Thursday 4.6.2026
CEITEC Nano Research Infrastructure http://nano.ceitec.cz/
0:00 1:00 2:00 3:00 4:00 5:00 6:00 7:00 8:00 9:00 10:00 11:00 12:00 13:00 14:00 15:00 16:00 17:00 18:00 19:00 20:00 21:00 22:00 23:00
WITEC-RAMAN
MIRA-STAN
KRATOS-XPS
WOOLLAM-RC2
DEKTAK
LYRA
SUSS-WETBENCH
LEICACOAT-STAN
TITAN
VERSALAB
RIE-FLUORINE
NIKON-NANO
EVAPORATOR
RIGAKU9
UHV-LEEM
UHV-DEPOSITION
TEGRAMIN
VERIOS
FUMEHOOD…
FUMEHOOD…
CHEMLAB-B1.14
CHEMLAB-B1.18
FUMEHOOD…
UHV-XPS
AMBER
ML3-BABY
K70
LASER-DICER
LAKESHORE
FUMEHOOD…
SEE-SYSTEM
SUSS-MA8
MIRA-EBL
NANOSCAN
DIENER
WOOLLAM-VIS
NMR
SUSS-RCD8
ULTRACENTRIFUGE
RIGAKU3
CRYOGENIC
VNA-MPI
ALD-BENEQ
RAITH
HELIOS
UHV-SPM
R4…
UHV-PREPARATION
4-POINT
VACUUM-OVEN-B1…
SPONGEBOB
DRIE
ALD-FIJI
VACUUM-OVEN-B1…
CITOVAC
SNOM-NANONICS
ICON-SPM
UHV-PLD
PARYLENE-SCS
SIMS
FTIR
FTIR-CHEMLAB
VACUUM_OVEN-C1…
LaserMIRA
VUVAS
MINIFLEX
RSA
nano-CT
nanoCT
JAZ3-CHANNEL
RIE-CHLORINE
VISCOMETER
L450
WIRE-BONDER
XEF2
microCT
ZWICK
ZETASIZER
ACCURION_RSE
RTP
Q-LAB
SUMMIT
BET-ANAMET
SHAKER-B1.18
Test školení
UHV-MBE
UHV-LEIS
UHV-CLUSTER
UHV…
UHV-FTIR
UHV-MBE2
UHV-MBE1
TGA-DISCOVERY
Heliscan
SAW-ACCUTOM
UHV…
THEORY-SUPPORT
TGA96
TEST-RFID2
ULTRAFAST-LASER
JASCO
TEST2
Test O2
Test Ondra 3
ULTRASONIC…
FISCHIONE-160
TENUPOL
LEICA-TXP
US-CUTTER
SW-TRACER
SW-LAB
DWL
SW-BEAMER
STEMI
NANOCALC
SPINCOATER…
NANO-ONE-2PP
MIRKA
FTIRMAG
SW-CT
DHR
DIMPLING…
DRYING-OVEN-B1…
LECTROPOL
ELECTROWORKSHOP
FLOWBOX
FUMEHOOD-HF
TIC3X
FUMEHOOD…
FUMEHOOD…
FUMEHOOD…
FUMEHOOD…
CLARUS-680
Micromex
micro-CT-L240
CRYOMILL
CPD
DAWN-HELEOS
BAMBULAB
MPS150
GLOVEBOX…
APCVD-Diffusion
ARES
APCVD
NANOWIZARD
DISCO-DICING…
BET-DEGASSER
MINIEVAP
BRILLOUIN
TORNADO-M4
MECHANICAL…
CEITEC-NANO
TUBE-FURNACE
CLR-ISO8-Lab…
SW-COMSOL
LEXT
micro-CT-m300
PECVD-NANOFAB
PECVD
MONOWAVE
KERR-MICROSCOPE
HENRY-MAGNET
MAGNETRON
LABOTOM5
WOOLLAM-MIR
3D-PRUSA-XL
DSC-DISCOVERY
CITOPRESS
PROTOMAT
NANOSAM
NIRQUEST512
ZEISS-NANO
3D-PRUSA-BLUE
3D-PRUSA-BLACK
3D-PRUSA-ORANGE
PARYLENE-DIENER
TEM-SW
LVEM
LPCVD-SiN
LEICACOAT-NANO
KAUFMAN
FRASCAN
NANOINDENTER
CHEMLAB-B1.16
IS-NOVOCONTROL
ZEISS-STAN
SCIA
FISCHIONE-TEM…
IR-RAMAN
LPCVD-polySi
KEITHLEY-4200
R2-PECVD
LAURELL-NANO
LIBS-FireFly
LIBS-Discovery
LIBS-LabSys1
LITESCOPE-LYRA
LITESCOPE-MIRA…
UV-LASER
Konečný, Martin
Pavliňák, David
Chamradová, Ivana
Iakoubovskii, Konstantin
Konečná, Tereza
Říhová, Martina
Kalleshappa, Bindu
Žaloudková, Lucie
T Polčák, Josef
Valiyev, Rasul
Valadi Palliyalil, Anjali
Beliančínová, Beáta
Janů, Lucie
Duchaň, Marek
E Zita, Jiří
Tvrdoňová, Anna
Jasenský, Kryštof
Kramář, Jan
Jelínek, Eduard
E Zita, Jiří
Supalová, Linda
Kalleshappa, Bindu
Surana, Karan Singh
Michalička, Jan
Kolíbalová, Eva
Daradkeh, Samer
Klimek, Jan
Petrosyan, Derenik
Supalová, Linda
E Zita, Jiří
Lišková, Zuzana
E Zita, Jiří
Supalová, Linda
Slavíček, Radek
Lukiienko, Iryna
D'Angelo, Elena
D'Angelo, Elena
Pišťák, Jan
Surana, Karan Singh
Tmejová, Kateřina
E Zita, Jiří
Klíma, Jan
Jewula, Pawel
E Zita, Jiří
D'Angelo, Elena
Spousta, Jiří
E Zita, Jiří
Kolář, Richard
Bahadur, Fateh
Holcman, Vladimír
E Zita, Jiří
Polášková, Kateřina
E Zita, Jiří
Supalová, Linda
Kovařík, Martin
Krútek, Šimon
Duchaň, Marek
Jewula, Pawel
E Zita, Jiří
Pavliňák, David
B Roupcová, Pavla
Pribytova, Ekaterina
Pribytova, Ekaterina
Eliáš, Marek
Lišková, Zuzana
Bahadur, Fateh
D'Angelo, Elena
Janůšová, Martina
D'Angelo, Elena
Šimůnková, Helena
Pavliňák, David
Tvrdoňová, Anna
Jelínek, Eduard
Kumar, Sanjay

Upcoming trainings

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Term Name Description Max. attendees
4.6. 09:00 - 13:00 KRATOS-XPS Basic training (session 1/2) - max 2 attendees. In case of interest for the training (when it is full) write to josef.polcak@ceitec.vutbr.cz. Attendees: Šimon Formánek, Iosif Tantis 2
8.6. 09:00 - 17:30 Amber Practice Attendees: Rostislav Řepa, Jakub Šťastný 2
8.6. 09:00 - 11:00 MIRA-STAN - EDS detector Only for users with an active MIRA-STAN certificate. Meeting point at the microscope. Attendees: Veronika Sevriugina, Lucie Žaloudková 4
9.6. 09:00 - 13:00 Verios_basic (1/2) Verios_basic (1/2): training for new users, demonstration part. Meeting point: entrance to StAn CLR labs (bldg. A, 1st floor). Bring your cleanroom stationery set if you have one. Register one slot for the Verios_basic (2/2) hands-on session to complete the training curriculum. Attendees: Nikol Kaděrová 3
9.6. 09:30 - 10:30 ULTRASONIC-PROBE Basic training for sample dispersion with the ultrasonic probe. The meeting point is at the Chemical Laboratory (B1.15). Attendees: Ying Hu 2
11.6. 09:00 - 10:30 Verios_basic (2/2) Verios_basic (2/2): hands-on session. Bring your real sample(s) with you. Attendees: Nikol Kaděrová 1
11.6. 10:30 - 12:00 Verios_basic (2/2) Verios_basic (2/2): hands-on session. Bring your real sample(s) with you. 1
11.6. 12:30 - 14:00 Verios_basic (2/2) Verios_basic (2/2): hands-on session. Bring your real sample(s) with you. 1
15.6. 09:00 - 13:00 DHR Basic rheology training. Meeting point at the rheometer. Attendees: Amirmohsen Fanisaberi, Carolina Sanna 2
16.6. 08:30 - 15:00 Helios_basic (1/2) Helios_basic (1/2): training for new users, demonstration part. Meeting point: entrance to StAn CLR labs (bldg. A, 1st floor). Bring your cleanroom stationery set if you have one. Register one slot (only) for the Helios_basic (2/2) hands-on session to complete the training curriculum. Attendees: Hasan Ali 3
22.6. 10:30 - 11:15 Nanofab interview - Meeting room C2.11 or C2.07 This interview is mandatory for enrollment to the Safety excursion - Nanofabrication lab. Join: [HERE](https://teams.microsoft.com/meet/324197360288872?p=8YaxjqMg8zpRrwFFMC ) Meeting ID: 324 197 360 288 872 Access code: hW3qJ6bB 5
23.6. 12:15 - 12:50 Safety excursion - Advanced Chemical lab 5
23.6. 13:00 - 13:50 Safety excursion - Nanofabrication lab Please enroll in this training only in parallel with the "Nanofab interview." Do not enroll in training ahead of time, but when you are sure you will be using nanofabrication techniques. It is possible to pass this training anytime during your access additionally (it takes place at least once a month). 5
23.6. 13:55 - 14:20 Safety excursion - Nanocharacterization lab 10
23.6. 14:25 - 14:55 Safety excursion - Structural Analysis 10
24.6. 09:30 - 16:30 MIRA-STAN 1/2 Meeting point at the microscope. This is a two-step training, register for part 2 in our booking system. Obligatory prerequisites must be completed 2 days before the training. More information about the training is available on our <a href=”https://cfmoodle.ceitec.vutbr.cz/course/view.php?id=76”>Moodle</a>. Attendees: Maria Baeva, Rosmi Vinson, Sharmistha Dey 4
25.6. 09:30 - 13:00 MIRA-STAN 2/2 Meeting point at the microscope. This is a two-step training, register for part 1 in our booking system. More information about the training is available on our <a href=”https://cfmoodle.ceitec.vutbr.cz/course/view.php?id=76”>Moodle</a>. Attendees: Maria Baeva 2