Friday 27.3.2026
CEITEC Nano Research Infrastructure http://nano.ceitec.cz/
0:00 1:00 2:00 3:00 4:00 5:00 6:00 7:00 8:00 9:00 10:00 11:00 12:00 13:00 14:00 15:00 16:00 17:00 18:00 19:00 20:00 21:00 22:00 23:00
WITEC-RAMAN
VERIOS
LYRA
RIE-FLUORINE
CRYOGENIC
EVAPORATOR
VERSALAB
FTIR-CHEMLAB
ML3-BABY
MIRA-EBL
RIGAKU9
MIRA-STAN
AMBER
DRIE
UHV-DEPOSITION
SUSS-WETBENCH
UHV-LEEM
TGA-DISCOVERY
HELIOS
UHV-XPS
UHV-PLD
UHV-SPM
ICON-SPM
BET-ANAMET
UHV-PREPARATION
LVEM
LIBS-FireFly
TITAN
R2-PECVD
BRILLOUIN
NANOSAM
DSC-DISCOVERY
TUBE-FURNACE
LEICACOAT-STAN
RIGAKU3
FUMEHOOD…
KRATOS-XPS
WOOLLAM-RC2
SEE-SYSTEM
SUMMIT
LaserMIRA
NANOCALC
SHAKER-B1.18
SNOM-NANONICS
PARYLENE-SCS
SIMS
3D-PRUSA-XL
RSA
Q-LAB
PARYLENE-DIENER
TEM-SW
PECVD
MIRKA
SAW-ACCUTOM
SPINCOATER…
RTP
nano-CT
ACCURION_RSE
SUSS-RCD8
DIENER
RIE-CHLORINE
MINIFLEX
nanoCT
STEMI
Test školení
SW-BEAMER
VACUUM_OVEN-B1…
US-CUTTER
DWL
JASCO
JAZ3-CHANNEL
VACUUM_OVEN-C1…
FTIR
CITOVAC
VACUUM_OVEN-B1…
ULTRAFAST-LASER
VUVAS
VISCOMETER
L450
WIRE-BONDER
XEF2
microCT
ZWICK
ZETASIZER
ULTRASONIC…
UHV…
SW-LAB
TEST-RFID2
SW-TRACER
LEICA-TXP
TENUPOL
FISCHIONE-160
Test Ondra 3
Test O2
TEST2
3D-PRUSA-BLACK
TGA96
UHV…
THEORY-SUPPORT
Heliscan
UHV-MBE2
UHV-MBE1
UHV-FTIR
UHV-LEIS
UHV-MBE
UHV-CLUSTER
3D-PRUSA-ORANGE
MONOWAVE
3D-PRUSA-BLUE
4-POINT
DIMPLING…
DRYING_OVEN-B1…
RAITH
SPONGEBOB
LECTROPOL
ELECTROWORKSHOP
R4…
FLOWBOX
FTIRMAG
SW-CT
FUMEHOOD…
FUMEHOOD-HF
FUMEHOOD…
FUMEHOOD…
FUMEHOOD…
FUMEHOOD…
CLARUS-680
Micromex
DHR
CRYOMILL
micro-CT-m300
BAMBULAB
GLOVEBOX…
ALD-BENEQ
APCVD-Diffusion
ARES
APCVD
NANOWIZARD
ALD-FIJI
DISCO-DICING…
BET-DEGASSER
TIC3X
TORNADO-M4
MECHANICAL…
CEITEC-NANO
CLR-ISO8-Lab…
SW-COMSOL
LEXT
MINIEVAP
CPD
micro-CT-L240
DAWN-HELEOS
ULTRACENTRIFUGE
LABOTOM5
LPCVD-SiN
LAKESHORE
PROTOMAT
KERR-MICROSCOPE
HENRY-MAGNET
MAGNETRON
SUSS-MA8
DEKTAK
WOOLLAM-MIR
LITESCOPE-MIRA…
MPS150
CITOPRESS
NANOSCAN
NIKON-NANO
NIRQUEST512
WOOLLAM-VIS
NMR
ZEISS-NANO
LPCVD-polySi
LITESCOPE-LYRA
TEGRAMIN
IS_NOVOCONTROL
VNA-MPI
PECVD-NANOFAB
LEICACOAT-NANO
FRASCAN
NANOINDENTER
CHEMLAB-B1.14
CHEMLAB-B1.16
CHEMLAB-B1.18
ZEISS-STAN
LIBS-LabSys1
SCIA
FISCHIONE-TEM…
KAUFMAN
IR-RAMAN
K70
KEITHLEY-4200
LASER-DICER
LAURELL-NANO
LIBS-Discovery
UV-LASER
T Spotz, Zdeněk
T Spotz, Zdeněk
Janoušek, Tomáš
paiva de araujo, Estacio
Iakoubovskii, Konstantin
Pathak, Saurabh
Pišťák, Jan
Koňařík, Lukáš
Staňo, Michal
Krajíčková, Kateřina
T Šamořil, Tomáš
Lukiienko, Iryna
Supalová, Linda
Koňařík, Lukáš
Slavíček, Radek
Danchuk, Viktor
Lukiienko, Iryna
Lukiienko, Iryna
Daradkeh, Samer
Daradkeh, Samer
Thekkedath Madhu, Nikhil
Valadi Palliyalil, Anjali
Supalová, Linda
Petrosyan, Derenik
Jasenský, Kryštof
Lukiienko, Iryna
Slavíček, Radek
Arregi Uribeetxebarria, Jon Ander
T Lepcio, Petr
Rotter, Marek
Kratochvílová, Ivana
Eliáš, Marek
Soldán, Marek
Supalová, Linda
Soldán, Marek
Sevriugina, Veronika
Kolíbalová, Eva
Hrůza, Dominik
Slavíček, Radek
Soldán, Marek
Slavíček, Radek
Tmejová, Kateřina
Soldán, Marek
S Kolíbalová, Eva
Zikmundová, Eva
T Michalička, Jan
Bolouki, Nima
Krčma, Jakub
U Danchuk, Viktor
Sevriugina, Veronika
Kepič, Peter
Rotter, Marek
Žaloudková, Lucie
U Jewula, Pawel
B Polčák, Josef
Arregi Uribeetxebarria, Jon Ander

Upcoming trainings

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Term Name Description Max. attendees
27.3. 09:30 - 16:30 MIRA-STAN 1/2 Meeting point at the microscope. This is a two-step training, register for part 2 in our booking system. Obligatory prerequisites must be completed 2 days before the training. More information about the training is available on our <a href=”https://cfmoodle.ceitec.vutbr.cz/course/view.php?id=76”>Moodle</a>. Attendees: Carolina Oliver Urrutia, Ondrej Kubinec 4
27.3. 10:00 - 12:00 Witec-Raman in front of user office Attendees: Helena Šimůnková 4
31.3. 09:00 - 13:00 KRATOS-XPS Basic training (session 1/2) - max 2 attendees. In case of interest for the training (when it is full) write to josef.polcak@ceitec.vutbr.cz. Attendees: Sujan Maity 2
1.4. 09:00 - 11:00 SEE SYSTEM training WCA + SFE measurement training Attendees: Rasul Valiyev 1
1.4. 09:30 - 12:00 Tornado-M4 in front of entrance to STAN Attendees: Radek Slavíček 4
9.4. 09:00 - 12:00 Verios/Helios_EDS Practical demonstration of EDS analytical system at Verios and Helios. Attendees: Tomáš Janoušek 3
16.4. 09:30 - 11:30 MIRA-STAN - EDS detector Only for users with an active MIRA-STAN certificate. Meeting point at the microscope. Attendees: Aida Fazlič 4