Monday 26.1.2026
CEITEC Nano Research Infrastructure http://nano.ceitec.cz/
0:00 1:00 2:00 3:00 4:00 5:00 6:00 7:00 8:00 9:00 10:00 11:00 12:00 13:00 14:00 15:00 16:00 17:00 18:00 19:00 20:00 21:00 22:00 23:00
SUSS-WETBENCH
KRATOS-XPS
UHV-SPM
WITEC-RAMAN
LYRA
VERIOS
RIE-FLUORINE
RAITH
DEKTAK
UHV-LEEM
UHV-PREPARATION
UHV-DEPOSITION
LVEM
CRYOGENIC
TEGRAMIN
FTIR-CHEMLAB
TUBE-FURNACE
ICON-SPM
LASER-DICER
NANOSCAN
NANOSAM
ALD-FIJI
LITESCOPE-MIRA…
UHV-MBE
SEE-SYSTEM
PARYLENE-SCS
LITESCOPE-LYRA
TITAN
UHV-FTIR
SNOM-NANONICS
FUME_HOOD-B1.14
MAGNETRON
AMBER
MIRA-EBL
HELIOS
MIRA-STAN
ELECTROWORKSHOP
UHV-XPS
VERSALAB
RIGAKU9
WOOLLAM-VIS
RIGAKU3
LEXT
UHV-PLD
JASCO
DWL
ML3-BABY
DIENER
EVAPORATOR
ULTRAFAST-LASER
UHV…
UHV…
CRYOMILL
KEITHLEY-4200
MINIFLEX
SUMMIT
PECVD
LaserMIRA
MIRKA
SIMS
SAW-ACCUTOM
RTP
SPINCOATER…
Q-LAB
ACCURION_RSE
SUSS-RCD8
RSA
RIE-CHLORINE
nano-CT
nanoCT
MPS150
TEST2
SHAKER…
VACUUM_OVEN-B1…
UHV-CLUSTER
US-CUTTER
JAZ3-CHANNEL
VACUUM_OVEN-C1…
FTIR
CITOVAC
VUVAS
UHV-MBE1
VISCOMETER
L450
WIRE-BONDER
XEF2
microCT
ZWICK
ZETASIZER
UHV-LEIS
UHV-MBE2
NANOCALC
FISCHIONE-160
STEMI
BET-ANAMET
SW-BEAMER
SW-LAB
SW-TRACER
LEICA-TXP
TENUPOL
Test Ondra 3
TGA-DISCOVERY
Test O2
PARYLENE-DIENER
Test školení
TEST-RFID2
TGA96
THEORY-SUPPORT
Heliscan
TEM-SW
DSC-DISCOVERY
3D-PRUSA-ORANGE
4-POINT
DHR
DIMPLING…
DRYING_OVEN-B1…
SPONGEBOB
LECTROPOL
R4…
FLOWBOX
FTIRMAG
SW-CT
FUMEHOOD…
FUMEHOOD-HF
FUMEHOOD…
FUMEHOOD…
FUME_HOOD-B1.18
CLARUS-680
Micromex
micro-CT-L240
DRIE
TIC3X
DAWN-HELEOS
BET-DEGASSER
ALD-BENEQ
APCVD-Diffusion
ARES
APCVD
NANOWIZARD
DISCO-DICING…
BAMBULAB
VACUUM_OVEN…
CPD
BRILLOUIN
TORNADO-M4
MECHANICAL…
CEITEC-NANO
CLR-ISO8-Lab…
LEICACOAT-STAN
SW-COMSOL
MINIEVAP
micro-CT-m300
GLOVEBOX…
3D-PRUSA-BLACK
WOOLLAM-MIR
LAKESHORE
PROTOMAT
KERR-MICROSCOPE
HENRY-MAGNET
WOOLLAM-RC2
SUSS-MA8
LABOTOM5
GLOVEBOX…
LPCVD-polySi
MONOWAVE
CITOPRESS
NIKON-NANO
NIRQUEST512
NMR
ZEISS-NANO
ULTRACENTRIFUGE
3D-PRUSA-BLUE
LPCVD-SiN
LIBS-LabSys1
VNA-MPI
IS_NOVOCONTROL
PECVD-NANOFAB
LEICACOAT-NANO
FRASCAN
NANOINDENTER
CHEMLAB-B1.14
CHEMLAB-B1.16
CHEMLAB-B1.18
ZEISS-STAN
LIBS-Discovery
SCIA
FISCHIONE-TEM…
KAUFMAN
IR-RAMAN
K70
R2-PECVD
LAURELL-NANO
LIBS-FireFly
UV-LASER
Kunc, Jan
Rovenská, Katarína
Weisz, Hugo
Delforge, Cyril
T Polčák, Josef
Souawda, Nada
Matějka, Kryštof
Sobola, Dinara
Soldán, Marek
Soldán, Marek
U Danchuk, Viktor
paiva de araujo, Estacio
Supalová, Linda
Weisz, Hugo
Šamořil, Tomáš
Očkovič, Adam
U Kicmerova, Dina
Prajzler, Vladimír
Citterberg, Daniel
Delforge, Cyril
T Lišková, Zuzana
Delforge, Cyril
Citterberg, Daniel
Citterberg, Daniel
Soldán, Marek
U Danchuk, Viktor
Soldán, Marek
U Danchuk, Viktor
Soldán, Marek
U Danchuk, Viktor
U Kolíbalová, Eva
B Kolíbalová, Eva
Daradkeh, Samer
Daradkeh, Samer
Paredes Sánchez, Claudia
Ščasnovič, Erik
Sonigara, Kevalkumar Kishorbhai
Mathew, Grigory
Havelka, Tomáš
Mirdamadi Khouzani, Sayed Hossein
Novotný, Filip
Fallahpour, Mojdeh
Rovenská, Katarína
Kolář, Richard
B Staňo, Michal
Staňo, Michal
U Danchuk, Viktor
Danchuk, Viktor
Juríček, Andrej
Otýpka, Martin
Ulč, Filip
U Danchuk, Viktor
Bolouki, Nima
Fecko, Peter
Klok, Pavel
S Michalička, Jan
U Danchuk, Viktor
Klok, Pavel
Jewula, Pawel
S Prášek, Jan
U Iakoubovskii, Konstantin
Kunc, Jan
Tran, Quynh Nhu Thi
Ulč, Filip
Spusta, Tomáš
U Danchuk, Viktor
Daradkeh, Samer
Caha, Ondřej
Dubroka, Adam
Shaikh, Dr. Navaj
Bolouki, Nima
U Danchuk, Viktor
Juríček, Andrej
B Fecko, Peter
Koller, Philipp
Cmíralová, Marie
S Prášek, Jan
Arregi Uribeetxebarria, Jon Ander
U Danchuk, Viktor
U Danchuk, Viktor
T Tmejová, Kateřina
Patil, Virendra

Upcoming trainings

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Term Name Description Max. attendees
26.1. 09:00 - 13:00 RAITH training basic 1/3 RAITH basic training. Introduction to the RAITH150 Two system and the Electron Optics software. Operation of ZEISS SEM and basic functions. Attendees: Kryštof Jasenský, Elisa Cuccu 2
26.1. 09:00 - 13:00 KRATOS-XPS Basic training (session 1/2) - max 2 attendees. In case of interest for the training (when it is full) write to josef.polcak@ceitec.vutbr.cz. Attendees: Lucie Žaloudková, Areej Fatima 2
27.1. 09:30 - 12:00 ALD-Beneq-training Attendees: Sayed Hossein Mirdamadi Khouzani, Thanh Lam BUI, Eduard Jelínek, Kryštof Matějka, Jan Kunc 3
27.1. 09:30 - 11:30 DLS-ZetaSizer Part 1 This training will provide hands-on practice with basic methods for measuring particle size using the DLS technique. The session will cover: -An overview of DLS principles, including light scattering and Brownian motion. -Step-by-step guidance on preparing samples for size and zeta potential measurements. -The use of different measurement cells (e.g., disposable and reusable cuvettes) and their applications for specific types of samples. Practical demonstration of data acquisition, optimization of measurement parameters, and analysis using the Malvern software interface. By the end of the training, participants will gain both theoretical insights and practical expertise in using the Malvern device for comprehensive particle characterization. Attendees: Ammar AL Soud 2
27.1. 10:00 - 13:00 Tornado-M4 A 1.16 3
27.1. 10:00 - 11:15 Saw Accutom Meeting point: in front of the lab A1.04 Attendees: Tereza Havlíková 4
29.1. 10:00 - 11:30 Zeiss StAn microscope Meeting point: in front of the room A1.04 Attendees: Lenka Novotná 1
4.2. 13:00 - 15:00 Laser Dicer training 2
5.2. 09:30 - 13:30 MIRA-STAN 2/2 Meeting point at the microscope. This is a two-step training, register for part 1 in our booking system. More information about the training is available on our <a href=”https://cfmoodle.ceitec.vutbr.cz/course/view.php?id=76”>Moodle</a>. Attendees: Grigory Mathew, Karan Singh Surana, Nicolò Rossetti 3
17.2. 09:00 - 17:00 Helios_basic (1/2) Helios_basic (1/2): training for new users, demonstration part. Meeting point: entrance to StAn CLR labs (bldg. A, 1st floor). Bring your cleanroom stationery set if you have one. Register one slot (only) for the Helios_basic (2/2) hands-on session to complete the training curriculum. Attendees: Jiří Spousta 3
19.2. 09:30 - 12:00 ICON-SPM basic training 3