| 9.2. 09:30 - 12:30 |
DLS-ZetaSizer Part 1+2
|
This training will provide hands-on practice with basic methods for measuring particle size using the DLS technique.
The session will cover:
-An overview of DLS principles, including light scattering and Brownian motion.
-Step-by-step guidance on preparing samples for size and zeta potential measurements.
-The use of different measurement cells (e.g., disposable and reusable cuvettes) and their applications for specific types of samples.
Practical demonstration of data acquisition, optimization of measurement parameters, and analysis using the Malvern software interface.
By the end of the training, participants will gain both theoretical insights and practical expertise in using the Malvern device for comprehensive particle characterization.
Attendees:
Michela
Sanna,
Ammar
AL Soud,
Monika
Kreuzerová
|
3
|
| 9.2. 09:30 - 11:00 |
RIE-flourine- training
|
Attendees:
Franz
Vilsmeier,
Fabian
Majcen,
Kryštof
Matějka
|
3
|
| 9.2. 15:00 - 16:00 |
SUSS-MA8 training
|
Attendees:
Laiba
Bajwa
|
1
|
| 10.2. 09:00 - 13:00 |
Verios_basic (1/2)
|
Verios_basic (1/2): training for new users, demonstration part. Meeting point: entrance to StAn CLR labs (bldg. A, 1st floor). Bring your cleanroom stationery set if you have one. Register one slot for the Verios_basic (2/2) hands-on session to complete the training curriculum.
Attendees:
Kryštof
Jasenský
|
3
|
| 10.2. 09:30 - 12:00 |
RIE-flourine-training
|
Attendees:
Jakub
Krčma,
Ekaterina
Pribytova,
Laiba
Bajwa
|
3
|
| 10.2. 14:00 - 14:45 |
Vacuum Oven C 1.38
|
Basic training for the Vacuum Oven C 1.38
Attendees:
Sára
Hrdinová
|
4
|
| 10.2. 14:00 - 15:00 |
DIENER-training
|
Attendees:
Laiba
Bajwa
|
3
|
| 12.2. 09:30 - 16:00 |
MIRA-STAN 1/2
|
Meeting point at the microscope. This is a two-step training, register for part 2 in our booking system. Obligatory prerequisites must be completed 2 days before the training. More information about the training is available on our <a href=”https://cfmoodle.ceitec.vutbr.cz/course/view.php?id=76”>Moodle</a>.
Attendees:
Eduard
Jelínek,
Navaj
Shaikh,
Saurabh
Pathak
|
4
|
| 13.2. 09:00 - 10:30 |
Verios_basic (2/2)
|
Verios_basic (2/2): hands-on session. Bring your real sample(s) with you.
Attendees:
Kryštof
Jasenský
|
1
|
| 13.2. 10:30 - 12:00 |
Verios_basic (2/2)
|
Verios_basic (2/2): hands-on session. Bring your real sample(s) with you.
|
1
|
| 13.2. 12:30 - 14:00 |
Verios_basic (2/2)
|
Verios_basic (2/2): hands-on session. Bring your real sample(s) with you.
|
1
|
| 13.2. 14:00 - 18:00 |
Rigaku 3 - hands on
|
Hands on
Attendees:
Pedro Henrique
de Oliveira Santiago
|
1
|
| 17.2. 09:00 - 17:00 |
Helios_basic (1/2)
|
Helios_basic (1/2): training for new users, demonstration part. Meeting point: entrance to StAn CLR labs (bldg. A, 1st floor). Bring your cleanroom stationery set if you have one. Register one slot (only) for the Helios_basic (2/2) hands-on session to complete the training curriculum.
Attendees:
Jiří
Spousta,
Jan
Pišťák
|
2
|
| 19.2. 09:30 - 12:00 |
ICON-SPM basic training
|
|
3
|
| 23.2. 10:30 - 11:15 |
Nanofab interview - Meeting room C2.11 or C2.07
|
This interview is mandatory for enrollment to the Safety excursion - Nanofabrication lab.
ID schůzky: 347 469 442 329 50
Přístupový kód: Nh7js27A
|
5
|
| 24.2. 12:15 - 12:50 |
Safety excursion Chem lab
|
The Moodle course, Advanced Chemical Laboratory is MANDATORY for the Safety Excursion. https://cfmoodle.ceitec.vutbr.cz/course/index.php?categoryid=48. It must be finished 2 work days before the excursion.
Attendees:
Ekaterina
Pribytova
|
5
|
| 24.2. 13:00 - 13:50 |
Safety excursion - Nanofabrication lab
|
Please enroll in this training only in parallel with the "Nanofab interview."
Do not enroll in training ahead of time, but when you are sure you will be using nanofabrication techniques. It is possible to pass this training anytime during your access additionally (it takes place at least once a month).
|
5
|
| 24.2. 13:55 - 14:20 |
Safety excursion - Nanocharacterization lab
|
|
10
|
| 24.2. 14:25 - 14:55 |
Safety excursion - StAn lab
|
Attendees:
Eduard
Jelínek
|
10
|
WOOLLAM-VIS
KRATOS-XPS
TEST2