Monday 8.6.2026
CEITEC Nano Research Infrastructure http://nano.ceitec.cz/
0:00 1:00 2:00 3:00 4:00 5:00 6:00 7:00 8:00 9:00 10:00 11:00 12:00 13:00 14:00 15:00 16:00 17:00 18:00 19:00 20:00 21:00 22:00 23:00
UHV-XPS
UHV-SPM
KRATOS-XPS
UHV-PREPARATION
UHV-LEEM
UHV-DEPOSITION
UHV…
UHV-MBE
UHV…
UHV-FTIR
UHV-PLD
TITAN
NANOSAM
AMBER
WOOLLAM-VIS
SEE-SYSTEM
MIRA-STAN
RIE-FLUORINE
SHAKER-B1.18
SUMMIT
LaserMIRA
RIE-CHLORINE
SIMS
MINIFLEX
nanoCT
nano-CT
RSA
MIRA-EBL
ICON-SPM
PARYLENE-SCS
SNOM-NANONICS
NanoOne250
DIENER
PARYLENE-DIENER
NANOSCAN
NIKON-NANO
NIRQUEST512
NMR
ZEISS-NANO
ULTRACENTRIFUGE
3D-PRUSA-BLUE
3D-PRUSA-BLACK
3D-PRUSA-ORANGE
TEM-SW
STEMI
PECVD
MIRKA
SAW-ACCUTOM
SPINCOATER…
Q-LAB
RTP
ACCURION_RSE
RIGAKU3
SUSS-RCD8
NANOCALC
FISCHIONE-160
BET-ANAMET
VUVAS
JASCO
JAZ3-CHANNEL
VACUUM_OVEN-C1…
FTIR-CHEMLAB
FTIR
CITOVAC
VACUUM-OVEN-B1…
VACUUM-OVEN-B1…
VISCOMETER
US-CUTTER
L450
WIRE-BONDER
WITEC-RAMAN
XEF2
RIGAKU9
microCT
ZWICK
ZETASIZER
DWL
ULTRASONIC…
SW-BEAMER
Test školení
SW-LAB
SW-TRACER
LEICA-TXP
TENUPOL
MONOWAVE
Test Ondra 3
Test O2
TEST2
TEST-RFID2
ULTRAFAST-LASER
TGA96
THEORY-SUPPORT
Heliscan
TGA-DISCOVERY
UHV-MBE1
UHV-MBE2
UHV-LEIS
UHV-CLUSTER
CITOPRESS
ML3-BABY
DSC-DISCOVERY
ELECTROWORKSHOP
SW-CT
DRIE
DHR
DIMPLING…
DRYING-OVEN-B1…
RAITH
SPONGEBOB
LECTROPOL
EVAPORATOR
R4…
VERSALAB
FLOWBOX
HELIOS
LYRA
4-POINT
FTIRMAG
FUMEHOOD…
FUMEHOOD-HF
FUMEHOOD…
FUMEHOOD…
FUMEHOOD…
CRYOMILL
TIC3X
FUMEHOOD…
BAMBULAB
MPS150
GLOVEBOX…
ALD-BENEQ
APCVD-Diffusion
ARES
APCVD
NANOWIZARD
ALD-FIJI
DISCO-DICING…
BET-DEGASSER
CPD
BRILLOUIN
TORNADO-M4
MECHANICAL…
CEITEC-NANO
TUBE-FURNACE
CLR-ISO8-Lab…
LEICACOAT-STAN
SW-COMSOL
LEXT
MINIEVAP
FUMEHOOD…
FUMEHOOD…
3D-PRUSA-XL
LAKESHORE
LAURELL-NANO
LIBS-FireFly
LIBS-Discovery
LIBS-LabSys1
LITESCOPE-LYRA
LITESCOPE-MIRA…
SUSS-WETBENCH
LPCVD-polySi
LPCVD-SiN
CRYOGENIC
R2-PECVD
PROTOMAT
LVEM
KERR-MICROSCOPE
HENRY-MAGNET
MAGNETRON
WOOLLAM-RC2
SUSS-MA8
DEKTAK
LABOTOM5
WOOLLAM-MIR
LASER-DICER
KEITHLEY-4200
FUMEHOOD…
LEICACOAT-NANO
CLARUS-680
Micromex
micro-CT-L240
micro-CT-m300
DAWN-HELEOS
TEGRAMIN
VNA-MPI
VERIOS
PECVD-NANOFAB
FRASCAN
K70
NANOINDENTER
CHEMLAB-B1.14
CHEMLAB-B1.16
CHEMLAB-B1.18
IS-NOVOCONTROL
ZEISS-STAN
SCIA
FISCHIONE-TEM…
KAUFMAN
IR-RAMAN
UV-LASER
U Danchuk, Viktor
Hrůza, Dominik
Hrůza, Dominik
U Danchuk, Viktor
Hrůza, Dominik
Hrůza, Dominik
Polčák, Josef
Daradkeh, Samer
Tahsin, Muhammad
U Danchuk, Viktor
Hrůza, Dominik
Hrůza, Dominik
U Danchuk, Viktor
Hrůza, Dominik
Hrůza, Dominik
U Danchuk, Viktor
Hrůza, Dominik
Hrůza, Dominik
U Danchuk, Viktor
U Danchuk, Viktor
U Danchuk, Viktor
U Danchuk, Viktor
U Danchuk, Viktor
Heczko, Milan
U Danchuk, Viktor
T Iakoubovskii, Konstantin
Duchaň, Marek

Upcoming trainings

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Term Name Description Max. attendees
29.5. 08:30 - 11:30 LYRA basic training for MIRA experienced and returning users The training focused on the SEM part of the LYRA system. We will meet in the coffee room next to the user office in the C building. Attendees: Rostislav Řepa 4
29.5. 10:00 - 13:00 DLS-ZetaSizer Part 1+2 This training will provide hands-on practice with basic methods for measuring particle size and zeta potential using the ZetaSizer. The session will cover: -An overview of DLS principles, including light scattering and Brownian motion. -Step-by-step guidance on preparing samples for size and zeta potential measurements. -The use of different measurement cells (e.g., disposable and reusable cuvettes) and their applications for specific types of samples. Practical demonstration of data acquisition, optimization of measurement parameters, and analysis using the Malvern software interface. By the end of the training, participants will gain both theoretical insights and practical expertise in using the Malvern device for comprehensive particle characterization. Attendees: Ying Hu 3
29.5. 12:00 - 14:30 LYRA advanced training (FIB, GIS) for returning users Only for returning users! The training focused on FIB and GIS. We will meet in the LYRA lab. Attendees: Rostislav Řepa 4
2.6. 10:00 - 11:30 BET training: Degassing (1/2) Degassing of the sample (1/2) Attendees: Anjali Valadi Palliyalil, Lucie Žaloudková, Iosif Tantis 4
2.6. 11:30 - 15:00 BET training: measurement (2/2) Standard measurement Attendees: Anjali Valadi Palliyalil, Lucie Žaloudková, Iosif Tantis 4
3.6. 09:30 - 12:30 FTIR-CHEMLAB Meeting point in Chemlab. Attendees: Ying Hu, Iosif Tantis, Carolina Sanna, Debika Devi Thongam 3
4.6. 09:00 - 13:00 KRATOS-XPS Basic training (session 1/2) - max 2 attendees. In case of interest for the training (when it is full) write to josef.polcak@ceitec.vutbr.cz. Attendees: Šimon Formánek, Iosif Tantis 2
8.6. 09:00 - 17:30 Amber Practice Attendees: Rostislav Řepa, Jakub Šťastný 2
9.6. 09:00 - 13:00 Verios_basic (1/2) Verios_basic (1/2): training for new users, demonstration part. Meeting point: entrance to StAn CLR labs (bldg. A, 1st floor). Bring your cleanroom stationery set if you have one. Register one slot for the Verios_basic (2/2) hands-on session to complete the training curriculum. Attendees: Nikol Kaděrová 3
11.6. 09:00 - 10:30 Verios_basic (2/2) Verios_basic (2/2): hands-on session. Bring your real sample(s) with you. Attendees: Nikol Kaděrová 1
11.6. 10:30 - 12:00 Verios_basic (2/2) Verios_basic (2/2): hands-on session. Bring your real sample(s) with you. 1
11.6. 12:30 - 14:00 Verios_basic (2/2) Verios_basic (2/2): hands-on session. Bring your real sample(s) with you. 1
15.6. 09:00 - 13:00 DHR Basic rheology training. Meeting point at the rheometer. Attendees: Amirmohsen Fanisaberi, Carolina Sanna 2