Thursday 29.1.2026
CEITEC Nano Research Infrastructure http://nano.ceitec.cz/
0:00 1:00 2:00 3:00 4:00 5:00 6:00 7:00 8:00 9:00 10:00 11:00 12:00 13:00 14:00 15:00 16:00 17:00 18:00 19:00 20:00 21:00 22:00 23:00
Endstrasser, Zdeněk
Prášek, Jan
Weisz, Hugo
Kumar, Sanjay
Bahadur, Fateh
Dubroka, Adam
Polčák, Josef
Caha, Ondřej
Michalička, Jan
paiva de araujo,…
Fecko, Peter
Wirthová, Michaela
Raad, Ryan
Holas, Jiří
Šamořil, Tomáš
Michlovská, Lenka
Danchuk, Viktor
UHV-PREPARATION
UHV-LEEM
UHV-DEPOSITION
S MAGNETRON
S EVAPORATOR
WITEC-RAMAN
ICON-SPM
MIRA-STAN
LITESCOPE-MIRA-STAN
HELIOS
WOOLLAM-VIS
KRATOS-XPS
RIGAKU9
T TITAN
WITEC-RAMAN
B DWL
RIGAKU3
WITEC-RAMAN
T ZEISS-STAN
LYRA
MIRA-STAN
U CRYOGENIC

Upcoming trainings

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Term Name Description Max. attendees
26.1. 09:00 - 13:00 KRATOS-XPS Basic training (session 1/2) - max 2 attendees. In case of interest for the training (when it is full) write to josef.polcak@ceitec.vutbr.cz. Attendees: Lucie Žaloudková, Areej Fatima 2
26.1. 09:00 - 13:00 RAITH training basic 1/3 RAITH basic training. Introduction to the RAITH150 Two system and the Electron Optics software. Operation of ZEISS SEM and basic functions. Attendees: Kryštof Jasenský, Elisa Cuccu 2
27.1. 09:30 - 12:00 ALD-Beneq-training Attendees: Sayed Hossein Mirdamadi Khouzani, Thanh Lam BUI, Eduard Jelínek, Kryštof Matějka, Jan Kunc 3
27.1. 09:30 - 11:30 DLS-ZetaSizer Part 1 This training will provide hands-on practice with basic methods for measuring particle size using the DLS technique. The session will cover: -An overview of DLS principles, including light scattering and Brownian motion. -Step-by-step guidance on preparing samples for size and zeta potential measurements. -The use of different measurement cells (e.g., disposable and reusable cuvettes) and their applications for specific types of samples. Practical demonstration of data acquisition, optimization of measurement parameters, and analysis using the Malvern software interface. By the end of the training, participants will gain both theoretical insights and practical expertise in using the Malvern device for comprehensive particle characterization. Attendees: Ammar AL Soud, Zuzana Košelová 2
27.1. 10:00 - 13:00 Tornado-M4 A 1.16 3
27.1. 10:00 - 11:15 Saw Accutom Meeting point: in front of the lab A1.04 Attendees: Tereza Havlíková 4
29.1. 10:00 - 11:30 Zeiss StAn microscope Meeting point: in front of the room A1.04 Attendees: Lenka Novotná 1
4.2. 13:00 - 15:00 Laser Dicer training 2
5.2. 09:30 - 13:30 MIRA-STAN 2/2 Meeting point at the microscope. This is a two-step training, register for part 1 in our booking system. More information about the training is available on our <a href=”https://cfmoodle.ceitec.vutbr.cz/course/view.php?id=76”>Moodle</a>. Attendees: Grigory Mathew, Karan Singh Surana, Nicolò Rossetti 3
19.2. 09:30 - 12:00 ICON-SPM basic training 3