Wednesday 1.7.2026
CEITEC Nano Research Infrastructure http://nano.ceitec.cz/
0:00 1:00 2:00 3:00 4:00 5:00 6:00 7:00 8:00 9:00 10:00 11:00 12:00 13:00 14:00 15:00 16:00 17:00 18:00 19:00 20:00 21:00 22:00 23:00
SUSS-WETBENCH
RIE-FLUORINE
ML3-BABY
KRATOS-XPS
WITEC-RAMAN
CHEMLAB-B1.14
TITAN
VERIOS
EVAPORATOR
VACUUM-OVEN-B1…
MIRA-STAN
PARYLENE-SCS
DIENER
RIGAKU3
NANO-ONE-2PP
BET-DEGASSER
TORNADO-M4
MIRA-EBL
TEGRAMIN
SCIA
R2-PECVD
LITESCOPE-MIRA…
LAKESHORE
LVEM
MAGNETRON
WOOLLAM-RC2
SUSS-MA8
ULTRACENTRIFUGE
TEM-SW
SAW-ACCUTOM
SUSS-RCD8
ICON-SPM
FUMEHOOD…
VACUUM_OVEN-C1…
MPS150
RIGAKU9
GLOVEBOX…
WIRE-BONDER
VACUUM-OVEN-B1…
FTIR-CHEMLAB
DWL
BET-ANAMET
ULTRAFAST-LASER
UHV-PREPARATION
UHV-PLD
UHV-XPS
UHV-LEEM
UHV-DEPOSITION
CLARUS-680
WOOLLAM-VIS
FUMEHOOD…
LYRA
LEICACOAT-STAN
CPD
RAITH
BRILLOUIN
R4…
HELIOS
UV-LASER
VNA-MPI
LEICA-TXP
UHV-MBE1
TGA-DISCOVERY
Heliscan
THEORY-SUPPORT
TGA96
TEST-RFID4
TEST-RFID2
Test školení
TEST2
Test O2
Test Ondra 3
AMBER
FISCHIONE-160
TENUPOL
SW-TRACER
DHR
LaserMIRA
Micromex
SNOM-NANONICS
DRYING-OVEN-B1…
ARES
SIMS
SEE-SYSTEM
SUMMIT
SW-LAB
SHAKER-B1.18
APCVD-Diffusion
NANOCALC
STEMI
DIMPLING…
SW-BEAMER
UHV-MBE2
UHV-FTIR
nano-CT
FUMEHOOD…
CITOVAC
SW-COMSOL
ALD-BENEQ
VUVAS
VISCOMETER
L450
CLR-ISO8-Lab…
LEXT
XEF2
TUBE-FURNACE
CEITEC-NANO
microCT
ZWICK
ZETASIZER
FTIR
MINIEVAP
DRIE
UHV…
UHV-LEIS
UHV-MBE
SW-CT
CRYOMILL
UHV-SPM
UHV-CLUSTER
UHV…
JAZ3-CHANNEL
VERSALAB
TIC3X
ULTRASONIC…
US-CUTTER
FUMEHOOD…
JASCO
RSA
nanoCT
FUMEHOOD…
ALD-FIJI
LAURELL-NANO
LIBS-FireFly
LIBS-Discovery
LIBS-LabSys1
LITESCOPE-LYRA
FTIRMAG
LPCVD-polySi
FUMEHOOD…
LPCVD-SiN
4-POINT
CRYOGENIC
PROTOMAT
FUMEHOOD…
KERR-MICROSCOPE
LASER-DICER
KEITHLEY-4200
DAWN-HELEOS
CHEMLAB-B1.16
PECVD-NANOFAB
LEICACOAT-NANO
FRASCAN
BAMBULAB
NANOINDENTER
DISCO-DICING…
CHEMLAB-B1.18
K70
IS-NOVOCONTROL
ZEISS-STAN
FUMEHOOD-HF
FISCHIONE-TEM…
KAUFMAN
IR-RAMAN
HENRY-MAGNET
FLOWBOX
MINIFLEX
Q-LAB
PARYLENE-DIENER
micro-CT-L240
PECVD
MIRKA
LECTROPOL
SPINCOATER…
RTP
3D-PRUSA-BLACK
ACCURION_RSE
NANOWIZARD
FUMEHOOD…
APCVD
MAGNETRON-AJA
RIE-CHLORINE
3D-PRUSA-ORANGE
3D-PRUSA-BLUE
micro-CT-m300
CITOPRESS
DEKTAK
LABOTOM5
WOOLLAM-MIR
3D-PRUSA-XL
DSC-DISCOVERY
MONOWAVE
NANOSCAN
ELECTROWORKSHOP
NANOSAM
NIKON-NANO
NIRQUEST512
MECHANICAL…
NMR
ZEISS-NANO
SPONGEBOB
Supalová, Linda
Bajwa, Laiba Asad
Otýpka, Martin
Pradhan, Gyandeep
Kunc, Jan
Pradhan, Gyandeep
Jasenský, Kryštof
U Hrdý, Radim
Supalová, Linda
Bajwa, Laiba Asad
Bajwa, Laiba Asad
Kratochvílová, Ivana
Pradhan, Gyandeep
Pradhan, Gyandeep
Pradhan, Gyandeep
Supalová, Linda
Talíř, Marek
Otýpka, Martin
Tantis, Iosif
Pavliňák, David
Janů, Lucie
Pazourek, Petr
Konečný, Martin
Šťastný, Jakub
Hu, Ying
Jewula, Pawel
Hu, Ying
Michalička, Jan
S Michalička, Jan
U Michalička, Jan
Horák, Michal
Foltýn, Michael
Kicmerova, Dina
Supalová, Linda
Pradhan, Gyandeep
Hu, Ying
Hu, Ying
Jelínek, Eduard
Hu, Ying
Fecko, Peter
Bajwa, Laiba Asad
Krútek, Šimon
Jakešová, Marie
Valadi Palliyalil, Anjali
Pišťák, Jan
Sanna, Michela
Fecko, Peter
AL Soud, Ammar
Tantis, Iosif
Daradkeh, Samer
Kunc, Jan
Skálová, Zdenka
Otýpka, Martin
Bolouki, Nima
Jelínek, Eduard
Holcman, Vladimír
Surana, Karan Singh
Talíř, Marek
Eliáš, Marek
Bajwa, Laiba Asad
Pavliňák, David
Ali, Hasan
Skálová, Zdenka
U Hrdý, Radim
Talíř, Marek
Sysel, Petr
Dey, Sharmistha
Fecko, Peter
Varshney, Devanshu
Saldan, Ivan
Fecko, Peter
Fu, Hongbo
Hu, Ying
Hrdý, Radim
AL Soud, Ammar
Jasenský, Kryštof
Endstrasser, Zdeněk
T Danchuk, Viktor
D'Angelo, Elena
Endstrasser, Zdeněk
Endstrasser, Zdeněk
B Sanna, Michela
Franta, Daniel
Jewula, Pawel
S Šamořil, Tomáš
Fu, Hongbo
Fecko, Peter
Pradhan, Gyandeep
Krčma, Jakub
Janůšová, Martina
Kolíbalová, Eva
Spusta, Tomáš

Upcoming trainings

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Term Name Description Max. attendees
1.7. 10:00 - 18:01 UHV-PLD UHV-PLD Part 2 Attendees: Sharmistha Dey 1
2.7. 09:00 - 13:00 KRATOS-XPS Basic training (session 1/2) - max 2 attendees. In case of interest for the training (when it is full) write to josef.polcak@ceitec.vutbr.cz. Attendees: Nikol Kaděrová, Ying Hu, Debika Devi Thongam 2
8.7. 09:00 - 11:30 BET training: Degassing (1/2) Degassing of the sample (1/2) Attendees: Karan Singh Surana, Debika Devi Thongam 3
8.7. 10:00 - 12:00 Witec-Raman meeting in front of user office. Attendees: Navajsharif Shamshuddin Shaikh, Peter Fecko 4
8.7. 11:30 - 15:00 BET training: measurement (2/2) Standard measurement Attendees: Karan Singh Surana, Debika Devi Thongam 2
20.7. 10:30 - 11:15 Nanofab interview - Meeting room C2.11 or C2.07 This interview is mandatory for enrollment to the Safety excursion - Nanofabrication lab. Join: [HERE](https://teams.microsoft.com/meet/35462004903561?p=GpHxeNZeulO7czefLV) Meeting ID: 354 620 049 035 61 Access code: 7AD77PX3 5
21.7. 09:30 - 12:30 FTIR-CHEMLAB Meeting point in Chemlab. Attendees: Petr Sysel, Debika Devi Thongam 3
21.7. 12:15 - 12:50 Safety excursion - Advanced Chemical lab 5
21.7. 13:00 - 13:50 Safety excursion - Nanofabrication lab Please enroll in this training only in parallel with the "Nanofab interview." Do not enroll in training ahead of time, but when you are sure you will be using nanofabrication techniques. It is possible to pass this training anytime during your access additionally (it takes place at least once a month). 5
21.7. 13:55 - 14:20 Safety excursion - Nanocharacterization lab Attendees: Laura Búšová 10
21.7. 14:25 - 14:55 Safety excursion - Structural Analysis 10
22.7. 09:00 - 10:30 JASCO training- CZ Description of holders and software, basic measurement Attendees: Marie Jakešová, Anna Tvrdoňová, Šimon Krútek 3
22.7. 09:30 - 16:30 MIRA-STAN 1/2 Meeting point at the microscope. This is a two-step training, register for part 2 in our booking system. Obligatory prerequisites must be completed 2 days before the training. More information about the training is available on our <a href=”https://cfmoodle.ceitec.vutbr.cz/course/view.php?id=76”>Moodle</a>. Attendees: Sharmistha Dey, Debika Devi Thongam 4
22.7. 10:30 - 12:00 JASCO training - EN Description of holders and software, basic measurement Attendees: Laiba Asad Bajwa, Rosmi Vinson 2
23.7. 09:00 - 13:00 Verios_basic (1/2) Verios_basic (1/2): training for new users, demonstration part. Meeting point: entrance to StAn CLR labs (bldg. A, 1st floor). Bring your cleanroom stationery set if you have one. Register one slot for the Verios_basic (2/2) hands-on session to complete the training curriculum. Attendees: Navajsharif Shamshuddin Shaikh, Ondrej Kubinec, Debika Devi Thongam 3
24.7. 09:00 - 10:30 Verios_basic (2/2) Verios_basic (2/2): hands-on session. Bring your real sample(s) with you. 1
24.7. 10:30 - 12:00 Verios_basic (2/2) Verios_basic (2/2): hands-on session. Bring your real sample(s) with you. Attendees: Debika Devi Thongam 1
24.7. 12:30 - 14:00 Verios_basic (2/2) Verios_basic (2/2): hands-on session. Bring your real sample(s) with you. Attendees: Ondrej Kubinec 1
27.7. 09:30 - 13:30 ZWICK Meeting point is in front of the Advanced Chemical laboratory. Obligatory prerequisites 1. Pass the Chemical laboratory safety excursion in Moodle (https://cfmoodle.ceitec.vutbr.cz/course/view.php?id=173): 2. Answer the ZWICK applicant questionnaire 3. Read the ZWICK rules (mark the activity as complete with ✔️) 4. Bring your own sample Recommended prerequisites 5. Get familiar with the Layout for ZWICK basic training (mark the activity as complete with ✔️) Attendees: Rasul Valiyev 2
29.7. 09:30 - 13:00 MIRA-STAN 2/2 Meeting point at the microscope. This is a two-step training, register for part 1 in our booking system. More information about the training is available on our <a href=”https://cfmoodle.ceitec.vutbr.cz/course/view.php?id=76”>Moodle</a>. Attendees: Debika Devi Thongam 2
4.8. 09:00 - 12:00 Verios/Helios_EDS Practical demonstration of EDS analytical system at Verios and Helios. Attendees: Debika Devi Thongam, Kateřina Polášková 3
18.8. 09:00 - 13:00 Verios_basic (1/2) Verios_basic (1/2): training for new users, demonstration part. Meeting point: entrance to StAn CLR labs (bldg. A, 1st floor). Bring your cleanroom stationery set if you have one. Register one slot for the Verios_basic (2/2) hands-on session to complete the training curriculum. Attendees: Šimon Formánek 3
19.8. 09:00 - 10:30 Verios_basic (2/2) Verios_basic (2/2): hands-on session. Bring your real sample(s) with you. 1
19.8. 10:30 - 12:00 Verios_basic (2/2) Verios_basic (2/2): hands-on session. Bring your real sample(s) with you. 1
19.8. 12:30 - 14:00 Verios_basic (2/2) Verios_basic (2/2): hands-on session. Bring your real sample(s) with you. 1