Tuesday 2.6.2026
CEITEC Nano Research Infrastructure http://nano.ceitec.cz/
0:00 1:00 2:00 3:00 4:00 5:00 6:00 7:00 8:00 9:00 10:00 11:00 12:00 13:00 14:00 15:00 16:00 17:00 18:00 19:00 20:00 21:00 22:00 23:00
MIRA-STAN
BET-DEGASSER
ICON-SPM
UHV-DEPOSITION
LEICACOAT-STAN
VERSALAB
LITESCOPE-MIRA…
HELIOS
UHV-LEEM
UHV-PREPARATION
TITAN
UHV-LEIS
WITEC-RAMAN
AMBER
RIGAKU9
KRATOS-XPS
ALD-BENEQ
WOOLLAM-VIS
BET-ANAMET
RSA
MIRA-EBL
NanoOne250
LaserMIRA
SNOM-NANONICS
PARYLENE-SCS
SIMS
SEE-SYSTEM
nanoCT
SUMMIT
SHAKER-B1.18
NANOCALC
STEMI
nano-CT
SUSS-RCD8
MINIFLEX
PECVD
NIRQUEST512
NMR
ZEISS-NANO
ULTRACENTRIFUGE
3D-PRUSA-BLUE
3D-PRUSA-BLACK
3D-PRUSA-ORANGE
PARYLENE-DIENER
TEM-SW
MIRKA
RIE-CHLORINE
SAW-ACCUTOM
SPINCOATER…
Q-LAB
RTP
ACCURION_RSE
RIGAKU3
SW-LAB
DIENER
RIE-FLUORINE
SW-BEAMER
Test O2
SW-TRACER
VACUUM-OVEN-B1…
US-CUTTER
DWL
JASCO
JAZ3-CHANNEL
VACUUM_OVEN-C1…
FTIR-CHEMLAB
FTIR
CITOVAC
VACUUM-OVEN-B1…
ULTRAFAST-LASER
VUVAS
VISCOMETER
L450
WIRE-BONDER
XEF2
microCT
ZWICK
ZETASIZER
ULTRASONIC…
UHV…
LEICA-TXP
THEORY-SUPPORT
TENUPOL
FISCHIONE-160
Test Ondra 3
NANOSAM
TEST2
Test školení
TEST-RFID2
TGA96
Heliscan
UHV…
TGA-DISCOVERY
UHV-MBE1
UHV-MBE2
UHV-FTIR
UHV-MBE
UHV-XPS
UHV-PLD
UHV-SPM
UHV-CLUSTER
NIKON-NANO
ML3-BABY
NANOSCAN
LYRA
DIMPLING…
DRYING-OVEN-B1…
RAITH
SPONGEBOB
LECTROPOL
EVAPORATOR
ELECTROWORKSHOP
R4…
FLOWBOX
4-POINT
DRIE
FTIRMAG
FUMEHOOD…
FUMEHOOD-HF
FUMEHOOD…
FUMEHOOD…
FUMEHOOD…
FUMEHOOD…
FUMEHOOD…
FUMEHOOD…
DHR
SW-CT
CLARUS-680
BRILLOUIN
MPS150
GLOVEBOX…
APCVD-Diffusion
ARES
APCVD
NANOWIZARD
ALD-FIJI
DISCO-DICING…
BAMBULAB
TORNADO-M4
CRYOMILL
MECHANICAL…
CEITEC-NANO
TUBE-FURNACE
CLR-ISO8-Lab…
SW-COMSOL
LEXT
MINIEVAP
CPD
TIC3X
FUMEHOOD…
Micromex
CITOPRESS
KERR-MICROSCOPE
LIBS-LabSys1
LITESCOPE-LYRA
SUSS-WETBENCH
LPCVD-polySi
LPCVD-SiN
LAKESHORE
CRYOGENIC
PROTOMAT
LVEM
HENRY-MAGNET
LIBS-FireFly
MAGNETRON
WOOLLAM-RC2
SUSS-MA8
DEKTAK
LABOTOM5
WOOLLAM-MIR
3D-PRUSA-XL
DSC-DISCOVERY
MONOWAVE
LIBS-Discovery
LAURELL-NANO
micro-CT-L240
CHEMLAB-B1.14
micro-CT-m300
DAWN-HELEOS
TEGRAMIN
VNA-MPI
VERIOS
PECVD-NANOFAB
LEICACOAT-NANO
FRASCAN
NANOINDENTER
CHEMLAB-B1.16
LASER-DICER
CHEMLAB-B1.18
IS-NOVOCONTROL
ZEISS-STAN
SCIA
FISCHIONE-TEM…
KAUFMAN
IR-RAMAN
K70
KEITHLEY-4200
R2-PECVD
UV-LASER
Pavliňák, David
Říhová, Martina
Havlíková, Tereza
Ulč, Filip
T Tmejová, Kateřina
Tmejová, Kateřina
B Gablech, Evelína
Endstrasser, Zdeněk
Havlíková, Tereza
Klimek, Jan
Ulč, Filip
Kicmerova, Dina
Endstrasser, Zdeněk
Endstrasser, Zdeněk
S Michalička, Jan
E Průša, Stanislav
Chamradová, Ivana
S Iakoubovskii, Konstantin
Slavíček, Radek
Varaďa, Jan
BUI, Thanh Lam
Duchaň, Marek
T Tmejová, Kateřina

Upcoming trainings

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Term Name Description Max. attendees
28.5. 09:00 - 11:00 LVEM_basic (2/2) Hands-on session Attendees: Anjali Valadi Palliyalil, Debika Devi Thongam 1
28.5. 09:30 - 12:00 Zwick - Oven Training is focused on measuring mechanical properties at elevated temperatures using the oven. Attendees: Hongbo Fu 2
28.5. 12:00 - 14:00 LVEM_basic (2/2) Hands-on session 1
28.5. 13:30 - 26.5. 16:30 Evaporator EN Standard training in English Attendees: Derenik Petrosyan, Šimon Krútek, Helena Šimůnková 3
29.5. 08:30 - 11:30 LYRA basic training for MIRA experienced and returning users The training focused on the SEM part of the LYRA system. We will meet in the coffee room next to the user office in the C building. Attendees: Rostislav Řepa 4
29.5. 10:00 - 13:00 DLS-ZetaSizer Part 1+2 This training will provide hands-on practice with basic methods for measuring particle size and zeta potential using the ZetaSizer. The session will cover: -An overview of DLS principles, including light scattering and Brownian motion. -Step-by-step guidance on preparing samples for size and zeta potential measurements. -The use of different measurement cells (e.g., disposable and reusable cuvettes) and their applications for specific types of samples. Practical demonstration of data acquisition, optimization of measurement parameters, and analysis using the Malvern software interface. By the end of the training, participants will gain both theoretical insights and practical expertise in using the Malvern device for comprehensive particle characterization. Attendees: Ying Hu 3
29.5. 12:00 - 14:30 LYRA advanced training (FIB, GIS) for returning users Only for returning users! The training focused on FIB and GIS. We will meet in the LYRA lab. Attendees: Rostislav Řepa 4
2.6. 10:00 - 11:30 BET training: Degassing (1/2) Degassing of the sample (1/2) Attendees: Anjali Valadi Palliyalil, Lucie Žaloudková, Iosif Tantis 4
2.6. 11:30 - 15:00 BET training: measurement (2/2) Standard measurement Attendees: Anjali Valadi Palliyalil, Lucie Žaloudková, Iosif Tantis 4
3.6. 09:30 - 12:30 FTIR-CHEMLAB Meeting point in Chemlab. Attendees: Ying Hu, Iosif Tantis, Carolina Sanna, Debika Devi Thongam 3
4.6. 09:00 - 13:00 KRATOS-XPS Basic training (session 1/2) - max 2 attendees. In case of interest for the training (when it is full) write to josef.polcak@ceitec.vutbr.cz. Attendees: Šimon Formánek, Iosif Tantis 2
8.6. 09:00 - 17:30 Amber Practice Attendees: Rostislav Řepa, Jakub Šťastný 2
9.6. 09:00 - 13:00 Verios_basic (1/2) Verios_basic (1/2): training for new users, demonstration part. Meeting point: entrance to StAn CLR labs (bldg. A, 1st floor). Bring your cleanroom stationery set if you have one. Register one slot for the Verios_basic (2/2) hands-on session to complete the training curriculum. Attendees: Nikol Kaděrová 3
11.6. 09:00 - 10:30 Verios_basic (2/2) Verios_basic (2/2): hands-on session. Bring your real sample(s) with you. Attendees: Nikol Kaděrová 1
11.6. 10:30 - 12:00 Verios_basic (2/2) Verios_basic (2/2): hands-on session. Bring your real sample(s) with you. 1
11.6. 12:30 - 14:00 Verios_basic (2/2) Verios_basic (2/2): hands-on session. Bring your real sample(s) with you. 1
15.6. 09:00 - 13:00 DHR Basic rheology training. Meeting point at the rheometer. Attendees: Amirmohsen Fanisaberi, Carolina Sanna 2