Thursday 4.6.2026
CEITEC Nano Research Infrastructure http://nano.ceitec.cz/
0:00 1:00 2:00 3:00 4:00 5:00 6:00 7:00 8:00 9:00 10:00 11:00 12:00 13:00 14:00 15:00 16:00 17:00 18:00 19:00 20:00 21:00 22:00 23:00
KRATOS-XPS
ML3-BABY
NIKON-NANO
UHV-XPS
UHV-DEPOSITION
UHV-SPM
SUSS-RCD8
UHV-PREPARATION
SUSS-WETBENCH
FUMEHOOD…
FUMEHOOD…
FUMEHOOD…
EVAPORATOR
UHV-LEEM
TITAN
SUSS-MA8
WOOLLAM-VIS
DEKTAK
AMBER
WITEC-RAMAN
MIRA-STAN
ALD-BENEQ
RIGAKU9
SHAKER-B1.18
nano-CT
NANOCALC
RSA
ICON-SPM
MIRA-EBL
SNOM-NANONICS
SUMMIT
PARYLENE-SCS
SIMS
LaserMIRA
SEE-SYSTEM
RIE-FLUORINE
nanoCT
PECVD
NMR
ZEISS-NANO
ULTRACENTRIFUGE
3D-PRUSA-BLUE
3D-PRUSA-BLACK
3D-PRUSA-ORANGE
PARYLENE-DIENER
TEM-SW
MIRKA
MINIFLEX
SAW-ACCUTOM
SPINCOATER…
Q-LAB
RTP
ACCURION_RSE
RIGAKU3
DIENER
BET-ANAMET
RIE-CHLORINE
STEMI
Test O2
SW-BEAMER
VACUUM-OVEN-B1…
US-CUTTER
DWL
JASCO
JAZ3-CHANNEL
VACUUM_OVEN-C1…
FTIR-CHEMLAB
FTIR
CITOVAC
VACUUM-OVEN-B1…
ULTRAFAST-LASER
VUVAS
VISCOMETER
L450
WIRE-BONDER
XEF2
microCT
ZWICK
ZETASIZER
ULTRASONIC…
UHV…
SW-LAB
TGA96
SW-TRACER
LEICA-TXP
TENUPOL
FISCHIONE-160
Test Ondra 3
TEST2
Test školení
TEST-RFID2
THEORY-SUPPORT
UHV…
Heliscan
TGA-DISCOVERY
UHV-MBE1
UHV-MBE2
UHV-FTIR
UHV-LEIS
UHV-MBE
UHV-PLD
UHV-CLUSTER
NIRQUEST512
NanoOne250
NANOSAM
R4…
SW-CT
DRIE
DHR
DIMPLING…
DRYING-OVEN-B1…
RAITH
SPONGEBOB
LECTROPOL
ELECTROWORKSHOP
FLOWBOX
VERSALAB
HELIOS
LYRA
4-POINT
FTIRMAG
FUMEHOOD-HF
FUMEHOOD…
FUMEHOOD…
FUMEHOOD…
FUMEHOOD…
CRYOMILL
TIC3X
CLARUS-680
BET-DEGASSER
MPS150
GLOVEBOX…
APCVD-Diffusion
ARES
APCVD
NANOWIZARD
ALD-FIJI
DISCO-DICING…
BAMBULAB
BRILLOUIN
CPD
TORNADO-M4
MECHANICAL…
CEITEC-NANO
TUBE-FURNACE
CLR-ISO8-Lab…
LEICACOAT-STAN
SW-COMSOL
LEXT
MINIEVAP
FUMEHOOD…
Micromex
NANOSCAN
LVEM
LIBS-Discovery
LIBS-LabSys1
LITESCOPE-LYRA
LITESCOPE-MIRA…
LPCVD-polySi
LPCVD-SiN
LAKESHORE
CRYOGENIC
PROTOMAT
KERR-MICROSCOPE
LAURELL-NANO
HENRY-MAGNET
MAGNETRON
WOOLLAM-RC2
LABOTOM5
WOOLLAM-MIR
3D-PRUSA-XL
DSC-DISCOVERY
MONOWAVE
CITOPRESS
LIBS-FireFly
LASER-DICER
micro-CT-L240
CHEMLAB-B1.14
micro-CT-m300
DAWN-HELEOS
TEGRAMIN
VNA-MPI
VERIOS
PECVD-NANOFAB
LEICACOAT-NANO
FRASCAN
NANOINDENTER
CHEMLAB-B1.16
R2-PECVD
CHEMLAB-B1.18
IS-NOVOCONTROL
ZEISS-STAN
SCIA
FISCHIONE-TEM…
KAUFMAN
IR-RAMAN
K70
KEITHLEY-4200
UV-LASER
T Polčák, Josef
Valiyev, Rasul
Sobola, Dinara
E Zita, Jiří
E Zita, Jiří
D'Angelo, Elena
D'Angelo, Elena
D'Angelo, Elena
E Zita, Jiří
D'Angelo, Elena
E Zita, Jiří
E Zita, Jiří
E Zita, Jiří
E Zita, Jiří
E Zita, Jiří
D'Angelo, Elena
Michalička, Jan
E Zita, Jiří
Duchaň, Marek
E Zita, Jiří
Kolíbalová, Eva
Konečný, Martin
Konečná, Tereza
Eliáš, Marek
Lukiienko, Iryna

Upcoming trainings

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Term Name Description Max. attendees
28.5. 09:00 - 11:00 LVEM_basic (2/2) Hands-on session Attendees: Anjali Valadi Palliyalil, Debika Devi Thongam 1
28.5. 09:30 - 12:00 Zwick - Oven Training is focused on measuring mechanical properties at elevated temperatures using the oven. Attendees: Hongbo Fu 2
28.5. 12:00 - 14:00 LVEM_basic (2/2) Hands-on session 1
28.5. 13:30 - 16:30 Evaporator EN Standard training in English Attendees: Derenik Petrosyan, Šimon Krútek, Helena Šimůnková 3
29.5. 08:30 - 11:30 LYRA basic training for MIRA experienced and returning users The training focused on the SEM part of the LYRA system. We will meet in the coffee room next to the user office in the C building. Attendees: Rostislav Řepa 4
29.5. 10:00 - 13:00 DLS-ZetaSizer Part 1+2 This training will provide hands-on practice with basic methods for measuring particle size and zeta potential using the ZetaSizer. The session will cover: -An overview of DLS principles, including light scattering and Brownian motion. -Step-by-step guidance on preparing samples for size and zeta potential measurements. -The use of different measurement cells (e.g., disposable and reusable cuvettes) and their applications for specific types of samples. Practical demonstration of data acquisition, optimization of measurement parameters, and analysis using the Malvern software interface. By the end of the training, participants will gain both theoretical insights and practical expertise in using the Malvern device for comprehensive particle characterization. Attendees: Ying Hu 3
29.5. 12:00 - 14:30 LYRA advanced training (FIB, GIS) for returning users Only for returning users! The training focused on FIB and GIS. We will meet in the LYRA lab. Attendees: Rostislav Řepa 4
2.6. 10:00 - 11:30 BET training: Degassing (1/2) Degassing of the sample (1/2) Attendees: Anjali Valadi Palliyalil, Lucie Žaloudková, Iosif Tantis 4
2.6. 11:30 - 15:00 BET training: measurement (2/2) Standard measurement Attendees: Anjali Valadi Palliyalil, Lucie Žaloudková, Iosif Tantis 4
3.6. 09:30 - 12:30 FTIR-CHEMLAB Meeting point in Chemlab. Attendees: Ying Hu, Iosif Tantis, Carolina Sanna, Debika Devi Thongam 3
4.6. 09:00 - 13:00 KRATOS-XPS Basic training (session 1/2) - max 2 attendees. In case of interest for the training (when it is full) write to josef.polcak@ceitec.vutbr.cz. Attendees: Šimon Formánek, Iosif Tantis 2
8.6. 09:00 - 17:30 Amber Practice Attendees: Rostislav Řepa, Jakub Šťastný 2
9.6. 09:00 - 13:00 Verios_basic (1/2) Verios_basic (1/2): training for new users, demonstration part. Meeting point: entrance to StAn CLR labs (bldg. A, 1st floor). Bring your cleanroom stationery set if you have one. Register one slot for the Verios_basic (2/2) hands-on session to complete the training curriculum. Attendees: Nikol Kaděrová 3
11.6. 09:00 - 10:30 Verios_basic (2/2) Verios_basic (2/2): hands-on session. Bring your real sample(s) with you. Attendees: Nikol Kaděrová 1
11.6. 10:30 - 12:00 Verios_basic (2/2) Verios_basic (2/2): hands-on session. Bring your real sample(s) with you. 1
11.6. 12:30 - 14:00 Verios_basic (2/2) Verios_basic (2/2): hands-on session. Bring your real sample(s) with you. 1
15.6. 09:00 - 13:00 DHR Basic rheology training. Meeting point at the rheometer. Attendees: Amirmohsen Fanisaberi, Carolina Sanna 2