Sunday 19.7.2026
CEITEC Nano Research Infrastructure http://nano.ceitec.cz/
0:00 1:00 2:00 3:00 4:00 5:00 6:00 7:00 8:00 9:00 10:00 11:00 12:00 13:00 14:00 15:00 16:00 17:00 18:00 19:00 20:00 21:00 22:00 23:00
RIE-FLUORINE
RIGAKU3
EVAPORATOR
ML3-BABY
LAKESHORE
ULTRASONIC…
VERSALAB
SUSS-WETBENCH
VNA-MPI
RIE-CHLORINE
CRYOGENIC
DRYING-OVEN-B1…
R2-PECVD
LYRA
SIMS
BET-ANAMET
WOOLLAM-VIS
JASCO
DRIE
TEGRAMIN
MAGNETRON
BRILLOUIN
NANOSAM
KRATOS-XPS
SHAKER-B1.18
PARYLENE-SCS
ULTRACENTRIFUGE
SEE-SYSTEM
LaserMIRA
SUMMIT
STEMI
MIRA-STAN
NANOCALC
ZEISS-NANO
SW-BEAMER
SW-LAB
SW-TRACER
LEICA-TXP
ICON-SPM
ACCURION_RSE
SNOM-NANONICS
TEM-SW
Q-LAB
SPINCOATER…
SUSS-RCD8
SAW-ACCUTOM
MIRKA
DIENER
PECVD
PARYLENE-DIENER
RTP
3D-PRUSA-ORANGE
MINIFLEX
nanoCT
nano-CT
3D-PRUSA-BLACK
RSA
3D-PRUSA-BLUE
MIRA-EBL
Test O2
TENUPOL
VACUUM-OVEN-B1…
ULTRAFAST-LASER
US-CUTTER
DWL
JAZ3-CHANNEL
VACUUM_OVEN-C1…
FTIR-CHEMLAB
FTIR
CITOVAC
VACUUM-OVEN-B1…
VUVAS
UHV…
VISCOMETER
L450
WIRE-BONDER
WITEC-RAMAN
XEF2
RIGAKU9
microCT
ZWICK
ZETASIZER
UHV-PREPARATION
UHV…
FISCHIONE-160
TGA-DISCOVERY
AMBER
Test Ondra 3
TEST2
Test školení
TEST-RFID2
TEST-RFID4
TGA96
THEORY-SUPPORT
Heliscan
UHV-MBE1
UHV-CLUSTER
UHV-MBE2
UHV-DEPOSITION
UHV-FTIR
UHV-LEEM
UHV-LEIS
UHV-MBE
UHV-XPS
UHV-PLD
UHV-SPM
NMR
NANO-ONE-2PP
NIRQUEST512
FLOWBOX
SW-CT
DHR
DIMPLING…
RAITH
SPONGEBOB
LECTROPOL
ELECTROWORKSHOP
R4…
HELIOS
TIC3X
4-POINT
FTIRMAG
FUMEHOOD…
FUMEHOOD-HF
FUMEHOOD…
FUMEHOOD…
FUMEHOOD…
FUMEHOOD…
FUMEHOOD…
CRYOMILL
CPD
FUMEHOOD…
DISCO-DICING…
MPS150
GLOVEBOX…
ALD-BENEQ
APCVD-Diffusion
ARES
MAGNETRON-AJA
APCVD
NANOWIZARD
ALD-FIJI
BAMBULAB
MINIEVAP
BET-DEGASSER
TORNADO-M4
MECHANICAL…
CEITEC-NANO
TUBE-FURNACE
CLR-ISO8-Lab…
LEICACOAT-STAN
SW-COMSOL
LEXT
FUMEHOOD…
CLARUS-680
NIKON-NANO
HENRY-MAGNET
LIBS-LabSys1
LITESCOPE-LYRA
LITESCOPE-MIRA…
LPCVD-polySi
LPCVD-SiN
PROTOMAT
LVEM
KERR-MICROSCOPE
WOOLLAM-RC2
LIBS-FireFly
SUSS-MA8
DEKTAK
LABOTOM5
WOOLLAM-MIR
3D-PRUSA-XL
DSC-DISCOVERY
MONOWAVE
CITOPRESS
NANOSCAN
LIBS-Discovery
LAURELL-NANO
Micromex
CHEMLAB-B1.14
micro-CT-L240
micro-CT-m300
DAWN-HELEOS
VERIOS
PECVD-NANOFAB
LEICACOAT-NANO
FRASCAN
TITAN
NANOINDENTER
CHEMLAB-B1.16
LASER-DICER
CHEMLAB-B1.18
IS-NOVOCONTROL
ZEISS-STAN
SCIA
FISCHIONE-TEM…
KAUFMAN
IR-RAMAN
K70
KEITHLEY-4200
UV-LASER
Supalová, Linda
Supalová, Linda
Wang, Yue
Daradkeh, Samer
Fecko, Peter
Supalová, Linda
Supalová, Linda
Holcman, Vladimír
AL Soud, Ammar
Slavíček, Radek
Supalová, Linda
Pribytova, Ekaterina
Fecko, Peter
Pribytova, Ekaterina
AL Soud, Ammar
Bolouki, Nima
S Šamořil, Tomáš
Danchuk, Viktor
Fanisaberi, Amirmohsen
Franta, Daniel
AL Soud, Ammar
Fecko, Peter
Havlíková, Tereza
U Prášek, Jan
Krčma, Jakub
S Danchuk, Viktor
AL Soud, Ammar

Upcoming trainings

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Term Name Description Max. attendees
20.7. 09:00 - 13:00 RAITH training basic 1/3 RAITH basic training. Introduction to the RAITH150 Two system and the Electron Optics software. Operation of ZEISS SEM and basic functions. Attendees: DAVIDE MURTAS 1
20.7. 09:00 - 13.7. 13:00 KRATOS-XPS Basic training (session 1/2) - max 2 attendees. In case of interest for the training (when it is full) write to josef.polcak@ceitec.vutbr.cz. Attendees: Debika Devi Thongam 2
20.7. 10:30 - 11:15 Nanofab interview - Meeting room C2.11 or C2.07 This interview is mandatory for enrollment to the Safety excursion - Nanofabrication lab. Join: [HERE](https://teams.microsoft.com/meet/35462004903561?p=GpHxeNZeulO7czefLV) Meeting ID: 354 620 049 035 61 Access code: 7AD77PX3 Attendees: Nikol Kaděrová, Redzic Milica, Cimolato Andrea, Le Thien 5
21.7. 09:30 - 12:30 FTIR-CHEMLAB Meeting point in Chemlab. Attendees: Petr Sysel, Debika Devi Thongam 3
21.7. 10:00 - 11:30 Leicacoat-Nano training Attendees: Hongbo Fu, Rosmi Vinson 4
21.7. 12:15 - 12:50 Safety excursion - Advanced Chemical lab Attendees: Laiba Asad Bajwa, Jana Burdíková 5
21.7. 13:00 - 13:50 Safety excursion - Nanofabrication lab Please enroll in this training only in parallel with the "Nanofab interview." Do not enroll in training ahead of time, but when you are sure you will be using nanofabrication techniques. It is possible to pass this training anytime during your access additionally (it takes place at least once a month). Attendees: Nikol Kaděrová, Redzic Milica, Cimolato Andrea, Le Thien, Karel Ĺ kubnĂ­k 5
21.7. 13:55 - 14:20 Safety excursion - Nanocharacterization lab Attendees: Vladislav Dvořák, Muhammad SAHIL, Redzic Milica, Cimolato Andrea, Le Thien, Jana Burdíková, Laura Búšová 10
21.7. 14:25 - 14:55 Safety excursion - Structural Analysis Attendees: Nima Bolouki, Muhammad SAHIL 10
22.7. 09:00 - 10:30 JASCO training- CZ Description of holders and software, basic measurement Attendees: Marie Jakešová, Anna Tvrdoňová, Šimon Krútek 3
22.7. 09:30 - 16:30 MIRA-STAN 1/2 Meeting point at the microscope. This is a two-step training, register for part 2 in our booking system. Obligatory prerequisites must be completed 2 days before the training. More information about the training is available on our <a href=”https://cfmoodle.ceitec.vutbr.cz/course/view.php?id=76”>Moodle</a>. Attendees: Iosif Tantis, Debika Devi Thongam 4
22.7. 10:30 - 12:00 JASCO training - EN Description of holders and software, basic measurement Attendees: Laiba Asad Bajwa, Rosmi Vinson 2
23.7. 09:00 - 13:00 Verios_basic (1/2) Verios_basic (1/2): training for new users, demonstration part. Meeting point: entrance to StAn CLR labs (bldg. A, 1st floor). Bring your cleanroom stationery set if you have one. Register one slot for the Verios_basic (2/2) hands-on session to complete the training curriculum. Attendees: Navajsharif Shamshuddin Shaikh, Ondrej Kubinec, Debika Devi Thongam 3
24.7. 09:00 - 10:30 Verios_basic (2/2) Verios_basic (2/2): hands-on session. Bring your real sample(s) with you. 1
24.7. 10:30 - 12:00 Verios_basic (2/2) Verios_basic (2/2): hands-on session. Bring your real sample(s) with you. Attendees: Debika Devi Thongam 1
24.7. 12:30 - 14:00 Verios_basic (2/2) Verios_basic (2/2): hands-on session. Bring your real sample(s) with you. Attendees: Ondrej Kubinec 1
27.7. 09:30 - 13:30 ZWICK Meeting point is in front of the Advanced Chemical laboratory. Obligatory prerequisites 1. Pass the Chemical laboratory safety excursion in Moodle (https://cfmoodle.ceitec.vutbr.cz/course/view.php?id=173): 2. Answer the ZWICK applicant questionnaire 3. Read the ZWICK rules (mark the activity as complete with ✔️) 4. Bring your own sample Recommended prerequisites 5. Get familiar with the Layout for ZWICK basic training (mark the activity as complete with ✔️) Attendees: Rasul Valiyev 2
29.7. 09:30 - 13:00 MIRA-STAN 2/2 Meeting point at the microscope. This is a two-step training, register for part 1 in our booking system. More information about the training is available on our <a href=”https://cfmoodle.ceitec.vutbr.cz/course/view.php?id=76”>Moodle</a>. Attendees: Iosif Tantis, Debika Devi Thongam 2
30.7. 09:00 - 13:00 Rigaku 3 - hands on Hands on - Hrdinová - dlouho neměřila Attendees: Sára Hrdinová 1
4.8. 09:00 - 12:00 Verios/Helios_EDS Practical demonstration of EDS analytical system at Verios and Helios. Attendees: Sunny Nandi, Debika Devi Thongam, Kateřina Polášková 3
18.8. 09:00 - 13:00 Verios_basic (1/2) Verios_basic (1/2): training for new users, demonstration part. Meeting point: entrance to StAn CLR labs (bldg. A, 1st floor). Bring your cleanroom stationery set if you have one. Register one slot for the Verios_basic (2/2) hands-on session to complete the training curriculum. Attendees: Nima Bolouki, Šimon Formánek 3
19.8. 09:00 - 10:30 Verios_basic (2/2) Verios_basic (2/2): hands-on session. Bring your real sample(s) with you. Attendees: Šimon Formánek 1
19.8. 10:30 - 12:00 Verios_basic (2/2) Verios_basic (2/2): hands-on session. Bring your real sample(s) with you. Attendees: Nima Bolouki 1
19.8. 12:30 - 14:00 Verios_basic (2/2) Verios_basic (2/2): hands-on session. Bring your real sample(s) with you. 1