Thursday 26.3.2026
CEITEC Nano Research Infrastructure http://nano.ceitec.cz/
0:00 1:00 2:00 3:00 4:00 5:00 6:00 7:00 8:00 9:00 10:00 11:00 12:00 13:00 14:00 15:00 16:00 17:00 18:00 19:00 20:00 21:00 22:00 23:00
WITEC-RAMAN
MIRA-STAN
VERIOS
KRATOS-XPS
HELIOS
RIGAKU9
ML3-BABY
STEMI
CRYOGENIC
BET-ANAMET
UHV-SPM
DIENER
EVAPORATOR
UHV-XPS
RIE-FLUORINE
SUSS-WETBENCH
LYRA
UHV-LEEM
UHV-PREPARATION
UHV-DEPOSITION
MIRA-EBL
ICON-SPM
TEGRAMIN
AMBER
TITAN
LVEM
RAITH
NANOSAM
WOOLLAM-VIS
WOOLLAM-RC2
DEKTAK
VACUUM_OVEN-C1…
LEICACOAT-STAN
FTIR
TUBE-FURNACE
VUVAS
RIGAKU3
SIMS
SEE-SYSTEM
LaserMIRA
PARYLENE-DIENER
SUMMIT
3D-PRUSA-ORANGE
TEM-SW
SHAKER-B1.18
3D-PRUSA-BLACK
NANOCALC
PARYLENE-SCS
nano-CT
SNOM-NANONICS
PECVD
RSA
ACCURION_RSE
nanoCT
MINIFLEX
MIRKA
SAW-ACCUTOM
RIE-CHLORINE
SPINCOATER…
Q-LAB
RTP
SUSS-RCD8
3D-PRUSA-XL
Test Ondra 3
SW-BEAMER
CITOVAC
ULTRAFAST-LASER
ULTRASONIC…
US-CUTTER
DWL
JASCO
JAZ3-CHANNEL
FTIR-CHEMLAB
VACUUM_OVEN-B1…
UHV…
VACUUM_OVEN-B1…
VISCOMETER
L450
WIRE-BONDER
XEF2
microCT
ZWICK
ZETASIZER
UHV…
UHV-CLUSTER
SW-LAB
TEST-RFID2
SW-TRACER
LEICA-TXP
TENUPOL
FISCHIONE-160
ULTRACENTRIFUGE
Test O2
TEST2
Test školení
TGA96
UHV-PLD
THEORY-SUPPORT
Heliscan
TGA-DISCOVERY
UHV-MBE2
UHV-MBE1
UHV-FTIR
UHV-LEIS
UHV-MBE
3D-PRUSA-BLUE
MONOWAVE
ZEISS-NANO
FLOWBOX
DRIE
DHR
DIMPLING…
DRYING_OVEN-B1…
SPONGEBOB
LECTROPOL
ELECTROWORKSHOP
R4…
4-POINT
CRYOMILL
FTIRMAG
FUMEHOOD…
FUMEHOOD-HF
FUMEHOOD…
FUMEHOOD…
FUMEHOOD…
FUMEHOOD…
FUMEHOOD…
SW-CT
VERSALAB
Micromex
BAMBULAB
GLOVEBOX…
ALD-BENEQ
APCVD-Diffusion
ARES
APCVD
NANOWIZARD
ALD-FIJI
DISCO-DICING…
BET-DEGASSER
TIC3X
BRILLOUIN
TORNADO-M4
MECHANICAL…
CEITEC-NANO
CLR-ISO8-Lab…
SW-COMSOL
LEXT
MINIEVAP
CPD
CLARUS-680
micro-CT-L240
NMR
MAGNETRON
LITESCOPE-LYRA
LITESCOPE-MIRA…
LPCVD-polySi
LPCVD-SiN
LAKESHORE
PROTOMAT
KERR-MICROSCOPE
HENRY-MAGNET
SUSS-MA8
LIBS-Discovery
LABOTOM5
WOOLLAM-MIR
DSC-DISCOVERY
MPS150
CITOPRESS
NANOSCAN
NIKON-NANO
NIRQUEST512
LIBS-LabSys1
LIBS-FireFly
micro-CT-m300
CHEMLAB-B1.18
DAWN-HELEOS
VNA-MPI
PECVD-NANOFAB
LEICACOAT-NANO
FRASCAN
NANOINDENTER
CHEMLAB-B1.14
CHEMLAB-B1.16
IS_NOVOCONTROL
LAURELL-NANO
ZEISS-STAN
SCIA
FISCHIONE-TEM…
KAUFMAN
IR-RAMAN
K70
KEITHLEY-4200
R2-PECVD
LASER-DICER
UV-LASER
Bakhshikhah, Mahan
Janoušek, Tomáš
Janoušek, Tomáš
paiva de araujo, Estacio
Kovařík, Martin
Pavliňák, David
Thekkedath Madhu, Nikhil
Havlíková, Tereza
Thekkedath Madhu, Nikhil
Pišťák, Jan
Lukiienko, Iryna
Pathak, Saurabh
Pavliňák, David
Tahsin, Muhammad
Tran, Quynh Nhu Thi
Bahadur, Fateh
Slavíček, Radek
Arregi Uribeetxebarria, Jon Ander
Krajíčková, Kateřina
Krajíčková, Kateřina
Šárfy, Pavlína
Slavíček, Radek
Tmejová, Kateřina
Hrůza, Dominik
Bokaei Khelejan, Hatef
Bokaei Khelejan, Hatef
U Polčák, Josef
Lukiienko, Iryna
Krajíčková, Kateřina
T Šamořil, Tomáš
Endstrasser, Zdeněk
Endstrasser, Zdeněk
Endstrasser, Zdeněk
Jasenský, Kryštof
Janůšová, Martina
Rotter, Marek
Kicmerova, Dina
T Michalička, Jan
S Kolíbalová, Eva
Lišková, Zuzana
Danchuk, Viktor
Franta, Daniel
Přibyl, Roman
Krajíčková, Kateřina
Slavíček, Radek
Pavliňák, David
E Münz, Filip
Kepič, Peter
Přibyl, Roman

Upcoming trainings

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Term Name Description Max. attendees
24.3. 09:00 - 13:00 Verios_basic (1/2) Verios_basic (1/2): training for new users, demonstration part. Meeting point: entrance to StAn CLR labs (bldg. A, 1st floor). Bring your cleanroom stationery set if you have one. Register one slot for the Verios_basic (2/2) hands-on session to complete the training curriculum. Attendees: Jan Klíma, Radim Slovák, Hasan Ali, Tomáš Janoušek 3
24.3. 09:00 - 17:30 Amber Meeting point at the microscope. Attendees: Adam Očkovič 4
24.3. 09:30 - 12:00 ALD-Beneq-training Attendees: Jozef Štálnik, Derenik Petrosyan 3
24.3. 12:15 - 12:50 Safety excursion Chem lab The Moodle course, Advanced Chemical Laboratory is MANDATORY for the Safety Excursion. https://cfmoodle.ceitec.vutbr.cz/course/index.php?categoryid=48. It must be finished 2 work days before the excursion. Attendees: Areej Fatima, Šimon Formánek, Rasul Valiyev, David Jonathan Walcher 5
24.3. 13:00 - 13:50 Safety excursion - Nanofabrication lab Please enroll in this training only in parallel with the "Nanofab interview." Do not enroll in training ahead of time, but when you are sure you will be using nanofabrication techniques. It is possible to pass this training anytime during your access additionally (it takes place at least once a month). Attendees: Šimon Formánek, David Jonathan Walcher 5
24.3. 13:00 - 15:00 ICON-SPM basic training Do not sign up for this training, this is extra training for request. Thank you. Attendees: Daniel Franta 1
24.3. 13:55 - 14:20 Safety excursion - Nanocharacterization lab Attendees: Petr Pazourek, Šimon Formánek, Rasul Valiyev, David Jonathan Walcher 10
24.3. 14:25 - 14:55 Safety excursion - StAn lab Attendees: Petr Pazourek, Ondrej Kubinec, Šimon Formánek, David Jonathan Walcher 10
24.3. 15:00 - 17:00 Woollam RC2 Second part of training Attendees: Beáta Kavcová 1
25.3. 09:00 - 10:30 Verios_basic (2/2) Verios_basic (2/2): hands-on session. Bring your real sample(s) with you. Attendees: Tomáš Janoušek 1
25.3. 10:30 - 12:00 Verios_basic (2/2) Verios_basic (2/2): hands-on session. Bring your real sample(s) with you. Attendees: Radim Slovák 1
25.3. 12:30 - 14:00 Verios_basic (2/2) Verios_basic (2/2): hands-on session. Bring your real sample(s) with you. Attendees: Jan Klíma 1
27.3. 09:00 - 13:00 KRATOS-XPS Basic training (session 1/2) - max 2 attendees. In case of interest for the training (when it is full) write to josef.polcak@ceitec.vutbr.cz. Attendees: Grigory Mathew, Sujan Maity 2
27.3. 09:30 - 16:30 MIRA-STAN 1/2 Meeting point at the microscope. This is a two-step training, register for part 2 in our booking system. Obligatory prerequisites must be completed 2 days before the training. More information about the training is available on our <a href=”https://cfmoodle.ceitec.vutbr.cz/course/view.php?id=76”>Moodle</a>. Attendees: Carolina Oliver Urrutia, Ondrej Kubinec 4
27.3. 10:00 - 12:00 Witec-Raman in front of user office Attendees: Lucie Žaloudková 4
16.4. 09:30 - 11:30 MIRA-STAN - EDS detector Only for users with an active MIRA-STAN certificate. Meeting point at the microscope. Attendees: Aida Fazlič 4