| 25.3. 09:00 - 10:30 |
Verios_basic (2/2)
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Verios_basic (2/2): hands-on session. Bring your real sample(s) with you.
Attendees:
Tomáš
Janoušek
|
1
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| 25.3. 10:30 - 12:00 |
Verios_basic (2/2)
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Verios_basic (2/2): hands-on session. Bring your real sample(s) with you.
Attendees:
Radim
Slovák
|
1
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| 25.3. 12:30 - 14:00 |
Verios_basic (2/2)
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Verios_basic (2/2): hands-on session. Bring your real sample(s) with you.
Attendees:
Jan
Klíma
|
1
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| 27.3. 09:00 - 13:00 |
KRATOS-XPS
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Basic training (session 1/2) - max 2 attendees.
In case of interest for the training (when it is full) write to josef.polcak@ceitec.vutbr.cz.
Attendees:
Grigory
Mathew,
Sujan
Maity
|
2
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| 27.3. 09:30 - 16:30 |
MIRA-STAN 1/2
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Meeting point at the microscope. This is a two-step training, register for part 2 in our booking system. Obligatory prerequisites must be completed 2 days before the training. More information about the training is available on our <a href=”https://cfmoodle.ceitec.vutbr.cz/course/view.php?id=76”>Moodle</a>.
Attendees:
Carolina
Oliver Urrutia,
Ondrej
Kubinec
|
4
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| 27.3. 10:00 - 12:00 |
Witec-Raman
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in front of user office
Attendees:
Lucie
Žaloudková,
Helena
Šimůnková
|
4
|
| 9.4. 09:00 - 12:00 |
Verios/Helios_EDS
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Practical demonstration of EDS analytical system at Verios and Helios.
Attendees:
Tomáš
Janoušek
|
3
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| 16.4. 09:30 - 11:30 |
MIRA-STAN - EDS detector
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Only for users with an active MIRA-STAN certificate. Meeting point at the microscope.
Attendees:
Aida
Fazlič
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4
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