Wednesday 18.3.2026
CEITEC Nano Research Infrastructure http://nano.ceitec.cz/
0:00 1:00 2:00 3:00 4:00 5:00 6:00 7:00 8:00 9:00 10:00 11:00 12:00 13:00 14:00 15:00 16:00 17:00 18:00 19:00 20:00 21:00 22:00 23:00
RIE-FLUORINE
SUSS-WETBENCH
VERIOS
DEKTAK
MIRA-STAN
EVAPORATOR
ICON-SPM
MIRA-EBL
VERSALAB
LEICACOAT-STAN
WITEC-RAMAN
RIGAKU3
ML3-BABY
ALD-FIJI
KERR-MICROSCOPE
AMBER
ALD-BENEQ
NANOSAM
KRATOS-XPS
FTIR-CHEMLAB
RIGAKU9
LYRA
L450
WOOLLAM-RC2
SIMS
LEICACOAT-NANO
UHV-SPM
FUMEHOOD-HF
NANOCALC
UHV-DEPOSITION
UHV-LEEM
UHV-XPS
FUMEHOOD…
HENRY-MAGNET
VNA-MPI
SUSS-MA8
LVEM
TITAN
HELIOS
LIBS-FireFly
R2-PECVD
KEITHLEY-4200
LEICA-TXP
BET-DEGASSER
TORNADO-M4
MECHANICAL…
LITESCOPE-LYRA
ZEISS-NANO
WOOLLAM-VIS
FTIR
SCIA
SW-CT
CRYOGENIC
RAITH
SPONGEBOB
ULTRAFAST-LASER
UHV-PREPARATION
BET-ANAMET
STEMI
SHAKER-B1.18
3D-PRUSA-XL
PARYLENE-SCS
SUMMIT
LaserMIRA
SEE-SYSTEM
SNOM-NANONICS
RSA
nano-CT
nanoCT
MINIFLEX
RIE-CHLORINE
DIENER
SUSS-RCD8
ACCURION_RSE
SW-BEAMER
Heliscan
SW-LAB
VACUUM_OVEN-B1…
ULTRASONIC…
US-CUTTER
DWL
JASCO
JAZ3-CHANNEL
VACUUM_OVEN-C1…
CITOVAC
VACUUM_OVEN-B1…
UHV…
VUVAS
VISCOMETER
WIRE-BONDER
XEF2
microCT
ZWICK
ZETASIZER
UHV…
UHV-CLUSTER
SW-TRACER
TGA96
TENUPOL
FISCHIONE-160
Test Ondra 3
Test O2
TEST2
Test školení
TEST-RFID2
THEORY-SUPPORT
UHV-PLD
Q-LAB
TGA-DISCOVERY
UHV-MBE2
UHV-MBE1
UHV-FTIR
UHV-LEIS
UHV-MBE
RTP
MONOWAVE
SPINCOATER…
FUMEHOOD…
DRYING_OVEN-B1…
LECTROPOL
ELECTROWORKSHOP
R4…
FLOWBOX
4-POINT
FTIRMAG
FUMEHOOD…
DHR
FUMEHOOD…
FUMEHOOD…
FUMEHOOD…
CLARUS-680
Micromex
micro-CT-L240
micro-CT-m300
DIMPLING…
DRIE
TEGRAMIN
BRILLOUIN
GLOVEBOX…
APCVD-Diffusion
ARES
APCVD
NANOWIZARD
DISCO-DICING…
BAMBULAB
CEITEC-NANO
CRYOMILL
TUBE-FURNACE
CLR-ISO8-Lab…
SW-COMSOL
LEXT
MINIEVAP
CPD
TIC3X
DAWN-HELEOS
PECVD-NANOFAB
SAW-ACCUTOM
NMR
WOOLLAM-MIR
DSC-DISCOVERY
MPS150
CITOPRESS
NANOSCAN
NIKON-NANO
NIRQUEST512
ULTRACENTRIFUGE
MAGNETRON
3D-PRUSA-BLUE
3D-PRUSA-BLACK
3D-PRUSA-ORANGE
PARYLENE-DIENER
TEM-SW
PECVD
MIRKA
LABOTOM5
PROTOMAT
FRASCAN
KAUFMAN
NANOINDENTER
CHEMLAB-B1.14
CHEMLAB-B1.16
CHEMLAB-B1.18
IS_NOVOCONTROL
ZEISS-STAN
FISCHIONE-TEM…
IR-RAMAN
LAKESHORE
K70
LASER-DICER
LAURELL-NANO
LIBS-Discovery
LIBS-LabSys1
LITESCOPE-MIRA…
LPCVD-polySi
LPCVD-SiN
UV-LASER
Baeva, Maria
Majcen, Fabian
Lukiienko, Iryna
Koňařík, Lukáš
Petrosyan, Derenik
Krčma, Jakub
Štálnik, Jozef
Baeva, Maria
Kratochvílová, Ivana
Bajwa, Laiba Asad
Majcen, Fabian
Weisz, Hugo
Štálnik, Jozef
Petrosyan, Derenik
T Kicmerova, Dina
Burda, Daniel
Surana, Karan Singh
Lukiienko, Iryna
Lukiienko, Iryna
Lukiienko, Iryna
Lukiienko, Iryna
Švarc, Vojtěch
Daradkeh, Samer
Supalová, Linda
Fecko, Peter
Fu, Hongbo
Supalová, Linda
Burda, Daniel
Klíma, Jan
Kovařík, Martin
Bahadur, Fateh
Bakhshikhah, Mahan
Majcen, Fabian
Weisz, Hugo
Klíma, Jan
Tichý, Martin
Daradkeh, Samer
Tichý, Martin
Jyoti, Jyoti
Pathak, Saurabh
Fu, Hongbo
Bakhshikhah, Mahan
Liška, Jiří
Janoušek, Tomáš
Bednaříková, Vendula
Drotárová, Lenka
Mathew, Grigory
Baeva, Maria
Kratochvílová, Ivana
Petrosyan, Derenik
Eliáš, Marek
Štálnik, Jozef
Štálnik, Jozef
Arregi Uribeetxebarria, Jon Ander
Otýpka, Martin
Iakoubovskii, Konstantin
S Iakoubovskii, Konstantin
U Eliáš, Marek
Eliáš, Marek
Danchuk, Viktor
Kumar, Sanjay
Fatima, Areej
Kelarová, Štěpánka
Sevriugina, Veronika
Kalleshappa, Bindu
Varshney, Devanshu
Caha, Ondřej
Fecko, Peter
Dvořák, Petr
Slovák, Vojtěch
Slovák, Vojtěch
Slovák, Radim
T Danchuk, Viktor
Fecko, Peter
Hrůza, Dominik
Fecko, Peter
Švarc, Vojtěch
Hrůza, Dominik
Hrůza, Dominik
Hrůza, Dominik
U Jewula, Pawel
Urbánek, Michal
Urbánek, Michal
Bajwa, Laiba Asad
S Kolíbalová, Eva
S Michalička, Jan
T Man, Ondřej
Vaňková, Karolína
Beliančínová, Beáta
Patil, Virendra
Man, Ondřej
E Tmejová, Kateřina
Arregi Uribeetxebarria, Jon Ander
Varga, Dominik
Dvořák, Petr
Krčma, Jakub
Franta, Daniel
Liška, Jiří
Štálnik, Jozef
Kareš, Martin
S Danchuk, Viktor
Lišková, Zuzana
Jakešová, Marie
Arregi Uribeetxebarria, Jon Ander
Hrůza, Dominik

Upcoming trainings

Show more

Term Name Description Max. attendees
25.3. 09:00 - 10:30 Verios_basic (2/2) Verios_basic (2/2): hands-on session. Bring your real sample(s) with you. Attendees: Tomáš Janoušek 1
25.3. 10:30 - 12:00 Verios_basic (2/2) Verios_basic (2/2): hands-on session. Bring your real sample(s) with you. Attendees: Radim Slovák 1
25.3. 12:30 - 14:00 Verios_basic (2/2) Verios_basic (2/2): hands-on session. Bring your real sample(s) with you. Attendees: Jan Klíma 1
27.3. 09:00 - 13:00 KRATOS-XPS Basic training (session 1/2) - max 2 attendees. In case of interest for the training (when it is full) write to josef.polcak@ceitec.vutbr.cz. Attendees: Grigory Mathew, Sujan Maity 2
27.3. 09:30 - 16:30 MIRA-STAN 1/2 Meeting point at the microscope. This is a two-step training, register for part 2 in our booking system. Obligatory prerequisites must be completed 2 days before the training. More information about the training is available on our <a href=”https://cfmoodle.ceitec.vutbr.cz/course/view.php?id=76”>Moodle</a>. Attendees: Carolina Oliver Urrutia, Ondrej Kubinec 4
27.3. 10:00 - 12:00 Witec-Raman in front of user office Attendees: Lucie Žaloudková, Helena Šimůnková 4
9.4. 09:00 - 12:00 Verios/Helios_EDS Practical demonstration of EDS analytical system at Verios and Helios. Attendees: Tomáš Janoušek 3
16.4. 09:30 - 11:30 MIRA-STAN - EDS detector Only for users with an active MIRA-STAN certificate. Meeting point at the microscope. Attendees: Aida Fazlič 4