| 22.6. 09:30 - 12:30 |
FTIR-CHEMLAB
|
Meeting point in Chemlab.
Attendees:
Hyesung
Lee,
Pedro Henrique
de Oliveira Santiago
|
3
|
| 22.6. 10:30 - 11:15 |
Nanofab interview - Meeting room C2.11 or C2.07
|
This interview is mandatory for enrollment to the Safety excursion - Nanofabrication lab.
Join: [HERE](https://teams.microsoft.com/meet/324197360288872?p=8YaxjqMg8zpRrwFFMC )
Meeting ID: 324 197 360 288 872
Access code: hW3qJ6bB
Attendees:
DAVIDE
MURTAS
|
5
|
| 23.6. 09:30 - 12:00 |
DHR 2/2
|
Finish the basic rheology training with a hands-on session.
Attendees:
Carolina
Sanna
|
1
|
| 23.6. 12:15 - 12:50 |
Safety excursion - Advanced Chemical lab
|
Attendees:
Šimon
Krútek,
Debika
Devi Thongam
|
5
|
| 23.6. 13:00 - 13:50 |
Safety excursion - Nanofabrication lab
|
Please enroll in this training only in parallel with the "Nanofab interview."
Do not enroll in training ahead of time, but when you are sure you will be using nanofabrication techniques. It is possible to pass this training anytime during your access additionally (it takes place at least once a month).
Attendees:
DAVIDE
MURTAS
|
5
|
| 23.6. 13:55 - 14:20 |
Safety excursion - Nanocharacterization lab
|
Attendees:
Debika
Devi Thongam,
DAVIDE
MURTAS
|
10
|
| 23.6. 14:25 - 14:55 |
Safety excursion - Structural Analysis
|
Attendees:
Debika
Devi Thongam
|
10
|
| 24.6. 09:30 - 16:30 |
MIRA-STAN 1/2
|
Meeting point at the microscope. This is a two-step training, register for part 2 in our booking system. Obligatory prerequisites must be completed 2 days before the training. More information about the training is available on our <a href=”https://cfmoodle.ceitec.vutbr.cz/course/view.php?id=76”>Moodle</a>.
Attendees:
Maria
Baeva,
Rosmi
Vinson,
DAVIDE
MURTAS
|
4
|
| 24.6. 10:00 - 11:30 |
JASCO training
|
Description of holders and software, basic measurement
Attendees:
Martina
Říhová,
David
Pavliňák
|
2
|
| 24.6. 13:00 - 15:00 |
Leicacoat-NANO training
|
Attendees:
Michela
Sanna,
Samer
Daradkeh
|
2
|
| 25.6. 09:30 - 13:00 |
MIRA-STAN 2/2
|
Meeting point at the microscope. This is a two-step training, register for part 1 in our booking system. More information about the training is available on our <a href=”https://cfmoodle.ceitec.vutbr.cz/course/view.php?id=76”>Moodle</a>.
Attendees:
Maria
Baeva,
DAVIDE
MURTAS
|
2
|
| 30.6. 10:00 - 12:00 |
ICON-SPM basic training
|
Attendees:
Elisa
Cuccu,
Dimitrios
Tsalagkas,
Sharmistha
Dey
|
3
|
| 2.7. 09:00 - 13:00 |
KRATOS-XPS
|
Basic training (session 1/2) - max 2 attendees.
In case of interest for the training (when it is full) write to josef.polcak@ceitec.vutbr.cz.
Attendees:
Nikol
Kaděrová,
Ying
Hu
|
2
|
| 22.7. 09:30 - 16:30 |
MIRA-STAN 1/2
|
Meeting point at the microscope. This is a two-step training, register for part 2 in our booking system. Obligatory prerequisites must be completed 2 days before the training. More information about the training is available on our <a href=”https://cfmoodle.ceitec.vutbr.cz/course/view.php?id=76”>Moodle</a>.
Attendees:
Sharmistha
Dey
|
4
|
| 23.7. 09:00 - 13:00 |
Verios_basic (1/2)
|
Verios_basic (1/2): training for new users, demonstration part. Meeting point: entrance to StAn CLR labs (bldg. A, 1st floor). Bring your cleanroom stationery set if you have one. Register one slot for the Verios_basic (2/2) hands-on session to complete the training curriculum.
Attendees:
Navajsharif Shamshuddin
Shaikh
|
3
|
| 24.7. 09:00 - 10:30 |
Verios_basic (2/2)
|
Verios_basic (2/2): hands-on session. Bring your real sample(s) with you.
|
1
|
| 24.7. 10:30 - 12:00 |
Verios_basic (2/2)
|
Verios_basic (2/2): hands-on session. Bring your real sample(s) with you.
|
1
|
| 24.7. 12:30 - 14:00 |
Verios_basic (2/2)
|
Verios_basic (2/2): hands-on session. Bring your real sample(s) with you.
|
1
|
| 29.7. 09:30 - 13:00 |
MIRA-STAN 2/2
|
Meeting point at the microscope. This is a two-step training, register for part 1 in our booking system. More information about the training is available on our <a href=”https://cfmoodle.ceitec.vutbr.cz/course/view.php?id=76”>Moodle</a>.
|
2
|
| 4.8. 09:00 - 12:00 |
Verios/Helios_EDS
|
Practical demonstration of EDS analytical system at Verios and Helios.
Attendees:
Kateřina
Polášková
|
3
|
KRATOS-XPS
LAURELL-NANO
CLARUS-680