| 21.1. 09:00 - 10:30 |
Verios_basic (2/2)
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Verios_basic (2/2): hands-on session. Bring your real sample(s) with you.
Attendees:
Jiří
Spousta
|
1
|
| 21.1. 10:30 - 12:00 |
Verios_basic (2/2)
|
Verios_basic (2/2): hands-on session. Bring your real sample(s) with you.
Attendees:
Mohamed
Bensalem
|
1
|
| 21.1. 12:30 - 14:00 |
Verios_basic (2/2)
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Verios_basic (2/2): hands-on session. Bring your real sample(s) with you.
Attendees:
Lukáš
Koňařík
|
1
|
| 23.1. 08:30 - 15:00 |
LYRA basic training - SEM part
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The training is focused on the SEM part of the LYRA system. We will meet in the coffee room next to the user office in the C building.
Attendees:
Cyril
Delforge,
Navaj
Shaikh,
Elisa
Cuccu,
Jakub
Piastek
|
4
|
| 23.1. 09:30 - 16:00 |
MIRA-STAN 1/2
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Meeting point at the microscope. This is a two-step training, register for part 2 in our booking system. Obligatory prerequisites must be completed 2 days before the training. More information about the training is available on our <a href=”https://cfmoodle.ceitec.vutbr.cz/course/view.php?id=76”>Moodle</a>.
Attendees:
Jiří
Spousta,
Muhammad
Tahsin,
Ekaterina
Pribytova,
Eduard
Jelínek,
Grigory
Mathew,
Karan Singh
Surana,
Nicolò
Rossetti
|
4
|
| 23.1. 14:00 - 16:30 |
Cryomill training
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Introduction of the instrument and grinding jars.
Attendees:
Ammar
AL Soud
|
3
|
| 26.1. 09:00 - 13:00 |
RAITH training basic 1/3
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RAITH basic training.
Introduction to the RAITH150 Two system and the Electron Optics software. Operation of ZEISS SEM and basic functions.
Attendees:
Kryštof
Jasenský,
Elisa
Cuccu
|
2
|
| 26.1. 09:00 - 13:00 |
KRATOS-XPS
|
Basic training (session 1/2) - max 2 attendees.
In case of interest for the training (when it is full) write to josef.polcak@ceitec.vutbr.cz.
Attendees:
Lucie
Žaloudková,
Areej
Fatima
|
2
|
| 27.1. 09:30 - 12:00 |
ALD-Beneq-training
|
Attendees:
Thanh Lam
BUI,
Eduard
Jelínek,
Kryštof
Matějka,
Jan
Kunc
|
3
|
| 27.1. 09:30 - 11:30 |
DLS-ZetaSizer Part 1
|
This training will provide hands-on practice with basic methods for measuring particle size using the DLS technique.
The session will cover:
-An overview of DLS principles, including light scattering and Brownian motion.
-Step-by-step guidance on preparing samples for size and zeta potential measurements.
-The use of different measurement cells (e.g., disposable and reusable cuvettes) and their applications for specific types of samples.
Practical demonstration of data acquisition, optimization of measurement parameters, and analysis using the Malvern software interface.
By the end of the training, participants will gain both theoretical insights and practical expertise in using the Malvern device for comprehensive particle characterization.
Attendees:
Ammar
AL Soud
|
2
|
| 27.1. 10:00 - 11:15 |
Saw Accutom
|
Meeting point: in front of the lab A1.04
Attendees:
Tereza
Havlíková
|
4
|
| 4.2. 09:30 - 13:30 |
MIRA-STAN 2/2
|
Meeting point at the microscope. This is a two-step training, register for part 1 in our booking system. More information about the training is available on our <a href=”https://cfmoodle.ceitec.vutbr.cz/course/view.php?id=76”>Moodle</a>.
Attendees:
Karan Singh
Surana
|
2
|
| 5.2. 09:30 - 13:30 |
MIRA-STAN 2/2
|
Meeting point at the microscope. This is a two-step training, register for part 1 in our booking system. More information about the training is available on our <a href=”https://cfmoodle.ceitec.vutbr.cz/course/view.php?id=76”>Moodle</a>.
Attendees:
Karan Singh
Surana,
Nicolò
Rossetti
|
2
|
| 19.2. 09:30 - 12:00 |
ICON-SPM basic training
|
|
3
|
SUSS-WETBENCH
EVAPORATOR
TEST2