Thursday 2.7.2026
CEITEC Nano Research Infrastructure http://nano.ceitec.cz/
0:00 1:00 2:00 3:00 4:00 5:00 6:00 7:00 8:00 9:00 10:00 11:00 12:00 13:00 14:00 15:00 16:00 17:00 18:00 19:00 20:00 21:00 22:00 23:00
SUSS-WETBENCH
ML3-BABY
RIE-FLUORINE
TITAN
CHEMLAB-B1.14
MIRA-STAN
WITEC-RAMAN
FTIR-CHEMLAB
KRATOS-XPS
DWL
VACUUM-OVEN-B1…
LEICACOAT-NANO
RAITH
BET-ANAMET
EVAPORATOR
RIGAKU3
GLOVEBOX…
UHV-XPS
NIKON-NANO
MIRA-EBL
CLARUS-680
FUMEHOOD…
FUMEHOOD…
micro-CT-L240
micro-CT-m300
UHV-DEPOSITION
PECVD
VERIOS
TGA-DISCOVERY
DIENER
CHEMLAB-B1.18
SCIA
AMBER
KEITHLEY-4200
FUMEHOOD…
LAURELL-NANO
LITESCOPE-MIRA…
WOOLLAM-VIS
SUSS-RCD8
LAKESHORE
SIMS
PARYLENE-SCS
WOOLLAM-RC2
FUMEHOOD…
TEGRAMIN
LEICACOAT-STAN
RIGAKU9
UHV-LEEM
FTIR
LYRA
HELIOS
R4…
BET-DEGASSER
MPS150
ALD-FIJI
UHV-PREPARATION
ICON-SPM
WIRE-BONDER
L450
SHAKER-B1.18
SEE-SYSTEM
LaserMIRA
SUMMIT
VISCOMETER
VUVAS
NANOCALC
SNOM-NANONICS
UHV-FTIR
RSA
nano-CT
VACUUM-OVEN-B1…
MINIFLEX
RIE-CHLORINE
XEF2
microCT
ZWICK
ZETASIZER
ACCURION_RSE
RTP
Q-LAB
SPINCOATER…
SAW-ACCUTOM
nanoCT
SW-LAB
CITOVAC
ULTRAFAST-LASER
UHV-LEIS
UHV-MBE
UHV-MBE2
UHV-MBE1
UHV-PLD
UHV-SPM
UHV-CLUSTER
Heliscan
UHV…
THEORY-SUPPORT
UHV…
TGA96
TEST-RFID4
TEST-RFID2
STEMI
ULTRASONIC…
Test školení
US-CUTTER
TEST2
Test O2
JASCO
Test Ondra 3
JAZ3-CHANNEL
FISCHIONE-160
TENUPOL
VACUUM_OVEN-C1…
LEICA-TXP
SW-TRACER
SW-BEAMER
MIRKA
NANO-ONE-2PP
TEM-SW
ELECTROWORKSHOP
SW-CT
DRIE
DHR
DIMPLING…
DRYING-OVEN-B1…
SPONGEBOB
LECTROPOL
FLOWBOX
VERSALAB
4-POINT
FTIRMAG
FUMEHOOD…
FUMEHOOD-HF
FUMEHOOD…
FUMEHOOD…
FUMEHOOD…
Micromex
CRYOMILL
TIC3X
VNA-MPI
BAMBULAB
ALD-BENEQ
APCVD-Diffusion
ARES
MAGNETRON-AJA
APCVD
NANOWIZARD
DISCO-DICING…
BRILLOUIN
CPD
TORNADO-M4
MECHANICAL…
CEITEC-NANO
TUBE-FURNACE
CLR-ISO8-Lab…
SW-COMSOL
LEXT
MINIEVAP
DAWN-HELEOS
PECVD-NANOFAB
PARYLENE-DIENER
CITOPRESS
SUSS-MA8
DEKTAK
LABOTOM5
WOOLLAM-MIR
3D-PRUSA-XL
DSC-DISCOVERY
MONOWAVE
NANOSCAN
HENRY-MAGNET
NANOSAM
NIRQUEST512
NMR
ZEISS-NANO
ULTRACENTRIFUGE
3D-PRUSA-BLUE
3D-PRUSA-BLACK
3D-PRUSA-ORANGE
MAGNETRON
KERR-MICROSCOPE
FRASCAN
R2-PECVD
NANOINDENTER
CHEMLAB-B1.16
IS-NOVOCONTROL
ZEISS-STAN
FISCHIONE-TEM…
KAUFMAN
IR-RAMAN
K70
LASER-DICER
LVEM
LIBS-FireFly
LIBS-Discovery
LIBS-LabSys1
LITESCOPE-LYRA
LPCVD-polySi
LPCVD-SiN
CRYOGENIC
PROTOMAT
UV-LASER
Supalová, Linda
Bajwa, Laiba Asad
Povey, Rhys Geoffrey
Kunc, Jan
Jasenský, Kryštof
Pribytova, Ekaterina
Supalová, Linda
Supalová, Linda
Bajwa, Laiba Asad
Povey, Rhys Geoffrey
Kunc, Jan
Bajwa, Laiba Asad
Piastek, Jakub
Citterberg, Daniel
T Kolíbalová, Eva
S Michalička, Jan
S Michalička, Jan
Hu, Ying
Jewula, Pawel
Tmejová, Kateřina
Surana, Karan Singh
Říhová, Martina
Kramář, Jan
Mařák, Vojtěch
Supalová, Linda
Bakhshikhah, Mahan
Izsák, Dávid
Kalleshappa, Bindu
Hu, Ying
T Polčák, Josef
Valadi Palliyalil, Anjali
Janů, Lucie
Hrdý, Radim
Hrdý, Radim
Hu, Ying
U Tmejová, Kateřina
Velluvakandy, Roshan
Velluvakandy, Roshan
Kunc, Jan
Jasenský, Kryštof
Tantis, Iosif
AL Soud, Ammar
Kunc, Jan
Otýpka, Martin
Wirthová, Michaela
Bednaříková, Vendula
Saldan, Ivan
AL Soud, Ammar
D'Angelo, Elena
S Polčák, Josef
Jasenský, Kryštof
Jasenský, Kryštof
Kunc, Jan
Pradhan, Gyandeep
B Sanna, Michela
Sysel, Petr
Jewula, Pawel
Slovák, Vojtěch
Slovák, Vojtěch
Endstrasser, Zdeněk
Cuccu, Elisa
Košelová, Zuzana
Sanna, Carolina
Krútek, Šimon
Tmejová, Kateřina
Otýpka, Martin
S Iakoubovskii, Konstantin
E Citterberg, Daniel
Bajwa, Laiba Asad
Bajwa, Laiba Asad
Kramář, Jan
Franta, Daniel
Povey, Rhys Geoffrey
Holcman, Vladimír
Danchuk, Viktor
Bajwa, Laiba Asad
T Franta, Daniel
Bajwa, Laiba Asad
Skálová, Zdenka
Říhová, Martina
Varshney, Devanshu
Endstrasser, Zdeněk
Nebojsa, Alois
S Šamořil, Tomáš
Kicmerova, Dina
Janů, Lucie
Tantis, Iosif
E Citterberg, Daniel
Kunc, Jan
Endstrasser, Zdeněk

Upcoming trainings

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Term Name Description Max. attendees
2.7. 09:00 - 13:00 KRATOS-XPS Basic training (session 1/2) - max 2 attendees. In case of interest for the training (when it is full) write to josef.polcak@ceitec.vutbr.cz. Attendees: Nikol Kaděrová, Ying Hu, Debika Devi Thongam 2
2.7. 12:00 - 1.7. 14:00 Woollam RC2 The first part of the training Attendees: Elisa Cuccu 1
8.7. 09:00 - 11:30 BET training: Degassing (1/2) Degassing of the sample (1/2) Attendees: Amirmohsen Fanisaberi, Karan Singh Surana, Debika Devi Thongam 3
8.7. 10:00 - 12:00 Witec-Raman meeting in front of user office. Attendees: Navajsharif Shamshuddin Shaikh, Peter Fecko 4
8.7. 11:30 - 15:00 BET training: measurement (2/2) Standard measurement Attendees: Amirmohsen Fanisaberi, Karan Singh Surana, Debika Devi Thongam 2
20.7. 10:30 - 11:15 Nanofab interview - Meeting room C2.11 or C2.07 This interview is mandatory for enrollment to the Safety excursion - Nanofabrication lab. Join: [HERE](https://teams.microsoft.com/meet/35462004903561?p=GpHxeNZeulO7czefLV) Meeting ID: 354 620 049 035 61 Access code: 7AD77PX3 5
21.7. 09:30 - 12:30 FTIR-CHEMLAB Meeting point in Chemlab. Attendees: Petr Sysel, Debika Devi Thongam 3
21.7. 12:15 - 12:50 Safety excursion - Advanced Chemical lab 5
21.7. 13:00 - 13:50 Safety excursion - Nanofabrication lab Please enroll in this training only in parallel with the "Nanofab interview." Do not enroll in training ahead of time, but when you are sure you will be using nanofabrication techniques. It is possible to pass this training anytime during your access additionally (it takes place at least once a month). 5
21.7. 13:55 - 14:20 Safety excursion - Nanocharacterization lab Attendees: Laura Búšová 10
21.7. 14:25 - 14:55 Safety excursion - Structural Analysis 10
22.7. 09:00 - 10:30 JASCO training- CZ Description of holders and software, basic measurement Attendees: Marie Jakešová, Anna Tvrdoňová, Šimon Krútek 3
22.7. 09:30 - 16:30 MIRA-STAN 1/2 Meeting point at the microscope. This is a two-step training, register for part 2 in our booking system. Obligatory prerequisites must be completed 2 days before the training. More information about the training is available on our <a href=”https://cfmoodle.ceitec.vutbr.cz/course/view.php?id=76”>Moodle</a>. Attendees: Sharmistha Dey, Debika Devi Thongam 4
22.7. 10:30 - 12:00 JASCO training - EN Description of holders and software, basic measurement Attendees: Laiba Asad Bajwa, Rosmi Vinson 2
23.7. 09:00 - 13:00 Verios_basic (1/2) Verios_basic (1/2): training for new users, demonstration part. Meeting point: entrance to StAn CLR labs (bldg. A, 1st floor). Bring your cleanroom stationery set if you have one. Register one slot for the Verios_basic (2/2) hands-on session to complete the training curriculum. Attendees: Navajsharif Shamshuddin Shaikh, Ondrej Kubinec, Debika Devi Thongam 3
24.7. 09:00 - 10:30 Verios_basic (2/2) Verios_basic (2/2): hands-on session. Bring your real sample(s) with you. 1
24.7. 10:30 - 12:00 Verios_basic (2/2) Verios_basic (2/2): hands-on session. Bring your real sample(s) with you. Attendees: Debika Devi Thongam 1
24.7. 12:30 - 14:00 Verios_basic (2/2) Verios_basic (2/2): hands-on session. Bring your real sample(s) with you. Attendees: Ondrej Kubinec 1
27.7. 09:30 - 13:30 ZWICK Meeting point is in front of the Advanced Chemical laboratory. Obligatory prerequisites 1. Pass the Chemical laboratory safety excursion in Moodle (https://cfmoodle.ceitec.vutbr.cz/course/view.php?id=173): 2. Answer the ZWICK applicant questionnaire 3. Read the ZWICK rules (mark the activity as complete with ✔️) 4. Bring your own sample Recommended prerequisites 5. Get familiar with the Layout for ZWICK basic training (mark the activity as complete with ✔️) Attendees: Rasul Valiyev 2
29.7. 09:30 - 13:00 MIRA-STAN 2/2 Meeting point at the microscope. This is a two-step training, register for part 1 in our booking system. More information about the training is available on our <a href=”https://cfmoodle.ceitec.vutbr.cz/course/view.php?id=76”>Moodle</a>. Attendees: Debika Devi Thongam 2
4.8. 09:00 - 12:00 Verios/Helios_EDS Practical demonstration of EDS analytical system at Verios and Helios. Attendees: Debika Devi Thongam, Kateřina Polášková 3
18.8. 09:00 - 13:00 Verios_basic (1/2) Verios_basic (1/2): training for new users, demonstration part. Meeting point: entrance to StAn CLR labs (bldg. A, 1st floor). Bring your cleanroom stationery set if you have one. Register one slot for the Verios_basic (2/2) hands-on session to complete the training curriculum. Attendees: Šimon Formánek 3
19.8. 09:00 - 10:30 Verios_basic (2/2) Verios_basic (2/2): hands-on session. Bring your real sample(s) with you. 1
19.8. 10:30 - 12:00 Verios_basic (2/2) Verios_basic (2/2): hands-on session. Bring your real sample(s) with you. 1
19.8. 12:30 - 14:00 Verios_basic (2/2) Verios_basic (2/2): hands-on session. Bring your real sample(s) with you. 1