Wednesday 24.6.2026
CEITEC Nano Research Infrastructure http://nano.ceitec.cz/
0:00 1:00 2:00 3:00 4:00 5:00 6:00 7:00 8:00 9:00 10:00 11:00 12:00 13:00 14:00 15:00 16:00 17:00 18:00 19:00 20:00 21:00 22:00 23:00
FTIR-CHEMLAB
RIGAKU3
KRATOS-XPS
RIE-FLUORINE
SUSS-RCD8
DEKTAK
MIRA-STAN
LASER-DICER
TEM-SW
VACUUM_OVEN-C1…
K70
WITEC-RAMAN
TITAN
NANOSCAN
SUSS-WETBENCH
LAKESHORE
CRYOGENIC
LVEM
WOOLLAM-RC2
CHEMLAB-B1.14
SUSS-MA8
LEICACOAT-NANO
LAURELL-NANO
NANO-ONE-2PP
WOOLLAM-VIS
ULTRACENTRIFUGE
FUMEHOOD…
PARYLENE-SCS
BET-ANAMET
AMBER
UHV-LEEM
UHV-XPS
UHV-PLD
ULTRAFAST-LASER
JASCO
VACUUM-OVEN-B1…
WIRE-BONDER
ZWICK
ZETASIZER
micro-CT-L240
ML3-BABY
LEICACOAT-STAN
HELIOS
VERSALAB
TUBE-FURNACE
BET-DEGASSER
MAGNETRON-AJA
EVAPORATOR
SPONGEBOB
TORNADO-M4
DRIE
ALD-BENEQ
MPS150
Test O2
Test Ondra 3
TEST2
FISCHIONE-160
Test školení
TEST-RFID2
TENUPOL
LEICA-TXP
SW-TRACER
SW-LAB
SW-BEAMER
MECHANICAL…
CEITEC-NANO
STEMI
MIRA-EBL
DIENER
CLR-ISO8-Lab…
RIE-CHLORINE
MINIFLEX
nanoCT
nano-CT
RSA
SNOM-NANONICS
NANOCALC
ICON-SPM
SIMS
SEE-SYSTEM
LaserMIRA
SUMMIT
SHAKER-B1.18
TGA96
TEST-RFID4
LYRA
THEORY-SUPPORT
VUVAS
JAZ3-CHANNEL
NANOWIZARD
APCVD
FTIR
CITOVAC
VACUUM-OVEN-B1…
VISCOMETER
DWL
L450
ARES
APCVD-Diffusion
XEF2
RIGAKU9
microCT
GLOVEBOX…
ALD-FIJI
US-CUTTER
Heliscan
UHV-LEIS
TGA-DISCOVERY
SW-COMSOL
UHV-MBE2
UHV-DEPOSITION
UHV-FTIR
BRILLOUIN
UHV-MBE
ULTRASONIC…
BAMBULAB
UHV-SPM
UHV-CLUSTER
UHV…
UHV…
UHV-PREPARATION
DISCO-DICING…
UHV-MBE1
Q-LAB
ACCURION_RSE
SCIA
ELECTROWORKSHOP
NANOINDENTER
CHEMLAB-B1.16
CHEMLAB-B1.18
IS-NOVOCONTROL
ZEISS-STAN
FISCHIONE-TEM…
R4…
KAUFMAN
IR-RAMAN
LECTROPOL
KEITHLEY-4200
R2-PECVD
RAITH
LIBS-FireFly
FRASCAN
PECVD-NANOFAB
LIBS-LabSys1
FUMEHOOD…
FTIRMAG
FUMEHOOD…
FUMEHOOD-HF
FUMEHOOD…
FUMEHOOD…
FUMEHOOD…
FUMEHOOD…
FUMEHOOD…
VERIOS
CLARUS-680
Micromex
FLOWBOX
micro-CT-m300
DAWN-HELEOS
TEGRAMIN
VNA-MPI
LIBS-Discovery
LITESCOPE-LYRA
RTP
3D-PRUSA-BLACK
NIRQUEST512
CPD
NMR
ZEISS-NANO
MINIEVAP
3D-PRUSA-BLUE
3D-PRUSA-ORANGE
NANOSAM
PARYLENE-DIENER
LEXT
PECVD
MIRKA
SAW-ACCUTOM
SPINCOATER…
4-POINT
NIKON-NANO
TIC3X
LITESCOPE-MIRA…
HENRY-MAGNET
DRYING-OVEN-B1…
LPCVD-polySi
LPCVD-SiN
DIMPLING…
DHR
PROTOMAT
KERR-MICROSCOPE
MAGNETRON
CITOPRESS
SW-CT
CRYOMILL
LABOTOM5
WOOLLAM-MIR
3D-PRUSA-XL
DSC-DISCOVERY
MONOWAVE
UV-LASER
Sanna, Carolina
Sevriugina, Veronika
Lee, Hyesung
Bednaříková, Vendula
Arenas Buelvas, Daina Dayana
de Oliveira Santiago, Pedro Henrique
Čechal, Jan
Šárfy, Pavlína
Šárfy, Pavlína
Baeva, Maria
Supalová, Linda
Baeva, Maria
Petrosyan, Derenik
Supalová, Linda
Liška, Jiří
Potoček, Michal
T Lepcio, Petr
AL Soud, Ammar
Baeva, Maria
Danchuk, Viktor
Ali, Hasan
Ali, Hasan
T Danchuk, Viktor
Danchuk, Viktor
Kolář, Richard
Kolář, Richard
Kotouček, Jan
Kepič, Peter
Podstranská, Ivana
Kolíbalová, Eva
Kovařík, Martin
Citterberg, Daniel
Holcman, Vladimír
Slavíček, Radek
Valadi Palliyalil, Anjali
T Franta, Daniel
Jewula, Pawel
Supalová, Linda
T Švarc, Vojtěch
Krútek, Šimon
Fecko, Peter
Franta, Daniel
Pavliňák, David
Jewula, Pawel
Bajwa, Laiba Asad
E Tmejová, Kateřina
Spousta, Jiří
Hrubá, Daniela
Hrubá, Daniela
T Danchuk, Viktor
Jasenský, Kryštof
T Tmejová, Kateřina
Tichý, Martin
Fecko, Peter
Sevriugina, Veronika
Kotouček, Jan
Kareš, Martin
Baeva, Maria
Kumar, Sanjay
Bensalem, Mohamed
Slavíček, Radek
Havelka, Tomáš
AL Soud, Ammar
Arregi Uribeetxebarria, Jon Ander
Krútek, Šimon
Krútek, Šimon
Daradkeh, Samer
Eliáš, Marek
Mirdamadi Khouzani, Sayed Hossein
Fecko, Peter

Upcoming trainings

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Term Name Description Max. attendees
25.6. 09:30 - 13:00 MIRA-STAN 2/2 Meeting point at the microscope. This is a two-step training, register for part 1 in our booking system. More information about the training is available on our <a href=”https://cfmoodle.ceitec.vutbr.cz/course/view.php?id=76”>Moodle</a>. Attendees: Maria Baeva, DAVIDE MURTAS 2
25.6. 09:30 - 11:00 PECVD - training Attendees: Elisa Cuccu 3
25.6. 13:00 - 17:00 Rigaku 3 - hands on Hands on Nicolò Rossetti, Ph.D. Attendees: Nicolò Rossetti 1
29.6. 09:30 - 13:00 MIRA-STAN 2/2 Meeting point at the microscope. This is a two-step training, register for part 1 in our booking system. More information about the training is available on our <a href=”https://cfmoodle.ceitec.vutbr.cz/course/view.php?id=76”>Moodle</a>. Attendees: Rosmi Vinson 2
30.6. 10:00 - 12:00 ICON-SPM basic training Attendees: Elisa Cuccu, Dimitrios Tsalagkas, Sharmistha Dey 3
1.7. 10:00 - 18:01 UHV-PLD UHV-PLD Part 2 Attendees: Sharmistha Dey 1
2.7. 09:00 - 13:00 KRATOS-XPS Basic training (session 1/2) - max 2 attendees. In case of interest for the training (when it is full) write to josef.polcak@ceitec.vutbr.cz. Attendees: Nikol Kaděrová, Ying Hu, Debika Devi Thongam 2
22.7. 09:30 - 16:30 MIRA-STAN 1/2 Meeting point at the microscope. This is a two-step training, register for part 2 in our booking system. Obligatory prerequisites must be completed 2 days before the training. More information about the training is available on our <a href=”https://cfmoodle.ceitec.vutbr.cz/course/view.php?id=76”>Moodle</a>. Attendees: Ganna Kharchenko, Sharmistha Dey, Debika Devi Thongam 4
23.7. 09:00 - 13:00 Verios_basic (1/2) Verios_basic (1/2): training for new users, demonstration part. Meeting point: entrance to StAn CLR labs (bldg. A, 1st floor). Bring your cleanroom stationery set if you have one. Register one slot for the Verios_basic (2/2) hands-on session to complete the training curriculum. Attendees: Navajsharif Shamshuddin Shaikh, Debika Devi Thongam 3
24.7. 09:00 - 10:30 Verios_basic (2/2) Verios_basic (2/2): hands-on session. Bring your real sample(s) with you. 1
24.7. 10:30 - 12:00 Verios_basic (2/2) Verios_basic (2/2): hands-on session. Bring your real sample(s) with you. 1
24.7. 12:30 - 14:00 Verios_basic (2/2) Verios_basic (2/2): hands-on session. Bring your real sample(s) with you. 1
29.7. 09:30 - 13:00 MIRA-STAN 2/2 Meeting point at the microscope. This is a two-step training, register for part 1 in our booking system. More information about the training is available on our <a href=”https://cfmoodle.ceitec.vutbr.cz/course/view.php?id=76”>Moodle</a>. Attendees: Ganna Kharchenko 2
4.8. 09:00 - 12:00 Verios/Helios_EDS Practical demonstration of EDS analytical system at Verios and Helios. Attendees: Debika Devi Thongam, Kateřina Polášková 3