcak@ceitec.vutbr.cz. Attendees: Grigory Mathew, Sujan Maity 2
27.3. 09:30 - 16:30 MIRA-STAN 1/2 Meeting point at the microscope. This is a two-step training, register for part 2 in our booking system. Obligatory prerequisites must be completed 2 days before the training. More information about the training is available on our <a href=”https://cfmoodle.ceitec.vutbr.cz/course/view.php?id=76”>Moodle</a>. Attendees: Carolina Oliver Urrutia, Ondrej Kubinec 4
27.3. 10:00 - 12:00 Witec-Raman in front of user office Attendees: Lucie Žaloudková, Saurabh Pathak 4
16.4. 09:30 - 11:30 MIRA-STAN - EDS detector Only for users with an active MIRA-STAN certificate. Meeting point at the microscope. Attendees: Aida Fazlič 4