Monday 2.2.2026
CEITEC Nano Research Infrastructure http://nano.ceitec.cz/
0:00 1:00 2:00 3:00 4:00 5:00 6:00 7:00 8:00 9:00 10:00 11:00 12:00 13:00 14:00 15:00 16:00 17:00 18:00 19:00 20:00 21:00 22:00 23:00
UHV-PREPARATION
UHV-LEEM
UHV-XPS
EVAPORATOR
UHV…
UHV…
UHV-SPM
MIRA-STAN
UHV-MBE
VERIOS
DWL
UHV-DEPOSITION
DIENER
CLARUS-680
NANOSAM
TITAN
UHV-FTIR
UHV-PLD
KRATOS-XPS
MAGNETRON
RIGAKU9
CRYOGENIC
WOOLLAM-VIS
nano-CT
RSA
MIRA-EBL
SNOM-NANONICS
ICON-SPM
PARYLENE-SCS
NMR
MINIFLEX
SIMS
SEE-SYSTEM
LaserMIRA
SUMMIT
SHAKER…
NIRQUEST512
nanoCT
SAW-ACCUTOM
RIE-CHLORINE
PARYLENE-DIENER
MIRKA
Q-LAB
RTP
PECVD
TEM-SW
ACCURION_RSE
3D-PRUSA-ORANGE
RIE-FLUORINE
3D-PRUSA-BLACK
RIGAKU3
3D-PRUSA-BLUE
ULTRACENTRIFUGE
ZEISS-NANO
SUSS-RCD8
SPINCOATER…
MPS150
FISCHIONE-160
NANOCALC
VACUUM_OVEN-B1…
US-CUTTER
JASCO
JAZ3-CHANNEL
VACUUM_OVEN-C1…
FTIR-CHEMLAB
FTIR
CITOVAC
VUVAS
UHV-CLUSTER
VISCOMETER
L450
WIRE-BONDER
WITEC-RAMAN
XEF2
microCT
ZWICK
ZETASIZER
ULTRAFAST-LASER
UHV-LEIS
STEMI
Test Ondra 3
BET-ANAMET
SW-BEAMER
SW-LAB
SW-TRACER
LEICA-TXP
TENUPOL
AMBER
Test O2
UHV-MBE1
TEST2
Test školení
TEST-RFID2
TGA96
THEORY-SUPPORT
Heliscan
TGA-DISCOVERY
UHV-MBE2
NIKON-NANO
DSC-DISCOVERY
NANOSCAN
ELECTROWORKSHOP
SW-CT
DRIE
DHR
DIMPLING…
DRYING_OVEN-B1…
RAITH
SPONGEBOB
LECTROPOL
R4…
VERSALAB
FLOWBOX
HELIOS
LYRA
4-POINT
FTIRMAG
FUMEHOOD…
FUMEHOOD-HF
FUMEHOOD…
FUMEHOOD…
CRYOMILL
TIC3X
FUME_HOOD-B1.18
VACUUM_OVEN…
ALD-BENEQ
APCVD-Diffusion
ARES
APCVD
NANOWIZARD
ALD-FIJI
DISCO-DICING…
BAMBULAB
BET-DEGASSER
BRILLOUIN
CPD
TORNADO-M4
MECHANICAL…
CEITEC-NANO
TUBE-FURNACE
CLR-ISO8-Lab…
LEICACOAT-STAN
SW-COMSOL
LEXT
MINIEVAP
FUME_HOOD-B1.14
Micromex
CITOPRESS
LVEM
LIBS-Discovery
LIBS-LabSys1
LITESCOPE-LYRA
LITESCOPE-MIRA…
SUSS-WETBENCH
LPCVD-polySi
LPCVD-SiN
LAKESHORE
PROTOMAT
KERR-MICROSCOPE
LAURELL-NANO
HENRY-MAGNET
WOOLLAM-RC2
SUSS-MA8
DEKTAK
LABOTOM5
WOOLLAM-MIR
ML3-BABY
GLOVEBOX…
MONOWAVE
LIBS-FireFly
LASER-DICER
micro-CT-L240
CHEMLAB-B1.14
micro-CT-m300
DAWN-HELEOS
GLOVEBOX…
TEGRAMIN
VNA-MPI
PECVD-NANOFAB
LEICACOAT-NANO
FRASCAN
NANOINDENTER
CHEMLAB-B1.16
R2-PECVD
CHEMLAB-B1.18
IS_NOVOCONTROL
ZEISS-STAN
SCIA
FISCHIONE-TEM…
KAUFMAN
IR-RAMAN
K70
KEITHLEY-4200
UV-LASER
Molnár, Tomáš
U Danchuk, Viktor
Molnár, Tomáš
U Danchuk, Viktor
Molnár, Tomáš
U Danchuk, Viktor
S Prášek, Jan
Bokaei Khelejan, Hatef
U Danchuk, Viktor
U Danchuk, Viktor
U Danchuk, Viktor
Tkachenko, Serhii
U Danchuk, Viktor
T Kicmerova, Dina
B Fecko, Peter
U Danchuk, Viktor
Bokaei Khelejan, Hatef
S Tmejová, Kateřina
U Danchuk, Viktor
T Michalička, Jan
U Danchuk, Viktor
U Danchuk, Viktor
Polčák, Josef
S Prášek, Jan
Caha, Ondřej
Lukiienko, Iryna
Knoblochová, Alžběta

Upcoming trainings

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Term Name Description Max. attendees
26.1. 09:00 - 13:00 KRATOS-XPS Basic training (session 1/2) - max 2 attendees. In case of interest for the training (when it is full) write to josef.polcak@ceitec.vutbr.cz. Attendees: Lucie Žaloudková, Areej Fatima 2
26.1. 09:00 - 13:00 RAITH training basic 1/3 RAITH basic training. Introduction to the RAITH150 Two system and the Electron Optics software. Operation of ZEISS SEM and basic functions. Attendees: Kryštof Jasenský, Elisa Cuccu 2
27.1. 09:30 - 12:00 ALD-Beneq-training Attendees: Sayed Hossein Mirdamadi Khouzani, Thanh Lam BUI, Eduard Jelínek, Kryštof Matějka, Jan Kunc 3
27.1. 09:30 - 11:30 DLS-ZetaSizer Part 1 This training will provide hands-on practice with basic methods for measuring particle size using the DLS technique. The session will cover: -An overview of DLS principles, including light scattering and Brownian motion. -Step-by-step guidance on preparing samples for size and zeta potential measurements. -The use of different measurement cells (e.g., disposable and reusable cuvettes) and their applications for specific types of samples. Practical demonstration of data acquisition, optimization of measurement parameters, and analysis using the Malvern software interface. By the end of the training, participants will gain both theoretical insights and practical expertise in using the Malvern device for comprehensive particle characterization. Attendees: Ammar AL Soud, Zuzana Košelová 2
27.1. 10:00 - 13:00 Tornado-M4 A 1.16 3
27.1. 10:00 - 11:15 Saw Accutom Meeting point: in front of the lab A1.04 Attendees: Tereza Havlíková 4
29.1. 10:00 - 11:30 Zeiss StAn microscope Meeting point: in front of the room A1.04 Attendees: Lenka Novotná 1
4.2. 13:00 - 15:00 Laser Dicer training 2
5.2. 09:30 - 13:30 MIRA-STAN 2/2 Meeting point at the microscope. This is a two-step training, register for part 1 in our booking system. More information about the training is available on our <a href=”https://cfmoodle.ceitec.vutbr.cz/course/view.php?id=76”>Moodle</a>. Attendees: Grigory Mathew, Karan Singh Surana, Nicolò Rossetti 3
19.2. 09:30 - 12:00 ICON-SPM basic training 3