Wednesday 25.3.2026
CEITEC Nano Research Infrastructure http://nano.ceitec.cz/
0:00 1:00 2:00 3:00 4:00 5:00 6:00 7:00 8:00 9:00 10:00 11:00 12:00 13:00 14:00 15:00 16:00 17:00 18:00 19:00 20:00 21:00 22:00 23:00
RIE-FLUORINE
KRATOS-XPS
MIRA-STAN
WITEC-RAMAN
SUSS-WETBENCH
UHV-PREPARATION
EVAPORATOR
VERIOS
UHV-SPM
CHEMLAB-B1.16
ML3-BABY
CRYOGENIC
UHV-XPS
LYRA
ICON-SPM
UHV-LEEM
MIRA-EBL
UHV-DEPOSITION
UHV-PLD
HELIOS
BET-ANAMET
LVEM
KERR-MICROSCOPE
LITESCOPE-MIRA…
VERSALAB
RIGAKU9
TGA-DISCOVERY
SCIA
ALD-BENEQ
VACUUM_OVEN-C1…
RIGAKU3
R2-PECVD
LEICACOAT-STAN
NMR
TUBE-FURNACE
NANOSAM
BET-DEGASSER
TITAN
STEMI
SNOM-NANONICS
SHAKER-B1.18
NANOCALC
SEE-SYSTEM
SUMMIT
PARYLENE-SCS
SIMS
LaserMIRA
3D-PRUSA-XL
RSA
nano-CT
MINIFLEX
RIE-CHLORINE
DIENER
SUSS-RCD8
ACCURION_RSE
RTP
Q-LAB
SPINCOATER…
SAW-ACCUTOM
MIRKA
PECVD
TEM-SW
PARYLENE-DIENER
nanoCT
Test O2
SW-BEAMER
VACUUM_OVEN-B1…
ULTRASONIC…
US-CUTTER
DWL
JASCO
JAZ3-CHANNEL
FTIR-CHEMLAB
FTIR
CITOVAC
VACUUM_OVEN-B1…
UHV…
VUVAS
VISCOMETER
L450
WIRE-BONDER
XEF2
microCT
ZWICK
ZETASIZER
ULTRAFAST-LASER
UHV…
SW-LAB
Test školení
SW-TRACER
LEICA-TXP
TENUPOL
FISCHIONE-160
AMBER
Test Ondra 3
3D-PRUSA-BLACK
TEST2
TEST-RFID2
UHV-CLUSTER
TGA96
THEORY-SUPPORT
Heliscan
UHV-MBE2
UHV-MBE1
UHV-FTIR
UHV-LEIS
UHV-MBE
3D-PRUSA-ORANGE
MONOWAVE
3D-PRUSA-BLUE
4-POINT
DIMPLING…
DRYING_OVEN-B1…
RAITH
SPONGEBOB
LECTROPOL
ELECTROWORKSHOP
R4…
FLOWBOX
FTIRMAG
DRIE
FUMEHOOD…
FUMEHOOD-HF
FUMEHOOD…
FUMEHOOD…
FUMEHOOD…
FUMEHOOD…
FUMEHOOD…
CLARUS-680
DHR
SW-CT
micro-CT-L240
BRILLOUIN
GLOVEBOX…
APCVD-Diffusion
ARES
APCVD
NANOWIZARD
ALD-FIJI
DISCO-DICING…
BAMBULAB
TORNADO-M4
CRYOMILL
MECHANICAL…
CEITEC-NANO
CLR-ISO8-Lab…
SW-COMSOL
LEXT
MINIEVAP
CPD
TIC3X
Micromex
micro-CT-m300
ULTRACENTRIFUGE
LABOTOM5
LPCVD-SiN
LAKESHORE
PROTOMAT
HENRY-MAGNET
MAGNETRON
WOOLLAM-RC2
SUSS-MA8
DEKTAK
WOOLLAM-MIR
LITESCOPE-LYRA
DSC-DISCOVERY
MPS150
CITOPRESS
NANOSCAN
NIKON-NANO
NIRQUEST512
WOOLLAM-VIS
ZEISS-NANO
LPCVD-polySi
LIBS-LabSys1
DAWN-HELEOS
IS_NOVOCONTROL
TEGRAMIN
VNA-MPI
PECVD-NANOFAB
LEICACOAT-NANO
FRASCAN
NANOINDENTER
CHEMLAB-B1.14
CHEMLAB-B1.18
ZEISS-STAN
LIBS-Discovery
FISCHIONE-TEM…
KAUFMAN
IR-RAMAN
K70
KEITHLEY-4200
LASER-DICER
LAURELL-NANO
LIBS-FireFly
UV-LASER
Kratochvílová, Ivana
Koňařík, Lukáš
Supalová, Linda
Supalová, Linda
Weisz, Hugo
Polčák, Josef
Pathak, Saurabh
Pavliňák, David
Beliančínová, Beáta
Supalová, Linda
Hájek, Jiří
Valášek, Daniel
Kovařík, Martin
Chamradová, Ivana
Janoušek, Tomáš
Havelka, Tomáš
Iakoubovskii, Konstantin
Koňařík, Lukáš
Supalová, Linda
Jasenský, Kryštof
Soldán, Marek
Molnár, Tomáš
Hrůza, Dominik
Pribytova, Ekaterina
Slovák, Radim
Otýpka, Martin
T Kicmerova, Dina
Koňařík, Lukáš
Krčma, Jakub
Hrůza, Dominik
Hrůza, Dominik
Hrůza, Dominik
Jewula, Pawel
Jewula, Pawel
Koňařík, Lukáš
Supalová, Linda
Slavíček, Radek
Lukiienko, Iryna
Hrůza, Dominik
Hrůza, Dominik
Štálnik, Jozef
Jelínek, Eduard
Janoušek, Tomáš
Šťastný, Jakub
Molnár, Tomáš
Hrůza, Dominik
Štálnik, Jozef
Weisz, Hugo
Hrůza, Dominik
Hrůza, Dominik
Kepič, Peter
Foltýn, Michael
Tmejová, Kateřina
S Kolíbalová, Eva
T Arregi Uribeetxebarria, Jon Ander
Kovařík, Martin
Arregi Uribeetxebarria, Jon Ander
Arregi Uribeetxebarria, Jon Ander
Sevriugina, Veronika
Štálnik, Jozef
Štálnik, Jozef
Slavíček, Radek
Ščasnovič, Erik
Beliančínová, Beáta
Natarajan, Senthil Nathan
Valadi Palliyalil, Anjali
Kepič, Peter
Danchuk, Viktor
Tmejová, Kateřina
Kolíbalová, Eva

Upcoming trainings

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Term Name Description Max. attendees
25.3. 09:00 - 10:30 Verios_basic (2/2) Verios_basic (2/2): hands-on session. Bring your real sample(s) with you. Attendees: Tomáš Janoušek 1
25.3. 10:30 - 12:00 Verios_basic (2/2) Verios_basic (2/2): hands-on session. Bring your real sample(s) with you. Attendees: Radim Slovák 1
25.3. 12:30 - 14:00 Verios_basic (2/2) Verios_basic (2/2): hands-on session. Bring your real sample(s) with you. Attendees: Jan Klíma 1
27.3. 09:00 - 13:00 KRATOS-XPS Basic training (session 1/2) - max 2 attendees. In case of interest for the training (when it is full) write to josef.polcak@ceitec.vutbr.cz. Attendees: Grigory Mathew, Sujan Maity 2
27.3. 09:30 - 16:30 MIRA-STAN 1/2 Meeting point at the microscope. This is a two-step training, register for part 2 in our booking system. Obligatory prerequisites must be completed 2 days before the training. More information about the training is available on our <a href=”https://cfmoodle.ceitec.vutbr.cz/course/view.php?id=76”>Moodle</a>. Attendees: Carolina Oliver Urrutia, Ondrej Kubinec 4
27.3. 10:00 - 12:00 Witec-Raman in front of user office Attendees: Lucie Žaloudková, Helena Šimůnková 4
9.4. 09:00 - 12:00 Verios/Helios_EDS Practical demonstration of EDS analytical system at Verios and Helios. Attendees: Tomáš Janoušek 3
16.4. 09:30 - 11:30 MIRA-STAN - EDS detector Only for users with an active MIRA-STAN certificate. Meeting point at the microscope. Attendees: Aida Fazlič 4