Wednesday 7.1.2026
CEITEC Nano Research Infrastructure http://nano.ceitec.cz/
0:00 1:00 2:00 3:00 4:00 5:00 6:00 7:00 8:00 9:00 10:00 11:00 12:00 13:00 14:00 15:00 16:00 17:00 18:00 19:00 20:00 21:00 22:00 23:00
VERIOS
DIENER
FUME_HOOD-B1.14
RIGAKU3
JASCO
HELIOS
TEGRAMIN
KRATOS-XPS
MIRA-STAN
WITEC-RAMAN
ULTRACENTRIFUGE
DWL
MPS150
ICON-SPM
FUMEHOOD-HF
SNOM-NANONICS
UHV-XPS
UHV-PLD
LYRA
UHV-LEEM
VNA-MPI
FUME_HOOD-B1.18
UHV-DEPOSITION
KERR-MICROSCOPE
R4…
CRYOGENIC
LEICACOAT-NANO
TITAN
CHEMLAB-B1.14
CHEMLAB-B1.18
SUSS-WETBENCH
LITESCOPE-LYRA
LIBS-FireFly
R2-PECVD
KEITHLEY-4200
EVAPORATOR
VERSALAB
NIKON-NANO
LEICACOAT-STAN
NANOSAM
VACUUM_OVEN…
NANOSCAN
TIC3X
TUBE-FURNACE
ALD-FIJI
NMR
DSC-DISCOVERY
UHV-PREPARATION
RAITH
ZETASIZER
RIGAKU9
RSA
Q-LAB
RTP
NANOCALC
STEMI
BET-ANAMET
SW-BEAMER
ACCURION_RSE
RIE-FLUORINE
SHAKER…
SUMMIT
SUSS-RCD8
LaserMIRA
SEE-SYSTEM
SIMS
PARYLENE-SCS
RIE-CHLORINE
MINIFLEX
nanoCT
nano-CT
MIRA-EBL
THEORY-SUPPORT
SW-LAB
CITOVAC
UHV…
ULTRAFAST-LASER
US-CUTTER
JAZ3-CHANNEL
VACUUM_OVEN-C1…
FTIR-CHEMLAB
FTIR
VACUUM_OVEN-B1…
UHV-CLUSTER
VUVAS
VISCOMETER
L450
WIRE-BONDER
XEF2
microCT
ZWICK
UHV…
UHV-SPM
SW-TRACER
TEST-RFID2
LEICA-TXP
TENUPOL
FISCHIONE-160
Test Ondra 3
Test O2
TEST2
Test školení
TGA96
UHV-MBE
SAW-ACCUTOM
Heliscan
TGA-DISCOVERY
UHV-MBE2
UHV-MBE1
UHV-FTIR
UHV-LEIS
SPINCOATER…
ML3-BABY
MIRKA
4-POINT
DIMPLING…
DRYING_OVEN-B1…
SPONGEBOB
LECTROPOL
ELECTROWORKSHOP
FLOWBOX
FTIRMAG
DRIE
FUMEHOOD…
FUMEHOOD…
FUMEHOOD…
CLARUS-680
Micromex
micro-CT-L240
micro-CT-m300
DHR
SW-CT
GLOVEBOX…
BRILLOUIN
ALD-BENEQ
ARES
APCVD
NANOWIZARD
DISCO-DICING…
BAMBULAB
BET-DEGASSER
TORNADO-M4
CRYOMILL
MECHANICAL…
CEITEC-NANO
CLR-ISO8-Lab…
SW-COMSOL
LEXT
MINIEVAP
CPD
DAWN-HELEOS
PECVD-NANOFAB
PECVD
MONOWAVE
MAGNETRON
WOOLLAM-RC2
SUSS-MA8
DEKTAK
LABOTOM5
WOOLLAM-MIR
GLOVEBOX…
CITOPRESS
LVEM
NIRQUEST512
WOOLLAM-VIS
ZEISS-NANO
3D-PRUSA-BLUE
3D-PRUSA-BLACK
3D-PRUSA-ORANGE
PARYLENE-DIENER
HENRY-MAGNET
PROTOMAT
FRASCAN
IR-RAMAN
NANOINDENTER
CHEMLAB-B1.16
IS_NOVOCONTROL
ZEISS-STAN
SCIA
FISCHIONE-TEM…
KAUFMAN
K70
LAKESHORE
LASER-DICER
LAURELL-NANO
LIBS-Discovery
LIBS-LabSys1
LITESCOPE-MIRA…
LPCVD-polySi
LPCVD-SiN
UV-LASER
T Kicmerova, Dina
Saldan, Ivan
Jadhao, Pranjali
Idesová, Beáta
paiva de araujo, Estacio
Bokaei Khelejan, Hatef
Polášková, Kateřina
U Jewula, Pawel
U Jewula, Pawel
Bednaříková, Vendula
Šťastný, Přemysl
Kalleshappa, Bindu
Polášková, Kateřina
T Tmejová, Kateřina
Virágová, Eliška
Bahadur, Fateh
Skálová, Zdenka
Skálová, Zdenka
Polčák, Josef
Remešová, Michaela
Valášek, Daniel
Havlíková, Tereza
Supalová, Linda
paiva de araujo, Estacio
Foltýn, Michael
Saldan, Ivan
Fecko, Peter
Fecko, Peter
paiva de araujo, Estacio
Šťastný, Jakub
T Zita, Jiří
Klok, Pavel
Molnár, Tomáš
S Danchuk, Viktor
Očkovič, Adam
Endstrasser, Zdeněk
Klíma, Jan
Mukherjee, Aniket
Endstrasser, Zdeněk
Lukiienko, Iryna
U Eliáš, Marek
Klíma, Jan
Yuan, Yunhuan
S Michalička, Jan
Polášková, Kateřina
Polášková, Kateřina
Idesová, Beáta
Klok, Pavel
Vozár, Tomáš
Beliančínová, Beáta
Patil, Virendra
Bokaei Khelejan, Hatef
Vijithra, Vijithra
Fecko, Peter
Rotter, Marek
Staňo, Michal
Pavliňák, David
Kovařík, Martin
Kramář, Jan
Havelka, Tomáš
Juríček, Andrej
U Jewula, Pawel
Fu, Hongbo
Endstrasser, Zdeněk
Idesová, Beáta
Mukherjee, Aniket
Caha, Ondřej

Upcoming trainings

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Term Name Description Max. attendees
7.1. 09:00 - 10:30 JASCO training Description of holders and software, basic measurement Attendees: Andrej Juríček, Konstantin Iakoubovskii 3
13.1. 10:00 - 13:00 CRIOGENIC DCR CRYOGENIC DCR basic training Attendees: Samer Daradkeh, David Neradilek 2
14.1. 09:00 - 11:30 BET training: Degassing (1/2) Degassing of the sample (1/2) Attendees: Ammar AL Soud, Saurabh Pathak 4
14.1. 09:30 - 12:00 RIE-flourine-training Attendees: Cyril Delforge 3
14.1. 11:30 - 14:00 BET training: Measurement (2/2) Measurement of the sample (2/2) Attendees: Ammar AL Soud, Saurabh Pathak 4
15.1. 09:30 - 12:00 RIE-chlorine- training Attendees: Cyril Delforge 3
20.1. 09:00 - 13:00 Verios_basic (1/2) Verios_basic (1/2): training for new users, demonstration part. Meeting point: entrance to StAn CLR labs (bldg. A, 1st floor). Bring your cleanroom stationery set if you have one. Register one slot for the Verios_basic (2/2) hands-on session to complete the training curriculum. Attendees: Jiří Spousta, Lukáš Koňařík, Mohamed Bensalem 3
21.1. 09:00 - 10:30 Verios_basic (2/2) Verios_basic (2/2): hands-on session. Bring your real sample(s) with you. Attendees: Jiří Spousta 1
21.1. 10:30 - 12:00 Verios_basic (2/2) Verios_basic (2/2): hands-on session. Bring your real sample(s) with you. Attendees: Mohamed Bensalem 1
21.1. 12:30 - 14:00 Verios_basic (2/2) Verios_basic (2/2): hands-on session. Bring your real sample(s) with you. 1
23.1. 09:30 - 16:00 MIRA-STAN 1/2 Meeting point at the microscope. This is a two-step training, register for part 2 in our booking system. Obligatory prerequisites must be completed 2 days before the training. More information about the training is available on our <a href=”https://cfmoodle.ceitec.vutbr.cz/course/view.php?id=76”>Moodle</a>. Attendees: Navaj Shaikh, Grigory Mathew, Karan Singh Surana, Saurabh Pathak, Nicolò Rossetti 4
4.2. 09:30 - 13:30 MIRA-STAN 2/2 Meeting point at the microscope. This is a two-step training, register for part 1 in our booking system. More information about the training is available on our <a href=”https://cfmoodle.ceitec.vutbr.cz/course/view.php?id=76”>Moodle</a>. 2
5.2. 09:30 - 13:30 MIRA-STAN 2/2 Meeting point at the microscope. This is a two-step training, register for part 1 in our booking system. More information about the training is available on our <a href=”https://cfmoodle.ceitec.vutbr.cz/course/view.php?id=76”>Moodle</a>. 2